SYSTEMS AND METHODS FOR X-RAY DIFFRACTION

• US 20150253262A1
• Filed: 03/05/2015
• Published: 09/10/2015
• Est. Priority Date: 03/06/2014
• Status: Active Grant

• Current Assignee: Rtx Corporation
• Original Assignee: United Technologies Corporation (Raytheon Technologies Corporation d/b/a RTX)
• Inventors: Cernatescu, Iuliana, Furrer, David U.
• Granted Patent: US 9,976,971 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01N 23/20 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
• CPC Class Codes: G01N 23/20008 Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor monochromators for X- rays using crystals G21K1/06
• CPC Class Codes: G01N 23/20025 Sample holders or supports therefor
• CPC Class Codes: G01N 23/207 Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
• CPC Class Codes: H01J 2235/081 Target material
• CPC Class Codes: H01J 2235/086 Target geometry
• CPC Class Codes: H01J 35/02 Details
• CPC Class Codes: H01J 35/025 X-ray tubes with structurally associated circuit elements
• CPC Class Codes: H01J 35/10 Rotary anodes; Arrangements for rotating anodes; Cooling rotary anodes
• CPC Class Codes: H01J 35/101 Arrangements for rotating anodes, e.g. supporting means, means for greasing, means for sealing the axle or means for shielding or protecting the driving
• CPC Class Codes: H01J 35/112 Non-rotating anodes H01J35/12 takes precedence
• CPC Class Codes: H01J 35/16 Vessels; Containers; Shields associated therewith
• CPC Class Codes: H01J 35/24 Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof
• CPC Class Codes: H01J 35/26 by rotation of the anode or anticathode

Abstract

An x-ray diffraction system includes an x-ray source having a first interchangeable x-ray generating component, a second interchangeable x-ray generating component, an actuator and a controller operatively connected to the actuator. The first and second interchangeable x-ray generating components are interchangeable with one another. The actuator is operatively connected to the first and second interchangeable x-ray generating components. A method for non-destructive x-ray diffraction includes emitting a first x-ray beam from an x-ray source with a first x-ray generating component based on a first desired depth to measure a crystallographic signature of a sample at the first desired depth, interchanging the first x-ray generating component with a second x-ray generating component to form a modified x-ray source, and emitting a second x-ray beam from the modified x-ray source based on a second desired depth, to non-destructively measure a crystallographic signature of the sample at the second desired depth.

Claims

1. An x-ray diffraction system comprising:

an x-ray source including a first interchangeable x-ray generating component;

a second interchangeable x-ray generating component configured to be interchanged with the first interchangeable x-ray generating component;

an actuator operatively connected to both the first interchangeable x-ray generating component and the second interchangeable x-ray generating component for mechanically interchanging the first interchangeable x-ray generating component with the second interchangeable x-ray generating component; and

a controller operatively connected to the actuator.

2. An x-ray diffraction system as recited in claim 1, further comprising a carousel, wherein the first and second interchangeable x-ray generating components are mounted to the carousel, wherein the carousel can be at least one of a linear carousel, and a rotary carousel, and wherein the actuator is operatively connected to the carousel for movement thereof to mechanically interchange the first and second interchangeable x-ray generating components.

3. An x-ray diffraction system as recited in claim 1, further comprising a shaft defining a shaft axis and a rotary carousel operatively connected to the shaft, wherein the first and second interchangeable x-ray generating components are mounted to the rotary carousel, and wherein the actuator is operatively connected to the shaft to drive rotation of the shaft and the rotary carousel about the shaft axis for mechanically interchanging the first and second interchangeable x-ray generating components.

4. An x-ray diffraction system as recited in claim 1, wherein the first interchangeable x-ray generating component is a first interchangeable x-ray target and the second interchangeable x-ray generating component is a second interchangeable x-ray target.

5. An x-ray diffraction system as recited in claim 4, further comprising an x-ray tube, wherein the first and second interchangeable x-ray targets are disposed within the x-ray tube, and wherein the first interchangeable x-ray target is configured to emit a first x-ray beam at a first energy and first wavelength and wherein the second interchangeable x-ray target is configured to emit a second x-ray beam at a second energy and second wavelength, wherein at least one of the first energy and first wavelength is different from at least one of the second energy and second wavelength.

