SYSTEMS AND METHODS FOR PRECISION OPTICAL IMAGING OF ELECTRICAL CURRENTS AND TEMPERATURE IN INTEGRATED CIRCUITS
First Claim
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1. A method for detecting a characteristic of an integrated circuit, comprising:
- depositing at least one diamond structure, having at least one color center therein, onto a side of the integrated circuit;
applying an electromagnetic pump field to the at least one diamond structure;
monitoring a spin state of the at least one color center by measuring an emission of photons from the at least one color center resulting from the electromagnetic pump field and an electromagnetic radiation of the integrated circuit; and
detecting the characteristic of the integrated circuit based on a correlation between the emission of photons and the characteristic.
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Abstract
Systems and methods for precision optical imaging of electrical currents and temperature in integrated circuits are disclosed herein. In one aspect of the disclosed subject matter, a method for detecting a characteristic of an integrated circuit can include depositing at least one diamond structure, having at least one color center therein, onto a side of the integrated circuit.
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Citations
21 Claims
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1. A method for detecting a characteristic of an integrated circuit, comprising:
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depositing at least one diamond structure, having at least one color center therein, onto a side of the integrated circuit; applying an electromagnetic pump field to the at least one diamond structure; monitoring a spin state of the at least one color center by measuring an emission of photons from the at least one color center resulting from the electromagnetic pump field and an electromagnetic radiation of the integrated circuit; and detecting the characteristic of the integrated circuit based on a correlation between the emission of photons and the characteristic. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A system for detecting a characteristic of an integrated circuit, comprising:
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a receptacle adapted to receive the integrated circuit; at least one diamond structure, having at least one color center therein, disposed on a side of the integrated circuit; an electromagnetic pump field source adapted to apply an electromagnetic pump field to the at least one diamond structure; a monitoring device, coupled to the receptacle and adapted to monitor a spin state of the at least one color center by measuring an emission of photons from the at least one color center resulting from the electromagnetic pump field and an electromagnetic radiation of the integrated circuit to thereby detect the characteristic of the integrated circuit based on a predetermined correlation between the emission of photons and the characteristic. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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Specification