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INSPECTION METHOD OF SENSOR DEVICE AND SENSOR DEVICE

  • US 20150253372A1
  • Filed: 02/27/2015
  • Published: 09/10/2015
  • Est. Priority Date: 03/06/2014
  • Status: Active Grant
First Claim
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1. An inspection method of a sensor device, comprising:

  • a first step of discharging a capacitor by using a switching circuit and outputting a first driving voltage from both of first and second driving circuits;

    a second step of releasing the discharge of the capacitor by the switching circuit and outputting a second driving voltage from both of the first and second driving circuits; and

    a third step of determining whether or not a voltage output from an amplifier circuit in the second step is included in a first normal range,wherein a first inspection stage includes the first step, the second step, and the third step, andthe sensor device includes;

    a sensor unit including a first capacitive sensor element connected between a first driving terminal and a signal terminal and a second capacitive sensor element connected between a second driving terminal and the signal terminal;

    the first driving circuit configured to output the first driving voltage or the second driving voltage to the first driving terminal;

    the second driving circuit configured to output the first driving voltage or the second driving voltage to the second driving terminal;

    the capacitor having an end connected to the signal terminal;

    the amplifier circuit configured to output a voltage, which is obtained by amplifying a difference between a voltage of the signal terminal and a reference voltage, to the other end of the capacitor so that the voltage of the signal terminal becomes close to the reference voltage; and

    the switching circuit configured to discharge electric charges accumulated in the capacitor.

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