SYSTEM ANALYSIS DEVICE AND SYSTEM ANALYSIS METHOD

• US 20150363250A1
• Filed: 02/05/2014
• Published: 12/17/2015
• Est. Priority Date: 02/18/2013
• Status: Abandoned Application

• Current Assignee: NEC Corporation
• Original Assignee: NEC Corporation
• Inventors: YABUKI, Kentarou
• Application Number:
  US14/764,272
• Publication Number:
  US 20150363250A1
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G05B 23/0254 based on a quantitative model, e.g. mathematical relationships between inputs and outputs; functions: observer, Kalman filter, residual calculation, Neural Networks
• CPC Class Codes: G06F 11/0721 within a central processing unit [CPU]
• CPC Class Codes: G06F 11/079 Root cause analysis, i.e. error or fault diagnosis in a hardware test environment G06F11/22; in a software test environment G06F11/36
• CPC Class Codes: G06F 11/3409 for performance assessment
• CPC Class Codes: G06F 11/3452 Performance evaluation by statistical analysis

Abstract

In state detection of a system using a correlation destruction pattern, the versatility of the correlation destruction pattern is improved. A system analysis device (100) includes a correlation destruction pattern storage unit (113), an aggregated destruction pattern generation unit (104), and a similarity calculation unit (105). The correlation destruction pattern storage unit (113) stores a plurality of correlation destruction patterns (123) each of which is a set of correlations in which correlation destruction has been detected among correlations of pairs of metrics in a system. The aggregated destruction pattern generation unit (104) generates an aggregated destruction pattern (124) which is obtained by aggregating correlation destruction patterns (123) of the same type among the plurality of correlation destruction patterns (123). The similarity calculation unit (105) calculates and outputs a similarity between the aggregated destruction pattern (124) and a newly-detected correlation destruction pattern (123).

Claims

1. A system analysis device comprising:

a correlation destruction pattern storage unit which stores a plurality of correlation destruction patterns each of which is a set of correlations in which correlation destruction has been detected among correlations of pairs of metrics in a system;

an aggregated destruction pattern generation unit which generates an aggregated destruction pattern which is obtained by aggregating correlation destruction patterns of the same type among the plurality of correlation destruction patterns; and

a similarity calculation unit which calculates and outputs a similarity between the aggregated destruction pattern and a newly-detected correlation destruction pattern.

2. The system analysis device according to claim 1, wherein

the aggregated destruction pattern generation unit extracts correlation destruction patterns including a predetermined number or more, or a predetermined ratio or more of correlations of the same type, as the correlation destruction patterns of the same type, and generates a set of aggregated correlations, which is obtained by aggregating correlations of the same type among the extracted correlation destruction patterns, as the aggregated destruction pattern, and

the similarity calculation unit calculates a number or a ratio of aggregated correlations among the aggregated correlations included in the aggregated destruction pattern, which are the same type as correlations included in the newly-detected correlation destruction pattern, as the similarity.

3. The system analysis device according to claim 2, wherein

the aggregated destruction pattern generation unit determines that correlations having the same pairs of metric types are correlations of the same type, and uses the pairs of metric types according to the correlations of the same type as the aggregated correlations, and

when the pairs of metric types of the aggregated correlations and pairs of metric types according to the correlations included in the newly-detected correlation destruction pattern are the same, the similarity calculation unit determines that the aggregated correlations and the correlations included in the newly-detected correlation destruction pattern are the same type.

4. The system analysis device according to claim 3, wherein

the aggregated destruction pattern generation unit determines that correlations having the same pairs of metric types and a difference of correlation coefficients within a predetermined range are the correlations of the same type.

5. A system analysis method comprising:

storing a plurality of correlation destruction patterns each of which is a set of correlations in which correlation destruction has been detected among correlations of pairs of metrics in a system;

generating an aggregated destruction pattern which is obtained by aggregating correlation destruction patterns of the same type among the plurality of correlation destruction patterns; and

calculating and outputting a similarity between the aggregated destruction pattern and a newly-detected correlation destruction pattern.