6. An x-ray diffraction system as recited in claim 4, wherein at least one of the first interchangeable x-ray target and the second interchangeable x-ray target can include a material selected from the group consisting of copper, silver, chromium, vanadium, manganese, cobalt, molybdenum, and titanium.

7. An x-ray diffraction system as recited in claim 1, wherein the first interchangeable x-ray generating component is a first interchangeable x-ray tube and the second interchangeable x-ray generating component is a second interchangeable x-ray tube.

8. An x-ray diffraction system as recited in claim 7, wherein the first interchangeable x-ray tube is configured to emit a respective first x-ray at a first energy and first wavelength and wherein the second interchangeable x-ray tube is configured to emit a respective second x-ray at a second energy and second wavelength, wherein at least one of the first energy and the first wavelength is different from at least one of the second energy and second wavelength.

9. An x-ray diffraction system as recited in claim 7, wherein the first interchangeable x-ray tube and the second interchangeable x-ray tube each include a respective x-ray target, wherein the x-ray target of the first interchangeable x-ray tube is different from the x-ray target of the second interchangeable x-ray tube.

10. An x-ray diffraction system as recited in claim 9, wherein at least one of the respective x-ray targets of the first and second interchangeable x-ray tubes includes a material selected from the group consisting of copper, silver, chromium, vanadium, manganese, cobalt, molybdenum, and titanium.

11. An x-ray diffraction system as recited in claim 1, further comprising a multi-axis sample stage operatively connected to the controller, wherein the controller is configured to adjust the alignment of the sample stage relative to the x-ray source to adjust an angle of incidence between an x-ray emitted by the x-ray source and a sample on the sample stage.

12. An x-ray diffraction system as recited in claim 1, wherein the controller is configured to direct the actuator to interchange the first interchangeable x-ray generating component with the second interchangeable x-ray generating component based on a desired crystallographic measurement depth in a sample for a second non-destructive below surface measurement.

13. A tangible, non-transitory, computer-readable media having software encoded thereon, the software, when executed by a processor, operable to:

receive a desired crystallographic measurement depth of a sample; and

select at least one of an x-ray target, incident beam collimating optic and diffracted beam collimating optic based on the desired crystallographic measurement depth for use in non-destructive x-ray crystallography.

14. The tangible, non-transitory, computer-readable media of claim 13, the software, when executed by a processor, further operable to:

execute a command to cause an actuator to mechanically alter at least one of a current x-ray target, incident beam collimating optic, and diffracted beam collimating optic to match at least one of the selected x-ray target, incident beam collimating optic and diffracted beam collimating optic for non-destructive below surface measurements of the sample.

15. A method for non-destructive x-ray diffraction, comprising:

emitting a first x-ray beam from an x-ray source with a first x-ray generating component based on a first desired measurement depth to measure a crystallographic signature of a sample at the first desired measurement depth;

interchanging the first x-ray generating component with a second x-ray generating component to form a modified x-ray source; and

emitting a second x-ray beam from the modified x-ray source based on a second desired measurement depth, wherein the second desired measurement depth is different from the first desired measurement depth, to non-destructively measure a crystallographic signature of the sample at the second desired depth.

16. A method as recited in claim 15, wherein the step of interchanging the first x-ray generating component with a second x-ray generating component includes interchanging a first x-ray tube with a second x-ray tube.

17. A method as recited in claim 15, wherein the step of interchanging the first x-ray generating component with a second x-ray generating component includes interchanging a first x-ray target with a second x-ray target.

18. A method as recited in claim 15, wherein the first x-ray has a first energy and first wavelength and second x-ray has a second energy and second wavelength, wherein at least one of the first energy and first wavelength is different from at least one of the second energy and second wavelength.

19. A method as recited in claim 15, further comprising adjusting the alignment of the sample relative to at least one of the x-ray source and the modified x-ray source to adjust an angle of incidence between at least one of the first x-ray and the second x-ray and the sample.

20. A method as recited in claim 15, further comprising adjusting the alignment of a multi-axis sample stage relative to at least one of the x-ray source and the modified x-ray source based on a desired crystallographic measurement depth in the sample.