MATERIAL EROSION MONITORING SYSTEM AND METHOD

• US 20150276577A1
• Filed: 03/26/2014
• Published: 10/01/2015
• Est. Priority Date: 03/26/2014
• Status: Active Grant

• Current Assignee: Paneratech, Inc.
• Original Assignee: Paneratech, Inc.
• Inventors: Bayram, Yakup, Walton, Eric K., Ruege, Alexander C.
• Granted Patent: US 9,488,601 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: F27D 21/0021 Devices for monitoring linings for wear
• CPC Class Codes: G01B 15/02 for measuring thickness
• CPC Class Codes: G01N 22/02 Investigating the presence of flaws
• CPC Class Codes: G01N 33/388 Ceramics

Abstract

Disclosed is an improved system and method to evaluate the status of a material. The system and method are operative to identify flaws and measure the erosion profile and thickness of different materials, including refractory materials, using electromagnetic waves. The system is designed to reduce a plurality of reflections, associated with the propagation of electromagnetic waves launched into the material under evaluation, by a sufficient extent so as to enable detection of electromagnetic waves of interest reflected from remote discontinuities of the material. Furthermore, the system and method utilize a configuration and signal processing techniques that reduce clutter and enable the isolation of electromagnetic waves of interest. Moreover, the launcher is impedance matched to the material under evaluation, and the feeding mechanism is designed to mitigate multiple reflection effects to further suppress clutter.

Claims

1. A system for evaluating a status of a material, comprising:

a. an electromagnetic wave launcher having a first feeding end and a second launching end, wherein said first feeding end includes a feeding mechanism to excite an electromagnetic wave able to propagate through said electromagnetic wave launcher, wherein said second launching end is physically structured to reduce a plurality of reflections and probe ringing of said electromagnetic wave propagating through said launching end, by a sufficient extent so as to enable detection of an electromagnetic wave of interest reflected from a remote discontinuity of said material, wherein said electromagnetic wave launcher is provided a physical configuration to have an impedance at said second launching end that substantially matches an impedance of a near surface of said material, wherein said electromagnetic wave launcher is adapted to delay receipt of said electromagnetic wave of interest reflected from said remote discontinuity of said material by a time period sufficient to distinguish between said reflected electromagnetic wave of interest and reflected spurious signals from said near surface of said material, and wherein said launching end is adapted to be conformal to an area of said near surface of said material; and

b. a computer-based processor having an executable computer code configured to;

measure said reflected electromagnetic wave of interest to produce frequency domain data;

transform said frequency domain data to time domain data;

calibrate said time domain data to distance domain data;

identify a peak in said distance domain profile associated with said electromagnetic wave of interest reflected from said material; and

determine a distance traveled by said electromagnetic wave of interest reflected from said material.

2. The system of claim 1, wherein calibrating said time domain data to a distance domain data is performed by said computer executable code based upon a known velocity of a said electromagnetic wave of interest travelling through said material.

3. The system of claim 1, wherein said computer-based processor is adapted to visually display information about said status of said material based upon said distance traveled by said electromagnetic wave of interest reflected from said material.

4. The system of claim 1, wherein said status of said material is a thickness of said material.

5. The system of claim 1, wherein said status of said material is a flaw of said material.

6. The system of claim 1, wherein said electromagnetic wave launcher and at least one other component of said system are integrated into a single unit.

7. The system of claim 1, wherein said second launching end has at least one edge physically conformed to extend away from said area to be evaluated of said near surface of said material.

8. The system of claim 7, wherein said edge has a smooth rolled-edge configuration.

9. The system of claim 1, wherein said electromagnetic wave launcher is formed using a variable conductivity material disposed between said first feeding end and said second launching end, wherein said variable conductivity material has a first end closer to said first feeding end and a second end closer to said second launching end, and wherein said conductivity increases as a function of a distance from a point on said variable conductivity material to said second end of said variable conductivity material closer to said second launching end of said electromagnetic wave launcher.

10. The system of claim 1, wherein said first feeding end is adapted to reduce a plurality of reflections of said excited electromagnetic wave at said first feeding end, by a sufficient extent so as to reduce a level of clutter otherwise present in said system.

11. The system of claim 10, wherein said first feeding end further comprises a cavity-backed feeding pin.

12. The system of claim 1, said system further comprising an RF subsystem generating an electromagnetic wave in a frequency range of between 0.25 and 30 GHz.

13. The system of claim 1, said system further comprising an RF subsystem generating an electromagnetic wave in a frequency range of between 0.25 and 6 GHz.

14. A system for evaluating a status of a material, comprising:

a. an electromagnetic wave launcher having an elongated section, wherein said elongated section has a first feeding end and a second launching end, wherein said first feeding end includes a feeding mechanism to excite an electromagnetic wave able to propagate through said electromagnetic wave launcher, wherein said elongated section is physically structured to reduce a plurality of reflections of said electromagnetic wave propagating through said launching end, by a sufficient extent so as to enable detection of an electromagnetic wave of interest reflected from a remote discontinuity of said material, wherein said electromagnetic wave launcher is provided a physical configuration to have an impedance at said second launching end that substantially matches an impedance of a near surface of said material, wherein said electromagnetic wave launcher is adapted to delay receipt of said electromagnetic wave of interest reflected from said remote discontinuity of said material by a time period sufficient to distinguish between said reflected electromagnetic wave of interest and reflected spurious signals from said near surface of said material, and wherein said launching end is adapted to be conformal to an area of said near surface of said material; and

b. a computer-based processor having an executable computer code configured to;

measure said reflected electromagnetic wave of interest to produce frequency domain data;

transform said frequency domain data to time domain data;

calibrate said time domain data to distance domain data;

identify a peak in said distance domain profile associated with said electromagnetic wave of interest reflected from said material; and

determine a distance traveled by said electromagnetic wave of interest reflected from said material.

