Reticle Cooling System In A Lithographic Apparatus
First Claim
1. A lithographic system comprising:
- a patterning device support comprising a movable component configured to support a patterning device;
a reticle cooling system configured to provide substantially uniform temperature distribution across the patterning device, the reticle cooling system comprising;
a first array of gas inlets configured to provide a first gas flow along a first direction across a surface of the patterning device;
a second array of gas inlets configured to provide a second gas flow along a second direction across the surface of the patterning device, the first and second directions being opposite to each other; and
a switching control system configured to control operation of the first and second arrays of gas inlets.
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Accused Products
Abstract
A system for controlling temperature of a patterning device in a lithographic apparatus is discussed. The system includes a patterning device support configured to support a patterning device and a reticle cooling system configured to provide substantially uniform temperature distribution across the patterning device. The reticle cooling system includes a first and second array of gas inlets configured to provide a first and second gas flow along a first and second direction across a surface of the patterning device, respectively, where first and second directions are opposite to each other. The reticle cooling system further includes a switching control system configured to control operation of the first and second arrays of gas inlets.
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Citations
20 Claims
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1. A lithographic system comprising:
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a patterning device support comprising a movable component configured to support a patterning device; a reticle cooling system configured to provide substantially uniform temperature distribution across the patterning device, the reticle cooling system comprising; a first array of gas inlets configured to provide a first gas flow along a first direction across a surface of the patterning device; a second array of gas inlets configured to provide a second gas flow along a second direction across the surface of the patterning device, the first and second directions being opposite to each other; and a switching control system configured to control operation of the first and second arrays of gas inlets. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A system to control a temperature of a patterning device in a lithographic apparatus, the system comprising:
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a patterning device support comprising a movable component configured to support a patterning device; a fixed purge plate located above the patterning device; a reticle cooling system configured to provide substantially uniform temperature distribution across the patterning device, the reticle cooling system comprising; a temperature measurement system configured to detect temperature of an area of the patterning device and generate a measurement signal; a switching control system configured to generate a control signal based on the measurement signal; and a gas system configured to; supply a gas for forming a first gas flow along a first direction across a surface of the patterning device in response to the control signal;
orsupply the gas for forming a second gas flow along a second direction across the surface of the patterning device in response to the control signal, the first and second directions being opposite to each other. - View Dependent Claims (14, 15, 16, 17, 18, 19)
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20. A lithographic apparatus comprising:
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an illumination system configured to condition a radiation beam; a patterning device support comprising a movable component configured to support a patterning device; a reticle cooling system configured to provide substantially uniform temperature distribution across the patterning device, the reticle cooling system comprising; a first array of gas inlets, disposed along a first side of the patterning device support, configured to provide a first gas flow across a surface of the patterning device; a second array of gas inlets, disposed along a second side of the patterning device support, configured to provide a second gas flow across the surface of the patterning device, the first and second sides being opposite to each other; and a switching control system configured to control operation of the first and second arrays of gas inlets.
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Specification