SEMICONDUCTOR DEVICE
First Claim
1. A semiconductor device comprising:
- a first circuit; and
a second circuit,wherein the first circuit comprises a first memory storing first data corresponding to a history of a first branch instruction of the first circuit, andwherein the second circuit comprises a second memory storing second data to generate a signal for an operation test of the first circuit and third data corresponding to a history of a second branch instruction of the first circuit after the operation test.
1 Assignment
0 Petitions
Accused Products
Abstract
A semiconductor device in which the area of a circuit that is unnecessary during normal operation is small. The semiconductor device includes a first circuit and a second circuit. The first circuit includes a third circuit storing at least one pair of first data including a history of a branch instruction and a first address corresponding to the branch instruction; a fourth circuit comparing a second address of an instruction and the first address; and a fifth circuit selecting the first data of one pair among the at least one pair in accordance with a comparison result. The second circuit includes a plurality of sixth circuits having a function of generating a signal for testing operation of the first circuit in accordance with second data, and a function of storing the at least one pair together with the second circuit after the operation is tested.
23 Citations
21 Claims
-
1. A semiconductor device comprising:
-
a first circuit; and a second circuit, wherein the first circuit comprises a first memory storing first data corresponding to a history of a first branch instruction of the first circuit, and wherein the second circuit comprises a second memory storing second data to generate a signal for an operation test of the first circuit and third data corresponding to a history of a second branch instruction of the first circuit after the operation test. - View Dependent Claims (2, 3, 4, 5, 6, 7)
-
-
8. A semiconductor device comprising:
-
a first circuit; and a second circuit, wherein the first circuit comprises a first memory storing first data corresponding to a history of a first branch instruction of the first circuit and a first address of the first branch instruction and a comparator circuit comparing an address of an instruction and the first address, and wherein the second circuit comprises a second memory storing second data to generate a signal for an operation test of the first circuit, and third data corresponding to a history of a second branch instruction of the first circuit and a second address of the second branch instruction after the operation test in accordance with the signal. - View Dependent Claims (9, 10, 11, 12, 13, 14)
-
-
15. A semiconductor device comprising:
-
a first circuit; and a second circuit, wherein the first circuit comprises a first memory storing first data corresponding to a history of a first branch instruction of the first circuit and a first address of the first branch instruction, a comparator circuit comparing an address of an instruction and the first address, and a selector circuit selecting the first address in accordance with a comparison result of the comparator circuit, and wherein the second circuit comprises a second memory storing second data to generate a signal for an operation test of the first circuit, and third data corresponding to a history of a second branch instruction of the first circuit and a second address of the second branch instruction after the operation test in accordance with the signal. - View Dependent Claims (16, 17, 18, 19, 20, 21)
-
Specification