EDGE TREATMENT SYSTEM AND METHOD FOR EVALUATING A MATERIAL

• US 20150355109A1
• Filed: 04/24/2015
• Published: 12/10/2015
• Est. Priority Date: 04/25/2014
• Status: Active Grant

• Current Assignee: Paneratech, Inc.
• Original Assignee: Paneratech, Inc.
• Inventors: Bayram, Yakup, Walton, Eric K., Ruege, Alexander C.
• Granted Patent: US 9,810,646 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01N 22/00 Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more G01N3/00 - G01N17/00, G01N24/00 take precedence

Abstract

Disclosed is an improved system and method to treat an edge of a material for determining a property of such material through measurements of electromagnetic waves. The system and method are operative to mitigate the adverse effects caused by the interaction between an electromagnetic wave and an edge of a sample of a material under test. The system and method define a configuration to block and significantly attenuate the propagation of electromagnetic waves that may reach an edge of the sample being evaluated. This configuration reduces the undesired effects caused by edge-diffraction that may interfere with the measurement of desired electromagnetic waves for material evaluation. As a result, a property of a material under test can be measured more accurately, especially near the edges of such material. In addition, the system and method enable the evaluation of a small-size sample of a material.

Claims

1. A system for treating an edge of a material under test to reduce a propagation of a first electromagnetic wave impinging upon said edge of said material under test, comprising:

a first substrate having a first edge disposed in between said edge of said material under test and a propagation path of said first electromagnetic wave, wherein said first edge of said first substrate partly overlaps said material under test, such that a first area of said first substrate overlaps a first area of said material under test and a second area of said first substrate extends outwards from said first area of said first substrate overlapping said first area of said material under test and beyond a projected line of said edge of said material under test onto said first substrate, and wherein said first substrate is physically structured to reduce said propagation of said first electromagnetic wave by a sufficient extent so as to enable detection of a second electromagnetic wave of interest that may propagate through said material under test by mitigating an interference to said detection of said second electromagnetic wave caused by an interaction of said first electromagnetic wave and said edge of said material under test.

2. The system of claim 1, wherein said first substrate comprises a substantially conductive material to reduce said propagation of said first electromagnetic wave through said first substrate.

3. The system of claim 1, wherein said first substrate comprises a material configured to substantially absorb electromagnetic energy to reduce said propagation of said first electromagnetic wave through and along said first substrate.

4. The system of claim 1, wherein said first substrate is disposed contiguous and in physical contact with said material under test.

5. The system of claim 1, wherein said first substrate comprises a planar section and wherein said planar section is disposed substantially parallel to and partly overlaps said material under test.

6. The system of claim 1, wherein said material under test comprises at least one layer having a thickness of between 2 mils and 1 inch.

7. The system of claim 1, wherein said first substrate is disposed such that a distance from said material under test to said first substrate, over said first area of said first substrate overlapping said area of said material under test, is no larger than three quarters of a wavelength corresponding to a largest frequency of said first electromagnetic wave.

8. The system of claim 1, wherein said first substrate is disposed such that a distance from said edge of said material under test to a projected line of said first edge of said first substrate onto said material under test is between a range of one twentieth of a wavelength and three quarters of a wavelength corresponding to a largest frequency of said first electromagnetic wave.

9. The system of claim 1, wherein said property of said material under test is selected from the group consisting of transmissivity, reflectivity, absorptivity, and derivatives thereof of said material under test.

10. The system of claim 1, further comprising a material characterization system, including a transmit antenna that transmits said first and second electromagnetic waves and a receive antenna intended to only receive said second electromagnetic wave that may propagate through said material under test, such that said material under test and said first substrate are disposed in between said transmit antenna and said receive antenna.

11. The system of claim 1, further comprising a second substrate having a first edge disposed in between said edge of said material under test and a propagation path of said first electromagnetic wave, wherein said first edge of said second substrate partly overlaps said material under test, such that a first area of said second substrate overlaps a third area of said material under test and a second area of said second substrate extends outwards from said first area of said second substrate overlapping said third area of said material under test and beyond a projected line of said edge of said material under test onto said second substrate, wherein said second substrate is physically structured to reduce a propagation of an electromagnetic wave that may propagate along and through said second substrate, and wherein said second substrate is disposed opposite said first ii substrate such that said material under test lies between said first substrate and said second substrate.

