IMAGE MEASURING DEVICE

• US 20150287177A1
• Filed: 04/07/2015
• Published: 10/08/2015
• Est. Priority Date: 04/08/2014
• Status: Abandoned Application

• Current Assignee: Mitutoyo Corporation
• Original Assignee: Mitutoyo Corporation
• Inventors: KAIEDA, Makoto, TAKADA, Akira
• Application Number:
  US14/680,356
• Publication Number:
  US 20150287177A1
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01B 11/002 for measuring two or more coordinates
• CPC Class Codes: G01B 11/022 by means of tv-camera scanning
• CPC Class Codes: G01B 11/03 by measuring coordinates of points
• CPC Class Codes: G01B 11/26 for measuring angles or tapers; for testing the alignment of axes
• CPC Class Codes: G06F 18/22 Matching criteria, e.g. proximity measures
• CPC Class Codes: G06T 2207/30164 Workpiece; Machine component
• CPC Class Codes: G06T 7/001 using an image reference approach
• CPC Class Codes: G06T 7/74 involving reference images or patches
• CPC Class Codes: G06V 10/245 by locating a pattern; Special marks for positioning

Abstract

An image measuring device having an XY stage capable of moving along orthogonal XY axes includes an imaging capturer that takes an image of a plurality of same shape measured objects placed onto the XY stage, a specifier that specifies a location and a rotation angle of each measured object by using preregistered image patterns and through pattern matching, and a detector that measures a dimension of each measured object using at least one of the specified location and rotation angle and detects coordinate data of each measured object on the XY stage.

Claims

1. An image measuring device having an XY stage that is movable along orthogonal XY axes, the image measuring device comprising:

an imaging capturer configured to take an image of a plurality of same shape measured objects placed onto the XY stage;

a specifier configured to specify a location and a rotation angle of each measured object by using preregistered image patterns and through pattern matching; and

a detector configured to measure a dimension of each measured object using at least one of the specified location and rotation angle, the detector further configured to detect coordinate data of each measured object on the XY stage.

2. The image measuring device according to claim 1, wherein coordinate data for the dimensional measurement of each measured object is set using at least one of the specified location and rotation angle of each measured object specified by the pattern matching.

3. The image measuring device according to claim 1, wherein a number of measured objects specified by the pattern matching is set as the number of repeat processes.

4. The image measuring device according to claim 2, wherein a number of measured objects specified by the pattern matching is set as the number of repeat processes.