INTEGRATED HARDWARE AND SOFTWARE FOR PROBE

• US 20150292908A1
• Filed: 01/24/2013
• Published: 10/15/2015
• Est. Priority Date: 01/24/2013
• Status: Abandoned Application

• Current Assignee: Intel Corporation
• Original Assignee: Intel Corporation
• Inventors: Wang, Minglei, Kane, Kapil, Beauregard, Russell
• Application Number:
  US13/976,824
• Publication Number:
  US 20150292908A1
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01D 5/16 by varying resistance
• CPC Class Codes: G01H 17/00 Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves, not provided for in the preceding groups see provisionally also G01H1/00
• CPC Class Codes: G01K 17/00 Measuring quantity of heat measuring temperature by calorimetry G01K3/00 - G01K11/00; specially adapted for measuring thermal properties of materials, e.g. specific heat, heat of combustion G01N
• CPC Class Codes: G06F 13/4072 Drivers or receivers G06F13/4086 takes precedence; for multistate logic circuits H03K19/0002

Abstract

A computing device is described. The computing device may include a port to receive voltage from a probe. The computing device may include logic at least partially comprising hardware to determine a resistance level associated with the voltage. The logic may route the voltage based on the resistance level. The logic may associate the resistance level with a specific context.

Claims

1. A system, comprising;

a probe to provide a voltage to the system, wherein the voltage is related to contextual data;

an interface of a computing device comprising;

a port to receive the voltage;

a multiplexer to route the voltage;

a resistor to measure a resistance level of the voltage; and

an analyzer module to determine the contextual data based on the resistance level.

2. The system of claim 1, comprising an analog to digital converter to convert voltage received in an analog format to digital format to be analyzed by the analyzer module.

3. The system of claim 1, comprising pins to receive the voltage wherein the resistance level on each of the pins may vary based on the probe.

4. The system of claim 1, wherein the port is an audio port and wherein the multiplexer is to detect that the port is coupled to an audio device based on the resistance level.

5. The system of claim 1, wherein the multiplexer is to detect a resistance level of the voltage to route the voltage to the analyzer.

6. The system of claim 1, wherein the probe is a thermistor probe, and wherein the contextual data is a temperature associated with the resistance level.

7. The system of claim 1, wherein the interface is integrated within the computing device.

9. The computing device of claim 7, comprising an analog to digital converter to convert the voltage to digital format to be associated with the specific context.

10. The computing device of claim 7, comprising pins wherein the resistance level on each of the pins may vary based on the probe.

11. The computing device of claim 7, wherein the port is an audio port and wherein the logic is to detect that the port is coupled to an audio device based on the resistance level.

12. The computing device of claim 7, wherein the logic comprises:

a multiplexer to route the voltage based on the resistance level;

a resistor to measure the voltage; and

an analyzer module to associate the resistance level with a specific context.

13. The computing device of claim 7, wherein the probe is a thermal probe, and wherein the specific context is a temperature associated with the resistance level.

14. The computing device of claim 7, wherein the logic is integrated within the computing device.

19. The method of claim 7, wherein the port is an audio port, comprising detecting whether the port is coupled to an audio device based on the resistance level.

20. The method of claim 7, wherein the probe is a thermal probe, and wherein the specific context is a temperature associated with the resistance level.

21. The method of claim 7, wherein the multiplexer, the port, and the analyzer are each integrated as a combination of hardware and logic within the computing device.

8. A computing device, comprising:

a port to receive voltage from a probe;

logic at least partially comprising hardware to;

determine a resistance level associated with the voltage;

route the voltage based on the resistance level; and

associate the resistance level with a specific context.

15. A method, comprising:

receiving, at a port of a computing device, a voltage from a probe;

determining, via a multiplexer, a resistance level associated with the voltage;

routing, via the multiplexer, the voltage based on the resistance level; and

associating, via an analyzer module, the resistance level with a specific context.

16. The method of claim 15, comprising converting the voltage to digital format to be associated with the specific context.

17. The method of claim 15, wherein the port comprises pins, comprising receiving the voltage from the probe at each of the pins.

18. The method of claim 17, wherein the voltage received may vary based on the probe.