15. A system for evaluating a status of a material, comprising:

a. an electromagnetic wave launcher having a feeding end that includes a feeding mechanism to excite an electromagnetic wave, wherein said electromagnetic wave launcher launches said electromagnetic wave into a near surface of said material, wherein said electromagnetic wave launcher is physically structured to reduce a plurality of reflections of said launched electromagnetic wave, by a sufficient extent so as to enable detection of an electromagnetic wave of interest reflected from a remote discontinuity of said material, wherein said electromagnetic wave launcher is adapted to be conformal to an area of said near surface of said material and is provided a physical configuration to have an impedance that substantially matches an impedance of said near surface of said material, wherein said electromagnetic wave launcher is adapted to delay receipt of said electromagnetic wave of interest reflected from said remote discontinuity of said material by a time period sufficient to distinguish between said reflected electromagnetic wave of interest and reflected spurious signals from said material; and

b. a computer-based processor having an executable computer code configured to;

measure said reflected electromagnetic wave of interest to produce frequency domain data;

transform said frequency domain data to time domain data;

calibrate said time domain data to distance domain data;

identify a peak in said distance domain profile associated with said electromagnetic wave of interest reflected from said material; and

determine a distance traveled by said electromagnetic wave of interest reflected from said material.

16. A method for evaluating a status of a material, comprising:

a. providing an electromagnetic wave launcher having a first feeding end and a second launching end, wherein said first feeding end includes a feeding mechanism to excite an electromagnetic wave able to propagate through said electromagnetic wave launcher, wherein said second launching end is physically structured to reduce a plurality of reflections of said electromagnetic wave propagating through said launching end, by a sufficient extent so as to enable detection of an electromagnetic wave of interest reflected from a remote discontinuity of said material, wherein said electromagnetic wave launcher is provided a physical configuration to have an impedance at said second launching end that substantially matches an impedance of a near surface of said material, wherein said electromagnetic wave launcher is adapted to delay receipt of said electromagnetic wave of interest reflected from said remote discontinuity of said material by a time period sufficient to distinguish between said reflected electromagnetic wave of interest and reflected spurious signals from said near surface of said material, and wherein said launching end is adapted to be conformal to an area of said near surface of said material;

b. placing said launching end of said electromagnetic wave launcher conformally contiguous to said area of said near surface of said material to be evaluated;

c. launching a plurality of electromagnetic waves, propagating within a predetermined frequency range, onto said area to be evaluated of said near surface of said material;

d. detecting said electromagnetic wave of interest within said predetermined frequency range; and

e. determining said status of said material based upon a determined distance traveled by said electromagnetic wave of interest reflected from said remote discontinuity of said material.

17. The method of claim 16, wherein said distance traveled by said electromagnetic wave of interest is determined based upon a time of travel of said electromagnetic wave of interest.

18. The method of claim 17, wherein said time of travel of said electromagnetic wave of interest is greater than a time of travel of said spurious signals by a sufficient extent so as to enable temporal isolation of said electromagnetic wave of interest from said spurious signals.

19. The method of claim 16, wherein determining said status of said material further comprising:

a. measuring a set of data pertaining to said detected electromagnetic wave of interest to produce frequency domain data;

b. transforming said frequency domain data to time domain data;

c. calibrating said time domain data to a distance domain data;

d. identifying a peak in said distance domain data associated with said electromagnetic wave of interest reflected from said remote discontinuity of said material;

e. determining a distance traveled by said electromagnetic wave of interest reflected from said remote discontinuity of said material; and

f. determining a measurement of a distance from said near surface of said material to said remote discontinuity of said material based upon said distance traveled by said electromagnetic wave of interest reflected from said remote discontinuity of said material.

20. The method of claim 19, wherein calibrating said time domain data to said distance domain data is performed based upon a known propagation velocity of said electromagnetic wave of interest through said material.

21. The method of claim 16, wherein determining said status of said material further comprising:

a. measuring a set of data pertaining to said detected electromagnetic wave of interest;

b. providing a first means for storing said set of data;

c. providing a computer-based data processor for processing said set of data for evaluating said status of said material;

d. transferring said set of data from said first means to said computer-based data processor; and

e. processing said set of data by means of at least one signal processing method.

22. The method of claim 21, further comprising the step of processing said set of data utilizing a signal processing method selected according to a characteristic of said material to be evaluated.

23. The method of claim 16, wherein said status of said material is a thickness of said material.

24. The method of claim 16, further comprising the step of visually displaying information about said status of said material.

25. The method of claim 16, wherein said frequency range is between 0.25 and 30 GHz.

26. The method of claim 25, wherein said frequency range is between 0.25 and 6 GHz.