ELECTROMAGNETIC FIELD FEATURE CLASSIFICATION AND PRESENTATION DEVICE

• US 20150293162A1
• Filed: 09/04/2013
• Published: 10/15/2015
• Est. Priority Date: 10/24/2012
• Status: Abandoned Application

• Current Assignee: NEC Corporation
• Original Assignee: NEC Corporation
• Inventors: Tsukamoto, Kenta, Kusumoto, Manabu, Toyao, Hiroshi
• Application Number:
  US14/438,126
• Publication Number:
  US 20150293162A1
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01R 29/0814 Field measurements related to measuring influence on or from apparatus, components or humans EMC, EMI and similar testing in general G01R31/001, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
• CPC Class Codes: G01R 29/0871 Complete apparatus or systems; circuits, e.g. receivers or amplifiers G01R29/0878, G01R29/0892 take precedence; dosimeters, warning devices G01R29/0857
• CPC Class Codes: G01R 29/0878 Sensors; antennas; probes; detectors wave guide measuring sections G01R1/24
• CPC Class Codes: G01R 29/0892 Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value

Abstract

An electromagnetic field feature classification and presentation device is provided with: an acquisition means for collecting time series measurement data relating to an electromagnetic wave emitted from an object to be measured while associating the measurement data with the coordinates of positions; a feature amount calculation means for calculating one or more feature amounts for the coordinates of each position regarding the measurement data collected by the acquisition means; a feature analysis means for performing feature classification based on a cluster analysis on feature amount groups in the coordinates of respective positions calculated by the feature amount calculation means; a mapping processing means for linking classification results by the feature analysis means with the coordinates of respective positions and mapping the classification results on a space corresponding to the object to be measured; and an output means for presenting the result of the mapping by the mapping processing means.

Claims

1. An electromagnetic field feature classification and presentation device, comprising:

an acquisition means for collecting unit that collects time series measurement data on an electromagnetic wave emitted from an object to be measured in association with each coordinate of position;

a feature amount calculation means for calculating unit that calculates one or a plurality of feature amounts for each coordinate of position with respect to the measurement data collected by the acquisition means unit;

a feature analysis means for performing unit that performs feature classification based on a cluster analysis for a group of the feature amounts calculated by the feature amount calculation means unit at each coordinate of position;

a mapping processing means for associating unit that associates a classification result by the feature analysis means unit with the coordinate of position and maps the classification result on a space corresponding to the object to be measured by applying the number of feature classifications; and

an output means for presenting unit that presents a result of mapping by the mapping processing means unit.

2. The electromagnetic field feature classification and presentation device according to claim 1, wherein

the mapping processing means unit reads in cluster distances produced between respective clusters from a result of cluster analysis by the feature analysis means unit, and distinguishes presentation methods to be assigned to respective clusters in a presentation based on values of the cluster distances.

3. The electromagnetic field feature classification and presentation device according to claim 1, wherein

time series samples which reflect features of an electromagnetic wave to be classified as training data is stored and held in a storage unit in advance,

the feature analysis means unit performs feature classification based on the cluster analysis for the group of the feature amounts calculated by the feature amount calculation means unit at each coordinate of position and the training data, and

when the mapping processing means unit associates the classification result by the feature analysis means unit with the coordinate of position and maps the classification result on the space corresponding to the object to be measured, the mapping processing means unit performs mapping processing in such a way that the coordinate of position of measurement data clustered into the same group as the training data is distinguishable.

4. The electromagnetic field feature classification and presentation device according to claim 3, wherein

an index to be presented to a user is associated with the training data, and

the coordinate of position of measurement data clustered into the same group as the training data is mapped in such a way that the index associated with the training data is distinguishable.

5. The electromagnetic field feature classification and presentation device according to claim 1, wherein

when the mapping processing means unit associates the classification result by the feature analysis means unit with the coordinate of position and maps the classification result on the space corresponding to the object to be measured, the mapping processing means unit performs mapping processing in such a way that the coordinate of position of measurement data clustered into the same group as an arbitrarily designated coordinate position is distinguishable.

6. The electromagnetic field feature classification and presentation device according to claim 5, wherein

design data of an object to be measured, which is to be analyzed, is stored and held in a storage unit in advance, and

when the mapping processing means unit associates the classification result by the feature analysis means unit with the coordinate of position and maps the classification result on the space corresponding to the object to be measured, the mapping processing means unit performs mapping processing in such a way that the coordinate of position of measurement data clustered into the same group as a designated coordinate position in the design data is distinguishable.

7. The electromagnetic field feature classification and presentation device according to claim 5, wherein,

an image of an object to be measured, which is to be analyzed, is stored and held in a storage unit in advance, and

when the mapping processing means unit associates the classification result by the feature analysis means unit with the coordinate of position and maps the classification result on the space corresponding to the object to be measured, the mapping processing means unit performs mapping processing in such a way that the coordinate of position of measurement data clustered into the same group as a designated coordinate position on the image is distinguishable.

8. An electromagnetic near-field distribution measurement system, comprising:

a probe that senses an electromagnetic near field;

a probe scanning means for scanning unit that scans the probe;

a control means for controlling unit that controls the probe scanning means unit in synchronization with measurement of an electromagnetic wave;

an acquisition means for collecting unit that collects time series measurement data on an electromagnetic wave emitted from an object to be measured via the probe in association with each coordinate of position;

a feature amount calculation means for calculating unit that calculates one or a plurality of feature amounts for each coordinate of position with respect to the measurement data collected by the acquisition means unit;

a feature analysis means for performing unit that performs feature classification based on a cluster analysis for a group of the feature amounts calculated by the feature amount calculation means unit at each coordinate of position;

a mapping processing means for associating unit that associates a classification result by the feature analysis means unit with the coordinate of position and maps the classification result on a space corresponding to the object to be measured by applying the number of feature classifications; and

an output means for presenting unit that presents a result of mapping by the mapping processing means unit.

9. An electromagnetic field feature classification program that causes a control unit of an information processing system to function as:

an acquisition means for collecting unit that collects time series measurement data on an electromagnetic wave emitted from an object to be measured in association with each coordinate of position;

a feature amount calculation means for calculating unit that calculates one or a plurality of feature amounts for each coordinate of position with respect to the measurement data collected by the acquisition means unit;

a feature analysis means for performing unit that performs feature classification based on a cluster analysis for a group of the feature amounts calculated by the feature amount calculation means unit at each coordinate of position; and

a mapping processing means for associating unit that associates a classification result by the feature analysis means unit with the coordinates of positions and maps the classification result on a space corresponding to the object to be measured by reflecting the number of feature classifications.

10. An electromagnetic field feature classification method, comprising:

collecting time series measurement data on an electromagnetic wave emitted from an object to be measured in association with each coordinate of position;

calculating one or a plurality of feature amounts for each coordinate of position with respect to the collected measurement data;

performing feature classification processing based on a cluster analysis for a group of the calculated feature amounts at the each coordinate of position; and

associating a classification result by the feature classification processing with the coordinates of positions and mapping the classification results on a space corresponding to the object to be measured by reflecting the number of feature classifications.