METHOD AND DEVICE FOR MEASURING A DECENTRATION AND TILT OF FACES OF AN OPTICAL ELEMENT

• US 20150323416A1
• Filed: 05/08/2015
• Published: 11/12/2015
• Est. Priority Date: 05/08/2014
• Status: Active Grant

• Current Assignee: asphericon GmbH
• Original Assignee: asphericon GmbH
• Inventors: KIONTKE, Sven
• Granted Patent: US 9,551,571 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01B 11/2441 using interferometry
• CPC Class Codes: G01B 11/25 by projecting a pattern, e.g. one or more lines, moiré fringes on the object G01B11/255 takes precedence ; image analysis for depth or shape recovery G06T7/50
• CPC Class Codes: G01B 11/27 for testing the alignment of axes means for centering or aligning a light guide within a ferrule G02B6/3834
• CPC Class Codes: G01M 11/0221 by determining the optical axis or position of lenses
• CPC Class Codes: G01M 11/0271 by using interferometric methods

Abstract

A method and device for measuring a decentration and tilt of faces of an optical element is provided. At least all optically used and frame-relevant partial surfaces of a surface of the optical element and reference faces of the optical element are registered over the whole area thereof and referenced to one another in a common coordinate system, wherein in each case a surface form deviation of the partial surfaces and reference faces is established relative to an associated intended surface, wherein a location of the partial surfaces and reference faces is established in each case in the common coordinate system from the respective surface form deviation. At least one tilt and at least one decentration are established from the location as a function of a form of the respective partial surface and reference face in the coordinate system.

Claims

1. A method for measuring a decentration and a tilt of faces of an optical element, the method comprising:

registering at least all optically used and frame-relevant partial surfaces of a surface of the optical element and reference faces of the optical element over a whole area thereof and referenced to one another in a common coordinate system;

establishing, in each case, a surface form deviation of the partial surfaces and reference faces relative to an associated intended surface stored for the optical element;

establishing a location of the partial surfaces and the reference faces in the common coordinate system from the respective surface form deviation; and

determining at least one tilt and at least one decentration from the location as a function of a form of the respective partial surface and reference face in the coordinate system.

2. The method as claimed in claim 1, wherein at least one defined pattern is projected onto the partial surfaces and the reference faces of the optical element for registering same, wherein the partial surfaces reference faces and the at least one projected pattern are registered optically, and wherein the shaping of the partial surfaces and the reference faces is established based on a deviation of the at least one defined pattern from an intended pattern which results from a shaping of the partial surfaces and the reference faces.

3. The method as claimed in claim 2, wherein the registration of all partial surfaces and reference faces is carried out simultaneously.

4. The method as claimed in claim 1, wherein at least one distance measurement sensor is moved linearly along a movement axis over the partial surfaces and the reference faces so as to register the partial surfaces and the reference faces of the optical element and a distance is determined between the corresponding partial surface or reference face and the distance measurement sensor, wherein the optical element is substantially simultaneously rotated about an axis of rotation extending substantially perpendicular to the movement axis of the distance measurement sensor in such a way that a spiral whole-area scan of the corresponding partial surface and reference face is carried out.

5. The method as claimed in claim 4, wherein the at least one distance measurement sensor is aligned such that, at each measuring point, the optical axis of said sensor respectively extends substantially perpendicular to the reference face and partial surface to be measured.

6. A device for measuring a decentration and tilt of faces of an optical element, the device comprising:

at least one measurement unit for registering at least all optically used and frame-relevant partial surfaces of a surface of the optical element and reference faces of the optical element; and

at least one evaluation unit for referencing the partial surfaces and reference faces in a common coordinate system for comparing the registered partial surfaces and reference faces with a respectively associated intended surface and for establishing a surface form deviation of the partial surfaces and reference faces, in each case relative to the associated intended surface stored for the optical element,

wherein a location of the partial surfaces and reference faces in the common coordinate system is respectively establishable from the respective surface form deviation, and

wherein at least one tilt and at least one decentration are establishable from the location as a function of a form of the respective partial surface and reference face in the common coordinate system.

7. The device as claimed in claim 6, further comprising:

at least one projection unit projecting at least one defined pattern onto the partial surfaces and reference faces;

at least one optical registration unit registering the partial surfaces and reference faces and the at least one pattern; and

an evaluation unit establishing a shaping of the partial surfaces and reference faces from a deviation of the at least one defined pattern from an intended pattern resulting from the shaping of the partial surfaces and reference faces.

8. The device as claimed in claim 6, wherein provision is made for a receptacle unit for receiving the optical element, wherein two measurement units are provided and in each case comprise at least one projection unit projecting at least one defined pattern onto the partial surfaces and reference faces and at least two optical registration units registering the partial surfaces and reference faces and the at least one pattern, wherein an evaluation unit establishes a shaping of the partial surfaces and reference faces from a deviation of the at least one defined pattern from an intended pattern resulting from the shaping of the partial surfaces and reference faces, wherein one of the projection units is arranged above the receptacle unit and one of the projection units is arranged below the receptacle unit and at least one of the optical registration units is arranged above the receptacle unit and at least one of the optical registration units is arranged below the receptacle unit, wherein the optical registration units are arranged such that the partial surfaces and reference faces are optically registrable at the same time.

9. The device as claimed in claim 7, wherein the at least one optical registration unit is a stereo camera, and wherein the evaluation unit is configured for a stereoscopic evaluation of image data registered by the stereo camera.

10. The device as claimed in claim 6, wherein the measurement unit comprises at least one distance measurement sensor for registering the partial surfaces and reference faces of the optical element, and wherein the distance measurement sensor is linearly movable over the partial surfaces and reference faces along a movement axis and establishes a distance between the corresponding partial surface or reference face and the distance measurement sensor.

11. The device as claimed in claim 10, wherein the distance measurement sensor is a light wave-based interferometer.