ELECTRICAL STORAGE DEVICE TEMPERATURE-MEASURING METHOD
First Claim
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1. An electrical storage device temperature-measuring method comprising:
- measuring a real part of internal impedance of an electrical storage device by using an alternating-current signal having a frequency band in which the real part of the internal impedance of the electrical storage device does not change according to a remaining capacity (SOC;
state of charge) of the electrical storage device; and
calculating internal temperature of the electrical storage device from a measured value of the real part of the internal impedance.
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Abstract
An electrical storage device temperature-measuring method includes: measuring the real part of the internal impedance of an electrical storage device by using an alternating-current signal having a frequency at which the internal impedance or the real part of the internal impedance of the electrical storage device does not change according to the remaining capacity (SOC: state of charge) of the electrical storage device; and calculating the internal temperature of the electrical storage device from the measured value of the real part of the internal impedance.
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Citations
12 Claims
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1. An electrical storage device temperature-measuring method comprising:
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measuring a real part of internal impedance of an electrical storage device by using an alternating-current signal having a frequency band in which the real part of the internal impedance of the electrical storage device does not change according to a remaining capacity (SOC;
state of charge) of the electrical storage device; andcalculating internal temperature of the electrical storage device from a measured value of the real part of the internal impedance. - View Dependent Claims (2, 3, 7, 8, 9)
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4. An electrical storage device temperature-measuring method comprising:
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measuring internal impedance of an electrical storage device by using an alternating-current signal having a frequency band in which the internal impedance of the electrical storage device does not change according to a remaining capacity (SOC;
state of charge) of the electrical storage device; andcalculating internal temperature of the electrical storage device from a measured value of the internal impedance. - View Dependent Claims (5, 6, 10, 11, 12)
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Specification