6. The system analysis method according to claim 5, wherein,

when generating the aggregated destruction pattern, extracting correlation destruction patterns including a predetermined number or more, or a predetermined ratio or more of correlations of the same type, as the correlation destruction patterns of the same type, and generating a set of aggregated correlations, which is obtained by aggregating correlations of the same type among the extracted correlation destruction patterns, as the aggregated destruction pattern, and

when calculating the similarity, calculating a number or a ratio of aggregated correlations among the aggregated correlations included in the aggregated destruction pattern, which are the same type as correlations included in the newly-detected correlation destruction pattern, as the similarity.

7. The system analysis method according to claim 6, wherein,

when generating the aggregated destruction pattern, determining that correlations having the same pairs of metric types are correlations of the same type, and using the pairs of metric types according to the correlations of the same type as the aggregated correlations, and

when calculating the similarity, in a case that the pairs of metric types of the aggregated correlations and pairs of metric types according to the correlations included in the newly-detected correlation destruction pattern are the same, determining that the aggregated correlations and the correlations included in the newly-detected correlation destruction pattern are the same type.

8. The system analysis method according to claim 7, wherein,

when generating the aggregated destruction pattern, determining that correlations having the same pairs of metric types and a difference of correlation coefficients within a predetermined range are the correlations of the same type.

9. A non-transitory computer readable storage medium recording thereon a program, causing a computer to perform a method comprising:

storing a plurality of correlation destruction patterns each of which is a set of correlations in which correlation destruction has been detected among correlations of pairs of metrics in a system;

generating an aggregated destruction pattern which is obtained by aggregating correlation destruction patterns of the same type among the plurality of correlation destruction patterns; and

calculating and outputting a similarity between the aggregated destruction pattern and a newly-detected correlation destruction pattern.

10. The non-transitory computer readable storage medium recording thereon the program according to claim 9, causing a computer to perform the method, wherein,

when generating the aggregated destruction pattern, extracting correlation destruction patterns including a predetermined number or more, or a predetermined ratio or more of correlations of the same type, as the correlation destruction patterns of the same type, and generating a set of aggregated correlations, which is obtained by aggregating correlations of the same type among the extracted correlation destruction patterns, as the aggregated destruction pattern, and

when calculating the similarity, calculating a number or a ratio of aggregated correlations among the aggregated correlations included in the aggregated destruction pattern, which are the same type as correlations included in the newly-detected correlation destruction pattern, as the similarity.

11. The non-transitory computer readable storage medium recording thereon the program according to claim 10, causing a computer to perform the method, wherein,

when generating the aggregated destruction pattern, determining that correlations having the same pairs of metric types are correlations of the same type, and using the pairs of metric types according to the correlations of the same type as the aggregated correlations, and

when calculating the similarity, in a case that the pairs of metric types of the aggregated correlations and pairs of metric types according to the correlations included in the newly-detected correlation destruction pattern are the same, determining that the aggregated correlations and the correlations included in the newly-detected correlation destruction pattern are the same type.

12. The non-transitory computer readable storage medium recording thereon the program according to claim 11, causing a computer to perform the method, wherein,

when generating the aggregated destruction pattern, determining that correlations having the same pairs of metric types and a difference of correlation coefficients within a predetermined range are the correlations of the same type.

13. A system analysis device comprising:

a correlation destruction pattern storage means for storing a plurality of correlation destruction patterns each of which is a set of correlations in which correlation destruction has been detected among correlations of pairs of metrics in a system;

an aggregated destruction pattern generation means for generating an aggregated destruction pattern which is obtained by aggregating correlation destruction patterns of the same type among the plurality of correlation destruction patterns; and

a similarity calculation means for calculating and outputting a similarity between the aggregated destruction pattern and a newly-detected correlation destruction pattern.