SURFACE SCATTERING REFLECTOR ANTENNA

• US 20150162658A1
• Filed: 12/10/2013
• Published: 06/11/2015
• Est. Priority Date: 12/10/2013
• Status: Active Grant

• Current Assignee: Elwha LLC (Intellectual Ventures LLC)
• Original Assignee: Elwha LLC (Intellectual Ventures LLC)
• Inventors: Bowers, Jeffrey A., Brady, David Jones, Driscoll, Tom, Hyde, Roderick A., Mrozack, Alexander, Smith, David R., Tegreene, Clarence T., Hunt, John Desmond, Landy, Nathan Ingle, Lipworth, Guy Shlomo
• Granted Patent: US 9,935,375 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: H01Q 15/006 Selective devices having photonic band gap materials or materials of which the material properties are frequency dependent, e.g. perforated substrates, high-impedance surfaces
• CPC Class Codes: H01Q 15/0086 said selective devices having materials with a synthesized negative refractive index, e.g. metamaterials or left-handed materials
• CPC Class Codes: H01Q 3/44 varying the electric or magnetic characteristics of reflecting, refracting, or diffracting devices associated with the radiating element
• CPC Class Codes: H01Q 3/46 Active lenses or reflecting arrays

Abstract

A surface scattering reflector antenna includes a plurality of adjustable scattering elements and is configured to produce a reflected beam pattern according to the configuration of the adjustable scattering elements.

Claims

1. An apparatus comprising:

a substrate; and

a plurality of scattering elements each having an adjustable individual electromagnetic response to an incident electromagnetic wave in an operating frequency range, the plurality of scattering elements being arranged in a pattern on the substrate, the pattern having an inter-element spacing selected according to the operating frequency range;

wherein the substrate and the plurality of scattering elements form a reflective structure that is responsive to reflect a portion of the incident electromagnetic wave to produce an adjustable radiation field responsive to the adjustable individual electromagnetic responses.

2. The apparatus of claim 1 wherein the plurality of scattering elements is a plurality of substantially identical scattering elements.

7. The apparatus of claim 1 wherein the operating frequency range has a center frequency and a free-space wavelength corresponding to the center frequency, and wherein the inter-element spacing is less than one-third of the free space wavelength.

8. The apparatus of claim 1 wherein the operating frequency range has a center frequency and a free-space wavelength corresponding to the center frequency, and wherein the inter-element spacing is less than one-fourth of the free space wavelength.

9. The apparatus of claim 1 wherein the substrate has a first reflectivity in the operating frequency range and the plurality of scattering elements have a second reflectivity in the operating frequency range, and wherein the first reflectivity is different from the second reflectivity.

14. The apparatus of claim 1 wherein the substrate includes a metallic layer in contact with a non-metallic layer, and wherein the plurality of scattering elements corresponds to a plurality of apertures in the metallic layer.

15. The apparatus of claim 1 wherein the scattering elements form a one-dimensional array on the substrate structure.

17. The apparatus of claim 1 further comprising a source configured to provide the incident electromagnetic wave.

23. The apparatus of claim 1 further comprising:

control circuitry coupled to the plurality of scattering elements and configured to provide a set of adjustments of the adjustable individual electromagnetic responses.

24. The apparatus of claim 1 wherein each of the scattering elements includes an electrically adjustable material configured to provide the adjustable individual electromagnetic responses.

25. The apparatus of claim 24 wherein the electrically adjustable material includes liquid crystal.

26. The apparatus of claim 1 wherein the adjustable individual electromagnetic response of the plurality of scattering elements is configured to be discretely adjustable.

27. The apparatus of claim 1 wherein the adjustable individual electromagnetic response of the plurality of scattering elements is configured to be continuously adjustable.

28. The apparatus of claim 1 wherein at least one scattering element in the plurality of scattering elements includes a metamaterial element.

29. The apparatus of claim 1 wherein at least one scattering element in the plurality of scattering elements includes a complementary metamaterial element.

3. (canceled)

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30. A method comprising:

propagating a first wave in free space to a first region;

producing a plurality of electromagnetic oscillations in the first region responsive to the first wave, the plurality of electromagnetic oscillations producing a radiated wave having a beam pattern, the first region having an electromagnetic response that at least partially determines the beam pattern; and

varying the electromagnetic response in the first region to vary the beam pattern.

