SYSTEM AND METHOD FOR CALIBRATING A MEASURING ARRANGEMENT AND CHARACTERIZING A MEASUREMENT MOUNT
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Accused Products
Abstract
A method and a system for calibrating a measuring arrangement on the basis of a 16-term error model determines a matrix (A) with measured scattering parameters (Sm) from different calibration standards (3) and with associated actual scattering parameters (Sa) of the calibration standards (3) and determines linear-in-T system errors ({tilde over (T)}i) for the calibration of a network analyzer (1) by solving a linear equation system with the determined matrix (A). To solve the linear equation system, a first and a second linear-in-T system error (k,p) are freely selected in each case. With use of reciprocal calibration standards, the determined linear-in-T system errors are weighted with the freely selected first linear-in-T system error ({tilde over (T)}i) or with a correct second linear-in-T system error (pkor(k) dependent upon the first linear-in-T system error (k).
1 Citation
42 Claims
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1-21. -21. (canceled)
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22. A method for calibrating a measuring arrangement based on an error model, wherein the method comprises:
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determining a matrix with measured scattering parameters from different calibration standards and with associated actual scattering parameters of the calibration standards; and determining linear-in-T system errors for calibrating a measuring arrangement by solving a linear equation system with the matrix, wherein in order to solve the linear equation system, a first and a second linear-in-T system error are each freely selected, and, with use of reciprocal calibration standards, the linear-in-T system errors are weighted with the first linear-in-T system error or with a correct second linear-in-T system error dependent upon the first linear-in-T system error. - View Dependent Claims (23, 24, 25, 26)
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27. A method for characterizing a measurement holder connected to a network analyzer based on an error model, wherein the method comprises:
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determining a matrix with measured scattering parameters from different calibration standards fixed in each case in the measurement holder and with associated actual scattering parameters of the calibration standards; determining linear-in-T system errors of the error model by solving a linear equation system with the matrix; and transforming the linear-in-T system error into corresponding system errors of a system-error matrix of the error model which characterize the measurement holder, wherein in order to solve the linear equation system, a first and second linear-in-T system error are each freely selected and, with use of reciprocal calibration standards, the given system error of the system-error matrix is weighted with a correct first linear-in-T system error or with a correct second linear-in-T system error. - View Dependent Claims (28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38)
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39. A system for calibrating a measuring arrangement based on an error model with different calibration standards,
wherein a determination of linear-in-T system errors of the error model is implemented based on measured scattering parameters and actual scattering parameters of the calibration standards, and wherein the calibration standards are reciprocal and a weighting of the given linear-in-T system errors is implemented with a freely selected first linear-in-T system error or with a correct second linear-in-T system error dependent upon the first linear-in-T system error.
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41. A system for characterizing a measurement holder connected to a network analyzer based on an error model,
wherein a determination of linear-in-T system errors is implemented on the basis of measured scattering parameters and actual scattering parameters by calibration standards fixed in the measurement holder and a transformation of the given linear-in-T system errors into corresponding system errors of a system-error matrix of the error model, and wherein the calibration standards are reciprocal, and a weighting of the given system errors of the system-error matrix is implemented with a correct first linear-in-T system error or with a correct second linear-in-T system error.
Specification