ANALYSIS SYSTEM

• US 20150331038A1
• Filed: 09/24/2014
• Published: 11/19/2015
• Est. Priority Date: 09/30/2013
• Status: Abandoned Application

• Current Assignee: Radiation Monitoring Devices, Inc. (Dynasil Corp. of America)
• Original Assignee: Radiation Monitoring Devices, Inc. (Dynasil Corp. of America)
• Inventors: Weststrate, Evan, Rensing, Noa M., Tiernan, Timothy C.
• Application Number:
  US14/495,116
• Publication Number:
  US 20150331038A1
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01R 31/2834 Automated test systems [ATE]; using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736
• CPC Class Codes: G01R 31/312 by capacitive methods
• CPC Class Codes: G01R 31/315 by inductive methods

Abstract

An analysis system for analyzing circuits and other appropriate devices as well as its method of use are disclosed. In one embodiment, a system may include one or more electromagnetic field generators configured to generate an electromagnetic field proximate to a circuit. The system may also include one or more electromagnetic field sensors configured to scan the circuit by detecting an electromagnetic field induced in the circuit. An associated computing device may be configured to receive the scan of the circuit and compare the scan to a reference scan of the circuit to determine whether the circuit is different from the reference scan.

Claims

1. A system comprising:

one or more electromagnetic field generators configured to generate an electromagnetic field proximate to a circuit;

one or more electromagnetic field sensors configured to scan the circuit by detecting an electromagnetic field induced in the circuit;

a computing device configured to receive the scan of the circuit and compare the scan to a reference scan of the circuit to determine whether the circuit is different from the reference scan.

2. The system of claim 1, further comprising a display, wherein the computing device is configured to indicate the difference of the scan of the circuit from the reference scan on the display.

3. The system of claim 1, wherein the difference indicates a fault.

4. The system of claim 1, further comprising a database including the reference scan of the circuit, wherein the computing device retrieves the reference scan from the database.

5. The system of claim 1, further comprising a translation system configured to translate the one or more electromagnetic field sensors relative to the circuit to scan the circuit.

6. A system comprising:

an electromagnetic field generator configured to generate an electromagnetic field proximate to a circuit to induce an electromagnetic field in a conductive portion of the circuit;

an electromagnetic field sensor configured to scan the circuit by detecting the induced electromagnetic field;

an imaging device configured to image the circuit; and

a computing device configured to receive the image of the circuit from the imaging device, and wherein the computing device is configured to compare the image to a reference image to identify the circuit.

7. The system of claim 6, further comprising a display, wherein the computing device is configured to indicate the difference of the scan of the circuit from the reference scan on the display.

8. The system of claim 6, wherein the difference indicates a fault.

9. The system of claim 6, further comprising a database including the reference scan of the circuit, wherein the computing device retrieves the reference scan from the database.

10. The system of claim 6, further comprising a translation system configured to translate the one or more electromagnetic field sensors relative to the circuit to scan the circuit.

11. A method comprising:

generating an electromagnetic field proximate to a circuit to induce an electromagnetic field in a conductive portion of the circuit;

scanning the circuit by detecting the induced electromagnetic field;

comparing the scan to a reference scan of the circuit to determine whether the circuit is different from the reference scan.

12. The method of claim 11, further comprising displaying the difference of the scan of the circuit from the reference scan on a display.

13. The method of claim 11, wherein the difference indicates a fault.

14. The method of claim 11, further comprising retrieving the reference scan from a database prior to comparing the scan to the reference scan.

15. The method of claim 11, further comprising translating one or more electromagnetic field sensors relative to the circuit to scan the circuit.

16. A method comprising:

generating an electromagnetic field proximate to a circuit to induce an electromagnetic field in a conductive portion of the circuit;

scanning the circuit by detecting the induced electromagnetic field;

imaging the circuit; and

comparing the image to a reference image to identify the circuit.

17. The method of claim 16, further comprising treating a reference scan based on the identified circuit.

18. The method of claim 16, compare fault wherein the difference indicates a fault.

19. The method of claim 16, further comprising retrieving the reference image from a database prior to comparing the image to the reference image.

20. The method of claim 16, further comprising translating one or more electromagnetic field sensors relative to the circuit to scan the circuit.