IMAGING SPECTROMETER WITH EXTENDED RESOLUTION

• US 20150369667A1
• Filed: 06/24/2014
• Published: 12/24/2015
• Est. Priority Date: 06/24/2014
• Status: Active Grant

• Current Assignee: Raytheon Company (Rtx Corporation)
• Original Assignee: Raytheon Company (Rtx Corporation)
• Inventors: Robinson, Ian S., Bloomer, John D., Flanders, Bradley
• Granted Patent: US 9,279,724 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01J 2003/4538 Special processing
• CPC Class Codes: G01J 3/0202 Mechanical elements; Supports for optical elements
• CPC Class Codes: G01J 3/06 Scanning arrangements arrangements for order-selection
• CPC Class Codes: G01J 3/45 Interferometric spectrometry
• CPC Class Codes: G01J 3/4535 Devices with moving mirror G01J3/4532 takes precedence

Abstract

Interferometric transform spectrometer (ITS) systems and methods of operation thereof. In one example, an ITS system includes a Michelson interferometer that introduces a varying optical path length difference (OPD) between its two arms so as to produce an interferogram, a detector that receives and samples the interferogram, and a scan controller coupled to the detector and to Michelson interferometer. The scan controller controls the Michelson interferometer to vary the OPD in discrete steps such that the detector provides M samples of the interferogram for each of two scan segments. In the first scan segment, the M samples have a uniform or non-uniform sample spacing and the OPD has a first maximum value. In the second scan segment, the M samples have an incrementally increasing sample spacing and the OPD has a second maximum value that is at least twice the first maximum value.

Claims

1. An interferometric transform spectrometer system comprising:

a Michelson interferometer configured to introduce a varying optical path length difference (OPD) between two arms of the Michelson interferometer so as to produce an interferogram;

a detector positioned at a focal plane of the Michelson interferometer and configured to receive and sample the interferogram; and

a scan controller coupled to the detector and to Michelson interferometer and configured to control the Michelson interferometer to vary the OPD in discrete steps such that the detector provides, for each of a first and second scan segment, M samples of the interferogram, wherein for the first scan segment, the M samples have a uniform or non-uniform sample spacing and the OPD has a first maximum value, and for the second scan segment, the M samples have an incrementally increasing sample spacing and the OPD has a second maximum value that is at least twice the first maximum value.

2. The interferometric transform spectrometer system of claim 1, further comprising a Lomb estimator coupled to the scan controller and to the detector, the Lomb estimator configured to receive and process, for each of the first and second scan segments, the M samples from the detector.

3. The interferometric transform spectrometer system of claim 2, wherein the Lomb estimator is configured to estimate a signal amplitude for each of a plurality of cosinusoids that are fit to the M samples from the first scan segment, and to provide a control signal to the scan controller to direct the scan controller to begin the second scan segment responsive to the signal amplitude of at least one cosinusoid being above a threshold value.

4. The interferometric transform spectrometer of claim 3, wherein the scan controller is configured to receive information containing the threshold value from a user of the system, and to provide a signal specifying the threshold value to the Lomb estimator.

5. The interferometric transform spectrometer system of claim 3, wherein the control signal provided from the Lomb estimator to the scan controller further specifies a frequency range to be reconstructed from the M samples collected during the second scan segment, the frequency range including a frequency associated with at least one reconstructed signal derived from the first scan segment.

6. The interferometric transform spectrometer system of claim 1, wherein the Michelson interferometer includes:

a fixed mirror positioned in a first arm of the two arms;

a movable mirror in a second arm of the two arms;

a beamsplitter configured to split and direct incident radiation into the two arms, and to recombine reflected radiation from the two arms and provide reflected radiation to the detector; and

an actuator coupled to the movable mirror and to the scan controller, and configured to move the movable mirror along an axis of the second arm so as to produce the varying OPD responsive to an actuation signal from the scan controller.

7. A method of spectral imaging using an interferometric transform spectrometer (ITS) comprising:

controlling the ITS to collect M first samples of an interferogram produced by the ITS over a first frequency range and first optical path difference of the ITS, M being a positive integer;

processing at least some of the M first samples to produce corresponding first spectra;

analyzing the first spectra to determine a presence or absence of a signal of interest;

responsive to detecting the signal of interest, controlling the ITS to collect M second samples of the interferogram over a second optical path difference of the ITS, the M second samples having an incrementally increasing sample spacing; and

processing the M second samples to produce corresponding second spectra.

8. The method of claim 7, wherein the M first samples have a uniform sample spacing.

9. The method of claim 8, wherein the ITS includes a Michelson interferometer, and wherein controlling the ITS to collect the M first samples includes controlling the Michelson interferometer to vary the optical path difference between two arms of the Michelson interferometer in uniform steps.

10. The method of claim 9, wherein processing at least some of the M first samples includes applying DFT/FFT processing to the M first samples to produce the first spectra.

11. The method of claim 8, wherein controlling the ITS to collect the M first samples includes varying the optical path difference between the two arms of the Michelson interferometer over a first range from a minimum optical path difference value to a first maximum optical path difference value;

and

wherein controlling the ITS to collect the M second samples includes controlling the Michelson interferometer to vary the optical path difference between the two arms of the Michelson in incrementally increasing steps over a second range from the minimum optical path difference value to a second maximum optical path difference value, the second maximum optical path difference value being at least twice the first maximum optical path difference value.

12. The method of claim 11, wherein the second maximum optical path difference value is approximately four times the first maximum optical path difference value.

13. The method of claim 7, wherein the first M samples have a non-uniform sample spacing.

14. The method of claim 13, wherein the ITS includes a Michelson interferometer having a movable mirror configured to provide a varying optical path difference between two arms of the Michelson interferometer;

wherein controlling the ITS to collect the M first samples includes moving the movable mirror along an axis of a respective arm of the Michelson interferometer; and

wherein processing at least some of the M first samples includes determining a position of the movable mirror, and performing a series of cosine estimations on the at least some of the M first samples, using knowledge of the position of the movable mirror, to estimate a signal amplitude fit to at least some of the M samples.

15. The method of claim 14, wherein controlling the ITS to collect the M first samples includes varying the optical path difference between the two arms of the Michelson interferometer over a first range from a minimum optical path difference value to a first maximum optical path difference value;

and

wherein controlling the ITS to collect the M second samples includes controlling the Michelson interferometer to vary the optical path difference between the two arms of the Michelson in incrementally increasing steps over a second range from the minimum optical path difference value to a second maximum optical path difference value, the second maximum optical path difference value being at least twice the first maximum optical path difference value.

16. The method of claim 15, wherein the second maximum optical path difference value is approximately four times the first maximum optical path difference value.

17. The method of claim 7, wherein processing at least some of the M first samples includes using a Lomb estimator to estimate initial signal amplitudes of each of a plurality of cosinusoids that are fit to the M first samples, and wherein analyzing the first spectra includes determining whether the signal amplitude of at least one of the cosinusoids exceeds a threshold value.