Self-Test of a Physical Unclonable Function
First Claim
1. A circuit unit (1) comprising a physical unclonable function (6), called PUF (6) below, a testing unit (5) and an information memory (7) for storing at least one challenge-response pair (CR1);
- the challenge-response pair (CR1) comprising an item of challenge information (C1) and an associated item of response information (R1); and
the testing unit (5) being configured and/or adapted to prompt an input of the challenge information (C1) to the PUF (6), to use a PUF response (PR1) thereto, which is generated by the PUF (6), and the response information (R1) for a comparison and to enable or restrict use of the PUF (6) on the basis of the comparison result.
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Accused Products
Abstract
The invention relates to a circuit unit (1) comprising a Physical Unclonable Function (6), hereinafter referred to as PUF (6), a verification unit (5) and an information storage device (7) for storing at least one Challenge-Response-Pair (CR1); wherein the Challenge-Response-Pair (CR1) comprises a Challenge Information (C1) and a Response Information (R1) associated therewith, and wherein the verification unit (5) is embodied and/or adapted, in order to bring about an input of the challenge information (C1) into the PUF (6) and to use a PUF Response (PR1) created thereafter by the PUF (6) and the Response Information for a comparison, and in dependence of the result of the comparison release or restrict a use of the PUF (6).
19 Citations
18 Claims
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1. A circuit unit (1) comprising a physical unclonable function (6), called PUF (6) below, a testing unit (5) and an information memory (7) for storing at least one challenge-response pair (CR1);
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the challenge-response pair (CR1) comprising an item of challenge information (C1) and an associated item of response information (R1); and the testing unit (5) being configured and/or adapted to prompt an input of the challenge information (C1) to the PUF (6), to use a PUF response (PR1) thereto, which is generated by the PUF (6), and the response information (R1) for a comparison and to enable or restrict use of the PUF (6) on the basis of the comparison result. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method for carrying out a self-test for a circuit unit (1) comprising a physical unclonable function (6), called PUF (6) below, a testing unit (5) and an information memory (7) for storing at least one challenge-response pair (CR1), the challenge-response pair (CR1) comprising an item of challenge information (C1) and an associated item of response information (R1), the method comprising the method steps of:
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inputting the challenge information (C1) to the PUF (6); using a PUF response (PR1) thereto, which is generated by the PUF (6), and the response information (R1) for a comparison carried out by the testing unit (5), use of the PUF (6) being enabled or restricted on the basis of the comparison result. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18)
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Specification