SYSTEMS AND METHODS FOR EVENT DETECTION AND DIAGNOSIS
First Claim
1. A method for detection of event conditions in an industrial plant, comprising:
- receiving process data corresponding to one or more sensors;
estimating normal statistics from the process data associated with normal operation of one or more components corresponding to the one or more sensors;
estimating abnormal statistics from the process data with potentially abnormal operation of the one or more components;
determining, by a model processor, a fault model from the estimated normal and abnormal statistics, the fault model comprising a learning matrix, one or more fault indices indicating a likelihood of an occurrence of one or more fault events, and a fault threshold corresponding the one or more sensors;
receiving, by a detector processor operably coupled to the model processor, the one or more fault indices, the fault threshold and further process data from the one or more sensors;
determining one or more further fault indices from the further process data;
applying the fault threshold to the one or more further fault indices; and
indicating a further occurrence of the one or more fault events when a magnitude of the one or more further fault indices exceeds the fault threshold corresponding to the one or more sensors.
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Abstract
Detection of event conditions in an industrial plant includes receiving process data corresponding to one or more sensors, estimating normal statistics from the process data, estimating abnormal statistics from the process data with potentially abnormal operation of the one or more components, determining a fault model from the estimated normal and abnormal statistics, the fault model including a learning matrix, one or more fault indices indicating a likelihood of an occurrence of one or more fault events, and a fault threshold corresponding to the one or more sensors, determining one or more further fault indices from the further process data; applying the fault threshold to the one or more further fault indices, and indicating a further occurrence of the one or more fault events when a magnitude of the one or more further fault indices exceeds the fault threshold corresponding to the one or more sensors.
81 Citations
22 Claims
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1. A method for detection of event conditions in an industrial plant, comprising:
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receiving process data corresponding to one or more sensors; estimating normal statistics from the process data associated with normal operation of one or more components corresponding to the one or more sensors; estimating abnormal statistics from the process data with potentially abnormal operation of the one or more components; determining, by a model processor, a fault model from the estimated normal and abnormal statistics, the fault model comprising a learning matrix, one or more fault indices indicating a likelihood of an occurrence of one or more fault events, and a fault threshold corresponding the one or more sensors; receiving, by a detector processor operably coupled to the model processor, the one or more fault indices, the fault threshold and further process data from the one or more sensors; determining one or more further fault indices from the further process data; applying the fault threshold to the one or more further fault indices; and indicating a further occurrence of the one or more fault events when a magnitude of the one or more further fault indices exceeds the fault threshold corresponding to the one or more sensors. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method for identification of event conditions in an industrial plant, comprising:
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receiving process data corresponding to one or more sensors; estimating normal statistics from the process data associated with normal operation of one or more components corresponding to the one or more sensors; estimating abnormal statistics from the process data with potentially abnormal operation of the one or more components; determining, by a model processor, a fault model from the estimated normal and abnormal statistics, the fault model comprising a learning matrix, one or more fault indices indicating a likelihood of an occurrence of one or more fault events, and a fault threshold corresponding the one or more sensors; receiving, by a detector processor operably coupled to the model processor, the one or more fault indices, the fault threshold and further process data from the one or more sensors; determining one or more further fault indices from the further process data; applying the fault threshold to the one or more further fault indices; indicating a further occurrence of the one or more fault events when a magnitude of the one or more further fault indices exceeds the fault threshold corresponding to the one or more sensors; relating the one or more components to the fault threshold corresponding to the one or more sensors; and identifying a type of the one or more fault events based on the relation of the one or more components to the fault threshold corresponding to the one or more sensors. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20, 21, 22)
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Specification