12. The system of claim 11, wherein said first substrate and said second substrate are physically integrated into a single unit.

13. The system of claim 11, further comprising a mechanical element to physically attach said first substrate and said second substrate.

14. The system of claim 11, further comprising a mechanical element engaging said first substrate and said second substrate such that the distance between said first substrate and said second substrate is adjustable between a range of 2 mils and 4 inches.

15. The system of claim 1, wherein said first edge of said first substrate has a serrated configuration.

16. A method for treating an edge of a material under test to reduce a propagation of a first electromagnetic wave impinging upon an edge of said material under test, comprising:

a. providing at least a first substrate having a first edge disposed in between said edge of said material under test and a propagation path of said first electromagnetic wave, wherein said first edge of said first substrate partly overlaps said material under test, such that a first area of said first substrate overlaps a first area of said material under test and a second area of said first substrate extends outwards of said first area of said first substrate overlapping said first area of said material under test and beyond a projected line of said edge of said material under test onto said first substrate, and wherein said first substrate is physically structured to reduce said propagation of said first electromagnetic wave by a sufficient extent so as to enable detection of a second electromagnetic wave of interest that may propagate through said material under test by mitigating an interference to said detection of said second electromagnetic wave caused by an interaction of said first electromagnetic wave and said edge of said material under test;

b. setting up a sample of said material under test by positioning said sample on a mounting structure located in between a transmit antenna that transmits said second electromagnetic wave and a receive antenna intended to only receive said second electromagnetic wave that may propagate through said material under test;

c. determining a scanning area of said sample of said material under test;

d. identifying a “

compromised”

area of said scanning area of said sample of said material under test to be measured, wherein said “

compromised”

area is a region within a wavelength, corresponding to a largest frequency of said first electromagnetic wave, of said edge of said material under test;

e. selecting a system configuration of said first substrate for said “

compromised”

area; and

f. setting up said system configuration of said first substrate on said “

compromised”

area.

17. The method of claim 16, further comprising:

g. measuring and recording an amplitude, a phase, and a frequency of said second electromagnetic wave that may propagate through said sample of said material under test and an amplitude, a phase, and a frequency of a third electromagnetic wave reflected from said sample of said material under test;

h. replacing said sample of said material under test with a first reference material, wherein no other alteration of a measurement setup is performed;

i. measuring and recording an amplitude, a phase, and a frequency of a fourth electromagnetic wave that may propagate through said first reference material;

j. replacing said first reference material with a second reference material, wherein no other alteration of said measurement setup is performed;

k. measuring and recording an amplitude, a phase, and a frequency of a fifth electromagnetic wave reflected from said second reference material;

l. calibrating at a same frequency said measured amplitude and said measured phase of said second electromagnetic wave that may propagate through said sample of said material under test with said measured amplitude and said measured phase of said fourth electromagnetic wave that may propagate through said first reference material; and

m. calibrating at a same frequency said measured amplitude and said measured phase of said third electromagnetic wave reflected from said sample of said material under test with said measured amplitude and said measured phase of said fifth electromagnetic wave reflected from said second reference material.

18. The method of claim 16, further comprising the step of extracting a desired parameter corresponding to at least one property of said sample of said material under test, by processing a set of measured data.

19. The method of claim 16, wherein said scanning area of said sample of said material under test is determined according to a range of motion of said sample during a measurement, a spot size of said transmit antenna on said sample, and a spot size of said receive antenna on said sample, in a frequency range of said measurement.

20. The method of claim 16 wherein said system configuration of said first substrate is selected according to a separation between said sample of said material under test and said first substrate and an overlapping between said sample of said material under test and said first substrate.

21. The method of claim 16, wherein said first edge of said first substrate has a serrated configuration.