Alarm System Testing Device

• US 20150294556A1
• Filed: 04/14/2014
• Published: 10/15/2015
• Est. Priority Date: 04/14/2014
• Status: Active Grant

• Current Assignee: Larry C. Geoghegan, Stephen D. Ainsworth
• Original Assignee: Larry C. Geoghegan, Stephen D. Ainsworth
• Inventors: Ainsworth, Stephen D., Geoghegan, Larry C.
• Granted Patent: US 9,564,045 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G08B 29/00 Checking or monitoring of signalling or alarm systems; Prevention or correction of operating errors, e.g. preventing unauthorised operation
• CPC Class Codes: G08B 29/123 of line circuits

Abstract

An alarm system testing device facilitates simulation of a trouble condition and testing circuit continuity of an alarm system within a structure. The device includes an alarm system comprising an electrical circuit, an alarm, a resistor, and at least one trigger. The alarm is activated by the trigger shorting a positive rail of the electrical circuit to a negative rail. A testing switch has a ground position wherein the positive rail of the electrical circuit is grounded when the testing switch is in the ground position. The resistor is electrically coupled to the testing switch such that positioning the testing switch in a resistor bypass position removes the resistor from the electrical circuit.

Claims

1. An alarm system testing device comprising:

an alarm system comprising an electrical circuit, said alarm system including an alarm and at least one trigger, said alarm being activated by said trigger shorting a positive rail of said electrical circuit to a negative rail, said alarm system comprising a resistor electrically coupled to said circuit; and

a testing switch electrically coupled to said electrical circuit, said testing switch having a ground position wherein said positive rail of said electrical circuit is grounded when said testing switch is in said ground position, said resistor being electrically coupled to said testing switch such that positioning said testing switch in a resistor bypass position removes said resistor from said electrical circuit.

2. The device of claim 1, further comprising a faceplate configured for coupling to a wall surface exposing an exterior side of said faceplate on the wall surface, said testing switch being coupled to an interior side of said faceplate wherein said testing switch is configured for being positioned in a building structure.

3. The device of claim 1, further comprising said testing switch comprising a key hole configured for receiving a key wherein said testing switched is switched into a selectable position by the key.

4. The device of claim 2, further comprising said testing switch comprising a key hole configured for receiving a key wherein said testing switched is switched into a selectable position by the key, said keyhole being exposed on said exterior side of said faceplate.

5. The device of claim 1, further comprising said testing switch having a passive position wherein said testing switch electrically couples said positive rail to said negative rail through said resistor.

6. An alarm system testing device comprising:

an alarm system comprising an electrical circuit, said alarm system including an alarm and at least one trigger, said alarm being activated by said trigger shorting a positive rail of said electrical circuit to a negative rail of said electrical circuit, said alarm system comprising a resistor electrically coupled to said circuit; and

a testing switch electrically coupled to said electrical circuit, said testing switch having a ground position wherein said positive rail of said electrical circuit is grounded when said testing switch is in said ground position, said resistor being electrically coupled to said testing switch such that positioning said testing switch in a resistor bypass position removes said resistor from said electrical circuit, said testing switch comprising a key hole configured for receiving a key wherein said testing switched is switched into a selectable position by the key, said testing switch having a passive position wherein said testing switch electrically couples said positive rail to said negative rail through said resistor; and

a faceplate configured for coupling to a wall surface exposing an exterior side of said faceplate on the wall surface, said testing switch being coupled to an interior side of said faceplate wherein said testing switch is configured for being positioned in a building structure, said keyhole being exposed on said exterior side of said faceplate.