APPARATUS AND METHOD FOR A USER CONFIGURABLE RELIABILITY CONTROL LOOP
First Claim
1. A processor comprising:
- a reliability meter to track accumulated stress on components of the processor based on measured processor operating conditions;
a controller to receive stress rate limit information from a user or manufacturer and to responsively specify a set of N operating limits on the processor in accordance with the accumulated stress and the stress rate limit information; and
performance selection logic to output one or more actual operating conditions for the processor based on the N operating limits specified by the controller.
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Accused Products
Abstract
An apparatus and method for a user configurable reliability control loop. For example, one embodiment of a processor comprises: a reliability meter to track accumulated stress on components of the processor based on measured processor operating conditions; and a controller to receive stress rate limit information from a user or manufacturer and to responsively specify a set of N operating limits on the processor in accordance with the accumulated stress and the stress rate limit information; and performance selection logic to output one or more actual operating conditions for the processor based on the N operating limits specified by the controller.
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Citations
22 Claims
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1. A processor comprising:
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a reliability meter to track accumulated stress on components of the processor based on measured processor operating conditions; a controller to receive stress rate limit information from a user or manufacturer and to responsively specify a set of N operating limits on the processor in accordance with the accumulated stress and the stress rate limit information; and performance selection logic to output one or more actual operating conditions for the processor based on the N operating limits specified by the controller. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method comprising:
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tracking accumulated stress on components of a processor based on measured processor operating conditions; receiving stress rate limit information from a user or manufacturer and responsively specifying a set of N operating limits on the processor in accordance with the accumulated stress and the stress rate limit information; and outputting one or more actual operating conditions for the processor based on the N operating limits specified by the controller. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. A system comprising:
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a memory to store instructions and data; a cache having a plurality of cache levels to cache the instructions and data; a reliability meter to track accumulated stress on components of the processor based on measured processor operating conditions; and a controller to receive stress rate limit information from a user or manufacturer and to responsively specify a set of N operating limits on the processor in accordance with the accumulated stress and the stress rate limit information; and performance selection logic to output one or more actual operating conditions for the processor based on the N operating limits specified by the controller.
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Specification