Method and Apparatus for Calibrating a Charged Particle Pencil Beam Used for Therapeutic Purposes
First Claim
1. A system for calibrating a charged particle pencil beam, the system comprising:
- a first pixelated detector disposed at a proximal position to an isocenter plane, the first pixelated detector configured to provide a first output representative of first data of the charged particle pencil beam;
a second pixelated detector disposed at a first position distal to the isocenter plane, the second pixelated detector configured to provide a second output representative of second data of the charged particle pencil beam; and
a beam stop disposed at a second position distal to the second pixelated detector, the beam stop configured to provide a third output representative of an energy of the charged particle pencil beam, wherein the second pixelated detector is disposed between the isocenter plane and the beam stop;
a diagnostics system comprising a processor and a memory, the diagnostics system configured (a) to transmit a signal to request a generation of the charged particle pencil beam at a plurality of settings; and
(b) to update a calibration parameter for each setting based on at least one of the first output, the second output, and the third output.
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Accused Products
Abstract
A system for calibrating a charged particle pencil beam includes a first pixelated detector, a second pixelated detector, a beam stop, and a diagnostics system. The first and second pixelated detectors measure the pencil beam at positions proximal and/or distal to an isocenter plane. The beam stop is configured to detect an energy level of the pencil beam. The diagnostics system is configured to transmit a signal to request a generation of the charged particle pencil beam at different settings. The diagnostics system is also configured to update a calibration parameter for each setting based on the data received from the pixelated detectors and the beam stop.
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Citations
23 Claims
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1. A system for calibrating a charged particle pencil beam, the system comprising:
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a first pixelated detector disposed at a proximal position to an isocenter plane, the first pixelated detector configured to provide a first output representative of first data of the charged particle pencil beam; a second pixelated detector disposed at a first position distal to the isocenter plane, the second pixelated detector configured to provide a second output representative of second data of the charged particle pencil beam; and a beam stop disposed at a second position distal to the second pixelated detector, the beam stop configured to provide a third output representative of an energy of the charged particle pencil beam, wherein the second pixelated detector is disposed between the isocenter plane and the beam stop; a diagnostics system comprising a processor and a memory, the diagnostics system configured (a) to transmit a signal to request a generation of the charged particle pencil beam at a plurality of settings; and
(b) to update a calibration parameter for each setting based on at least one of the first output, the second output, and the third output. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. A method for calibrating a charged particle pencil beam system, the method comprising:
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(a) transmitting a signal to request a generation of the charged particle pencil beam at a plurality of settings; (b) receiving, for each setting, first data representing a first transverse intensity distribution of the charged particle pencil beam at a first position, said first position proximal to an isocenter plane; (c) receiving, for each setting, second data representing a second transverse intensity distribution of the charged particle pencil beam at a second position, said second position distal to the isocenter plane; (d) receiving, for each setting, third data representing an energy measurement of the charged particle pencil beam; and (e) updating a calibration parameter for each setting based on at least one of the first data, the second data, and the third data. - View Dependent Claims (18, 19, 20, 21, 22, 23)
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Specification