SYSTEMS AND METHODS FOR MAPPING AN ENVIRONMENT USING STRUCTURED LIGHT

• US 20150302648A1
• Filed: 02/18/2015
• Published: 10/22/2015
• Est. Priority Date: 02/18/2014
• Status: Abandoned Application

• Current Assignee: Sulon Technologies Inc.
• Original Assignee: Sulon Technologies Inc.
• Inventors: ZHANG, Jian
• Application Number:
  US14/625,448
• Publication Number:
  US 20150302648A1
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01B 11/2513 with several lines being projected in more than one direction, e.g. grids, patterns
• CPC Class Codes: G02B 2027/0127 comprising devices increasing the depth of field
• CPC Class Codes: G02B 2027/014 comprising information/image processing systems
• CPC Class Codes: G02B 26/10 Scanning systems
• CPC Class Codes: H04N 13/344 with head-mounted left-right displays
• CPC Class Codes: H04N 23/698 for achieving an enlarged field of view, e.g. panoramic image capture

Abstract

A multi dynamic environment and location based active augmented reality (AR) system is described. Scanning and mapping are performed from the perspective of a user wearing a head mounted display (HMD) in the physical environment. Systems and methods are described herein for projecting structured light onto a physical environment and capturing reflections of the structured light to map the environment.

Claims

1. A system for mapping a physical environment for augmented reality and virtual reality applications, the system comprising

a) a scanning module having a field of view, the scanning module comprising:

i) a projecting device for emitting a predetermined pattern of structured light into the physical environment, the structured light being emitted within the field of view, the structured light comprising a pattern which when projected onto a surface is reflected with distortions indicative of texture of the surface;

ii) a capturing device for capturing reflections of the structured light in the field of view;

b) a processor in communication with the scanning module, the processor configured to;

i) communicate, with the scanning module, the emitted pattern of structured light to be emitted;

ii) obtain the reflections from the capturing device;

iii) compare the reflections to the emitted pattern to determine distortions between the reflections and the emitted pattern; and

iv) generate a depth image for the physical environment within the field of view from the comparison.

2. The system of claim 1, wherein the processor is further configured to generate additional depth images as scanning module has its field of view moved through the physical environment.

3. The system of claim 2, wherein the additional depth images are obtained by rotating the scanning module at approximately a common coordinate in the physical environment.

4. The system of claim 2, wherein the processor is further configured to generate a depth map of the physical environment corresponding to the depth image and additional depth images.

5. The system of claim 1, wherein the processor is configured to calibrate the capturing device with the projecting device.

6. The system of claim 1, the system further comprising a camera system comprising at least one camera, wherein the processor is further configured to calibrate the camera system with the scanning module.

7. The system of claim 1, the system further comprising an inertial measurement unit in communication with the processor, wherein the processor is further configured to obtain an orientation of the scanning module from the inertial measuring unit.

8. The system of claim 1, wherein the predetermined pattern comprises a plurality of horizontal stripes.

9. The system of claim 1, wherein the predetermined pattern comprises a checkerboard pattern.

10. A method for mapping a physical environment for augmented reality and virtual reality applications, the method comprising

a) emitting, from a projecting device of a scanning module, a predetermined pattern of structured light into the physical environment, the structured light being emitted within a field of view, the structured light comprising a pattern which when projected onto a surface is reflected with distortions indicative of texture of the surface;

b) capturing, at a capturing device of the scanning module, reflections of the structured light;

c) obtaining the reflections from the capturing device;

d) comparing the reflections to the emitted pattern to determine distortions between the reflections and the emitted pattern; and

e) generating a depth image for the physical environment within the field of view from the comparison.

11. The method of claim 10, further comprising generating additional depth images as the scanning module has its field of view moved through the physical environment.

12. The method of claim 11, wherein the additional depth images are obtained by rotating the scanning module at approximately a common coordinate in the physical environment.

13. The method of claim 11, further comprising generating a depth map of the physical environment corresponding to the depth image and additional depth images.

14. The method of claim 10, further comprising calibrating the capturing device with the projecting device.

15. The method of claim 10, further comprising calibrating a camera system comprising at least one camera with the scanning module.

16. The method of claim 10, further comprising obtaining an orientation of the scanning module from an inertial measuring unit.

17. The method of claim 10, wherein the predetermined pattern comprises a plurality of horizontal stripes.

18. The method of claim 10, wherein the predetermined pattern comprises a checkerboard pattern.