APPARATUSES, SYSTEMS, AND METHODS CONTROLLING TESTING OPTICAL FIRE DETECTORS

• US 20150204727A1
• Filed: 01/21/2014
• Published: 07/23/2015
• Est. Priority Date: 01/21/2014
• Status: Active Grant

• Current Assignee: Kidde Technologies, Inc. (Rtx Corporation)
• Original Assignee: Kidde Technologies, Inc. (Rtx Corporation)
• Inventors: Bell, Ken, Thebert, Robert
• Granted Patent: US 9,410,849 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01J 5/0014 for sensing the radiation from gases, flames
• CPC Class Codes: G01J 5/0265 Handheld, portable ear thermometers G01J5/049
• CPC Class Codes: G01J 5/028 using a charging unit or battery
• CPC Class Codes: G01J 5/0806 Focusing or collimating elements, e.g. lenses or concave mirrors
• CPC Class Codes: G01J 5/084 Adjustable or slidable
• CPC Class Codes: G01J 5/0896 using a light source, e.g. for illuminating a surface
• CPC Class Codes: G01J 5/53 Reference sources, e.g. standard lamps; Black bodies
• CPC Class Codes: G08B 17/12 Actuation by presence of radiation or particles, e.g. of infrared radiation or of ions
• CPC Class Codes: G08B 29/145 of fire detection circuits

Abstract

A testing device for testing infrared OFDs is provided. The testing device may comprise a body, an infrared source, a controller and a user input. The infrared source may be housed with the body. The controller may be operatively coupled to the infrared source. The controller may also be integral to the infrared source. The user input may be operatively coupled to at least one of the controller and the infrared source. The testing device may be configured to produce infrared emissions to simulate flaming fire.

Claims

1. An infrared testing device comprising:

a body,

a solid state infrared source, housed with the body;

a controller operatively coupled to the infrared source; and

a user input operatively coupled to at least one of the controller and the infrared source.

2. The infrared testing device of claim 1, wherein the infrared source is capable of producing infrared emissions having wavelengths of approximately 1 μ

m to approximately 20 μ

m.

3. The infrared testing device of claim 1, wherein the infrared source is an array of infrared sources.

4. The infrared testing device of claim 3, wherein the array of infrared source are configured to emit a plurality of wavelengths.

5. The infrared testing device of claim 1, wherein the testing device is portable.

6. The infrared testing device of claim 1, wherein the testing device is battery powered.

7. The infrared testing device of claim 1, wherein an emission from the infrared source is definite.

8. The infrared testing device of claim 1, wherein the infrared source is a MEMS based infrared source.

9. An in-factory testing system, comprising:

a testing device comprising an infrared source;

a testing structure configured to retain the testing device at a specific orientation;

an infrared OFD;

a support structure coupled to the infrared OFD and configured to hold the OFD in the specific orientation.

10. The in-factory testing system of claim 9, wherein the infrared source is a MEMS device.

11. The in-factory testing system of claim 9, wherein the infrared source is capable of producing infrared emissions having wavelengths of approximately 1 μ

m to approximately 20 μ

m.

12. The in-factory testing system of claim 9, wherein the infrared source is an array of infrared sources.

13. The in-factory testing system of claim 12, wherein the array of infrared source are configured to emit a plurality of wavelengths.

14. The in-factory testing system of claim 9, wherein the specific orientation is an alignment A-A′

.

15. The in-factory testing system of claim 9, wherein the specific orientation is a first horizontal distance A and a second vertical distance B.