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Energy Analysis Method for Hidden Damage Detection

  • US 20160011151A1
  • Filed: 05/12/2015
  • Published: 01/14/2016
  • Est. Priority Date: 07/09/2014
  • Status: Active Grant
First Claim
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1. A method of detecting hidden internal defects in a component comprising a multilayer material from a single side of a surface of the component, the method comprising:

  • connecting at least one transducer to a component comprising a multilayer material having a surface;

    actuating the transducer to generate a wavefield on the surface of the multilayer material such that energy is trapped near the surface due to a first defect below the surface;

    collecting wavefield data from the wavefield on the surface of the multilayer material;

    processing the wavefield data to provide measured energy data;

    comparing the measured energy data to the known energy data for a multilayer material having known hidden internal defects to determine if the multilayer material has hidden internal defects that are further from the surface than the first defect and overlap the first defect and/or to quantify such hidden internal defects.

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