31. The method of claim 30 further comprising:

producing the first wave.

32. The method of claim 30 wherein varying the electromagnetic response in the first region to vary the beam pattern includes:

adjusting one or more properties of the first region.

33. The method of claim 30 wherein varying the electromagnetic response in the first region to vary the beam pattern includes:

applying a voltage to the first region.

34. The method of claim 30 wherein the first wave is defined by a first frequency range, and wherein the first frequency range includes RF frequencies.

35. The method of claim 30 further comprising:

measuring a property of the beam pattern; and

varying the electromagnetic response in the first region according to the measured property of the beam pattern.

36. The method of claim 30 further comprising:

receiving a signal; and

varying the electromagnetic response according to the received signal.

37. The method of claim 36 wherein the signal includes a user input.

38. The method of claim 36 wherein the signal includes a wireless signal.

39. The method of claim 36 wherein the signal includes information about a detected property of the beam pattern.

40. The method of claim 30 further comprising:

selecting a beam direction corresponding to the beam pattern; and

varying the electromagnetic response in the first region to produce the selected beam direction.

41. The method of claim 30 further comprising:

selecting a polarization state corresponding to the beam pattern; and

varying the electromagnetic response in the first region to produce the selected polarization state.

42. The method of claim 30 further comprising:

varying a property of the first wave to vary the plurality of electromagnetic oscillations in the first region.

43. The method of claim 30 further comprising:

absorbing at least a portion of the first wave in the first region.

44. The method of claim 30 further comprising:

reflecting at least a portion of the first wave in the first region.

45. The method of claim 30 wherein varying the electromagnetic response in the first region includes:

varying the electromagnetic response in the first region substantially continuously to vary the beam pattern substantially continuously.

46. The method of claim 30 further comprising:

detecting a property of the first region; and

varying the electromagnetic response according to the detected property.

47. The method of claim 30 wherein varying the electromagnetic response in the first region includes discretely adjusting the electromagnetic response in the first region.

48. The method of claim 30 wherein varying the electromagnetic response in the first region includes continuously adjusting the electromagnetic response in the first region.

49. The method of claim 30 further comprising:

selecting a near field radiation profile corresponding to the beam pattern; and

varying the electromagnetic response in the first region to produce the selected near field radiation profile.

50. A system comprising:

a surface scattering reflector antenna having a configuration that is dynamically adjustable, the surface scattering reflector antenna being responsive to electromagnetic energy in a first frequency range to produce a reflected beam pattern according to the configuration;

a source configured to produce an electromagnetic wave in a second frequency range, the second frequency range overlapping at least partially with the first frequency range; and

control circuitry operably connected to the surface scattering reflector antenna and the source to vary the reflected beam pattern.

51. The system of claim 50 further comprising a detector arranged to receive at least a portion of electromagnetic energy in the reflected beam pattern, the detector being operably connected to the control circuitry, and wherein the control circuitry is configured to vary the reflected beam pattern according to the received portion of electromagnetic energy.

52. The system of claim 51 wherein the source and the detector are housed in different units.

53. The system of claim 50 wherein the control circuitry is configured to vary the configuration of the surface scattering reflector antenna to vary the reflected beam pattern.

54. The system of claim 53 wherein the control circuitry includes stored information corresponding to one or more pre-selected configurations of the surface scattering reflector antenna, and wherein the control circuitry is configured to adjust the surface scattering reflector antenna to produce the one or more pre-selected configurations.

55. The system of claim 54 wherein the one or more pre-selected configurations corresponds to one or more pre-selected reflected beam patterns.

56. The system of claim 50 wherein the control circuitry is configured to vary the frequency range of the electromagnetic wave to vary the reflected beam pattern.

57. The system of claim 50 wherein the source has a spatial position and direction, and wherein the control circuitry is configured to vary at least one of the spatial position and direction to vary the reflected beam pattern.

58. The system of claim 50 wherein the control circuitry is configured to receive a signal, and wherein the control circuitry is configured to vary the reflected beam pattern according to the received signal.

59. The system of claim 58 wherein the received signal corresponds to a user signal.