MULTI-JOINT ARM TYPE MEASUREMENT APPARATUS

• US 20150345933A1
• Filed: 05/26/2015
• Published: 12/03/2015
• Est. Priority Date: 05/30/2014
• Status: Active Grant

• Current Assignee: Mitutoyo Corporation
• Original Assignee: Mitutoyo Corporation
• Inventors: NEMOTO, Kentaro, NAGATAKI, Yuichi
• Granted Patent: US 9,689,663 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01B 11/007 feeler heads therefor
• CPC Class Codes: G01B 11/245 using a plurality of fixed, simultaneously operating transducers G01B11/2408 - G01B11/2425, G01B11/255 take precedence
• CPC Class Codes: G01B 21/047 Accessories, e.g. for positioning, for tool-setting, for measuring probes
• CPC Class Codes: G01B 5/012 Contact-making feeler heads therefor

Abstract

A multi-joint arm type measurement apparatus includes a plurality of probes mounted at a tip of a multi-joint mechanism, and a probe rotation holding mechanism configured to rotatably hold the other probe around one probe and to fix a rotating position of the other probe at a plurality of positions.

Claims

1. A multi-joint arm type measurement apparatus comprising:

a plurality of probes mounted at a tip of a multi-joint mechanism; and

a probe rotation holding mechanism configured to rotatably hold the other probe around one probe and to fix a rotating position of the other probe at a plurality of positions.

2. The multi joint arm type measurement apparatus according to claim 1, wherein the probe rotation holding mechanism comprises a ratchet mechanism configured to fix the rotating position of the other probe at the plurality of positions.

3. The multi-joint arm type measurement apparatus according to claim 1, wherein the probe rotation holding mechanism comprises a rotary encoder configured to detect a rotating angle of the other probe relative to the one probe.

4. The multi-joint arm type measurement apparatus according to claim 1, wherein the probes include a contact probe and a non-contact probe.

5. The multi-joint arm type measurement apparatus according to claim 4, wherein the probe rotation holding mechanism is configured to rotate the non-contact probe around the contact probe.

6. The multi joint arm type measurement apparatus according to claim 4, wherein the contact probe is a ball probe, and the non-contact probe is an optical probe.