OPTICAL OBSERVATION DEVICE

• US 20150301256A1
• Filed: 12/13/2013
• Published: 10/22/2015
• Est. Priority Date: 12/20/2012
• Status: Active Grant

• Current Assignee: Hamamatsu Photonics KK
• Original Assignee: Hamamatsu Photonics KK
• Inventors: TAKIGUCHI, Yuu
• Granted Patent: US 9,846,267 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G02B 21/00 Microscopes
• CPC Class Codes: G02B 21/0032 Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers G02B21/0036 - G02B21/008; means for illumination of specimens in general G02B21/06
• CPC Class Codes: G02B 21/365 Control or image processing arrangements for digital or video microscopes G02B21/361, G02B21/362 take precedence
• CPC Class Codes: G02B 3/08 with discontinuous faces, e.g. Fresnel lens diffractive Fresnel lenses G02B5/1876
• CPC Class Codes: G02B 5/18 Diffraction gratings holographic optical elements G02B5/32, G03H; integrally combined with optical fibres G02B6/02057; for coupling light guides G02B6/34; integrally combined with optical integrated light guides G02B6/12; grating systems G02B27/44
• CPC Class Codes: G02B 5/1814 structurally combined with one or more further optical elements, e.g. lenses, mirrors, prisms or other diffraction gratings G02B5/189 takes precedence
• CPC Class Codes: G02B 5/32 Holograms used as optical elements
• CPC Class Codes: G03H 1/0005 Adaptation of holography to specific applications holographic optical element G02B5/32; holographic scanner G02B26/106; recognition using holographic mask G06V10/88; holographic memories G11B7/0065, G11C13/042
• CPC Class Codes: G03H 1/0841 Encoding method mapping the synthesized field into a restricted set of values representative of the modulator parameters, e.g. detour phase coding
• CPC Class Codes: G03H 2001/005 in microscopy, e.g. digital holographic microscope [DHM] microscopes G02B21/00; digital holography G03H1/0866
• CPC Class Codes: G03H 2001/0094 for patterning or machining using the holobject as input light distribution microlithography G03F7/70283
• CPC Class Codes: G03H 2001/085 Kinoform, i.e. phase only encoding wherein the computed field is processed into a distribution of phase differences

Abstract

An optical observation system includes a spatial light modulator displaying a Fresnel type kinoform on a phase modulation plane, and modulating light L1 in phase to irradiate an observation object with modulated light L2, an imaging optical system imaging observation target light L3 from the observation object, an optical system moving mechanism moving the imaging optical system in an optical axis direction of the observation target light L3, and a control section controlling the optical system moving mechanism such that the focal position of the imaging optical system changes in response to a change in the light condensing position of the modulated light L2 by the Fresnel type kinoform.

Claims

1. An optical observation system for imaging observation target light from an observation object, comprising:

a light source configured to output light;

a spatial light modulator comprising a phase modulation plane including a plurality of two-dimensionally arrayed regions, and configured to display a Fresnel type kinoform on the phase modulation plane, and modulate the light in phase in each of the plurality of regions to generate modulated light, and configured to output the modulated light to the observation object;

an optical system configured to image the observation target light from the observation object;

an optical system moving mechanism installed for the optical system and configured to move the optical system; and

a controller configured to control the optical system moving mechanism such that a focal position of the optical system changes in response to a change in light condensing position of the modulated light by the Fresnel type kinoform.

2. The optical observation system according to claim 1, wherein the optical system images the observation target light transmitted through the observation object.

3. The optical observation system according to claim 1, further comprising an observation object moving mechanism configured to move the observation object in an optical axis direction of the observation target light.

4. The optical observation system according to claim 1, wherein the optical system comprises an imaging lens, and the optical system moving mechanism moves the imaging lens.

5. The optical observation system according to claim 1, wherein the optical system comprises an imaging device, and the optical system moving mechanism moves the imaging device.

6. The optical observation system according to claim 1, wherein the controller, during output of the modulated light to the observation object, controls the optical system moving mechanism such that a focal position of the optical system changes based on the Fresnel type kinoform which is displayed on the phase modulation plane.

7. The optical observation system according to claim 1, wherein the controller, after output of the modulated light to the observation object, controls the optical system moving mechanism such that a focal position of the optical system changes based on the Fresnel type kinoform which has been stored in advance.