DEVICE
First Claim
1. A device comprising:
- a first circuit; and
a second circuit comprising;
third circuits;
fourth circuits each comprising a magnetic tunnel junction element; and
a fifth circuit,wherein the fifth circuit is configured to write first data to the fourth circuits to control conduction between the third circuits in a first period,wherein the fifth circuit is configured to write second data to the fourth circuits and read the second data from the fourth circuits in a second period, andwherein the first period is a period of an operation test of the first circuit and the second period is a period in which the operation test of the first circuit is not performed.
1 Assignment
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Accused Products
Abstract
Provided is a device capable of generating test patterns even after the design stage. The area of a circuit which is included in the device and unnecessary during normal operation can be reduced. The device includes a first circuit and a second circuit. The second circuit includes a plurality of third circuits, a plurality of fourth circuits, and a fifth circuit and has a function of generating a signal for testing operation of the first circuit and a function of operating as part of the first circuit. The fourth circuit has a function of storing a first data and a function of storing a second data. The fifth circuit has a function of writing the first data to the plurality of fourth circuits, a function of writing the second data to the plurality of fourth circuits, and a function of reading the second data from the plurality of fourth circuits.
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Citations
16 Claims
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1. A device comprising:
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a first circuit; and a second circuit comprising; third circuits; fourth circuits each comprising a magnetic tunnel junction element; and a fifth circuit, wherein the fifth circuit is configured to write first data to the fourth circuits to control conduction between the third circuits in a first period, wherein the fifth circuit is configured to write second data to the fourth circuits and read the second data from the fourth circuits in a second period, and wherein the first period is a period of an operation test of the first circuit and the second period is a period in which the operation test of the first circuit is not performed. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A device comprising:
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a first circuit; and a second circuit comprising; third circuits; fourth circuits each comprising a magnetic tunnel junction element; and a fifth circuit, wherein the second circuit is configured to store first data to generate a signal for a testing operation of the first circuit and configured to operate as a memory of the first circuit after the testing operation, wherein the fifth circuit is configured to write the first data to the fourth circuits to control conduction between the third circuits, and wherein the fifth circuit is configured to write second data to the fourth circuits and read the second data from the fourth circuits. - View Dependent Claims (8, 9, 10, 11, 12)
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13. A device comprising:
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a first circuit; and a second circuit comprising a driver circuit and a circuit comprising a magnetic tunnel junction element, wherein the second circuit is configured to store first data to generate a signal for a testing operation of the first circuit and configured to operate as a memory storing second data of the first circuit after the testing operation, wherein the first data are input to and stored in the driver circuit one by one and are output from the driver circuit to the circuit simultaneously to reconfigure a circuit configuration of the second circuit, and wherein the second data are input and stored in the driver circuit simultaneously and are output from the driver circuit to the circuit simultaneously. - View Dependent Claims (14, 15, 16)
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Specification