ARRAY SUBSTRATE, METHOD FOR INSPECTING ARRAY SUBSTRATE, AND METHOD FOR INSPECTING DISPLAY PANEL

• US 20150235582A1
• Filed: 02/09/2015
• Published: 08/20/2015
• Est. Priority Date: 02/20/2014
• Status: Active Grant

• Current Assignee: Trivale Technologies, LLC (Vector Capital Corporation)
• Original Assignee: Mitsubishi Electric Corporation
• Inventors: MURAKAMI, Katsuaki
• Granted Patent: US 9,761,162 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G09G 3/006 Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309
• CPC Class Codes: G09G 3/3648 using an active matrix G09G3/367 - G09G3/3696 take precedence

Abstract

A plurality of source signal lines extend parallel to each other. A plurality of gate signal lines extend parallel to each other and intersect the plurality of source signal lines. At least any one of array inspecting terminals is provided. The one array inspecting terminal is connected to two or more signal lines of the plurality of gate signal lines. The other array inspecting terminal is connected to two or more signal lines of the plurality of source signal lines. To perform an inspection for a unit of the two or more signal lines by detecting a value of a voltage or a current generated in the signal lines, the array inspecting terminals are configured to receive an inspection signal for generating the voltage or the current.

Claims

1. An array substrate, comprising:

a plurality of first signal lines extending parallel to each other;

a plurality of second signal lines extending parallel to each other and intersecting said plurality of first signal lines;

a pixel switch element located at an intersection of each of said plurality of first signal lines and each of said plurality of second signal lines; and

a first array inspecting terminal connected to two or more third signal lines of said plurality of first signal lines, said first array inspecting terminal receiving an inspection signal for generating a voltage or a current in said two or more third signal lines to perform an inspection for a unit of said two or more third signal lines by detecting a value of said voltage or said current.

2. The array substrate according to claim 1, wherein

at least one of said plurality of first signal lines is located between said two or more third lines, and

said array substrate further comprises a second array inspecting terminal connected to two or more fourth signal lines of said plurality of first signal lines, the fourth signal lines being each adjacent to said two or more third signal lines.

3. The array substrate according to claim 1, further comprising an array inspecting switch element that selects conduction or non-conduction between each of said two or more third signal lines and said first array inspecting terminal.

4. The array substrate according to claim 1, comprising:

pixel electrodes that are located in a plurality of pixel regions and are applied with voltage through said pixel switch element, each of the pixel regions being surrounded by each of said plurality of first signal lines and each of said plurality of second signal lines;

a first lighting inspecting terminal connected to two or more signal lines of said plurality of first signal lines; and

a second lighting inspecting terminal connected to two or more signal lines of said plurality of second signal lines,

wherein in a state where a display panel is formed of said array substrate and a display element that changes display in response to the voltage of said pixel electrodes, said first lighting inspection terminal and said second lighting inspecting terminal are configured to receive a second inspection signal for displaying an inspection display image.

5. The array substrate according to claim 4, further comprising inspection switch elements,

wherein one end of each of said inspection switch elements is connected to said first lighting inspecting terminal and said first array inspecting terminal, and the other end of each of said inspection switch elements is connected to each of said two or more third signal lines.

6. The array substrate according to claim 1, wherein the number of said two or more third signal lines is ten or less.

7. A method for inspecting an array substrate that comprises a plurality of first signal lines extending parallel to each other, a plurality of second signal lines extending to parallel to each other and intersecting said plurality of first signal lines, a pixel switch element located at an intersection of each of said plurality of first signal lines and each of said plurality of second signal lines, and a first array inspecting terminal connected to two or more third signal lines of said plurality of first signal lines, comprising:

inputting an inspection signal for generating a voltage or a current in said two or more third signal lines to said first array inspecting terminal; and

detecting said voltage or said current to perform an inspection for a unit of said two or more third signal lines.

8. The method for inspecting an array substrate according to claim 7, wherein

at least one of said plurality of first signal lines is located between said two or more third lines,

said array substrate further comprises a second array inspecting terminal connected to two or more fourth signal lines of said plurality of first signal lines, the fourth signal lines being each adjacent to said two or more third signal lines, and

said method further comprises:

performing an inspection for a short circuit between said two or more third signal lines and said two or more fourth signal lines.

9. The method for inspecting an array substrate according to claim 7, wherein

said plurality of first signal lines, said plurality of second signal lines, and said first array inspecting terminal are located on a substrate, and

said method further comprises:

cutting said substrate, after completion of said inspection, to interrupt the connection between said first array inspecting terminal and said two or more third signal lines.

10. The method for inspecting an array substrate according to claim 7, further comprising:

removing part of each of said two or more third signal lines with a laser, after completion of said inspection, to interrupt the connection between said two or more third signal lines and said first array inspecting terminal.

11. The method for inspecting an array substrate according to claim 7, wherein

said array substrate further comprises array inspecting switch elements each having one end connected to said first array inspecting terminal and the other end connected to each of said two or more third signal lines, and

said method further comprises:

turning said array inspecting switch elements on when said inspection is performed; and

turning said array inspecting switch elements off after completion of said inspection.

12. A method for inspecting a display panel, comprising:

performing the method for inspecting an array substrate according to claim 7;

inputting a second inspection signal to each of a first lighting inspecting terminal and a second lighting inspecting terminal to drive display elements to display an inspection display image on a display panel, said first lighting inspecting terminal being connected to two or more ones of said plurality of first signal lines, said second lighting inspecting terminal being connected to two or more ones of said plurality of second signal lines, said display panel including said array substrate and said display elements that change display in response to a voltage of pixel electrodes, said pixel electrodes being located in a plurality of pixel regions and applied with said voltage through said pixel switch element, each of the pixel regions being surrounded by each of said plurality of first signal lines and each of said plurality of second signal lines, said pixel electrodes as well as said first lighting inspecting terminal and said second lighting inspecting terminal being included in said array substrate; and

performing a lighting inspection to determine whether said inspection display image is correctly displayed.