INSTRUMENTS FOR MEASURING ION SIZE DISTRIBUTION AND CONCENTRATION

• US 20150340221A1
• Filed: 05/21/2015
• Published: 11/26/2015
• Est. Priority Date: 05/22/2014
• Status: Active Grant

• Current Assignee: Benner W. Henry
• Original Assignee: Benner W. Henry
• Inventors: Benner, W. Henry
• Granted Patent: US 9,666,423 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01N 27/622 Ion mobility spectrometry
• CPC Class Codes: H01J 49/0445 with means for introducing as a spray, a jet or an aerosol electrospray ion sources H01J49/165
• CPC Class Codes: H01J 49/10 Ion sources; Ion guns
• CPC Class Codes: H01J 49/167 Capillaries and nozzles specially adapted therefor; electrostatic spraying per se B05B5/00
• CPC Class Codes: H01J 49/22 Electrostatic deflection

Abstract

Instruments are disclosed for analyzing ions from about 1000 to 10,000,000 Daltons by controlling a gaseous medium through which the ions travel under the influence of an electric field so that properties of the ions, such as diameter, electrical mobility, and charge, are measured. One embodiment of the disclosed instruments include an ion source, a nozzle, a jet relaxation region, an ion accumulation region, an electronic gate, a flow chamber and an ion detector.

Claims