Tool and Method for Refining A Circuit Including Parametric Analog Elements

• US 20160012171A1
• Filed: 09/25/2015
• Published: 01/14/2016
• Est. Priority Date: 08/31/2009
• Status: Active Grant

• Current Assignee: Cypress Semiconductor Corporation (Infineon Technologies AG)
• Original Assignee: Cypress Semiconductor Corporation (Infineon Technologies AG)
• Inventors: Visconti, Antonio, LeHoty, David
• Granted Patent: US 9,858,376 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01R 31/2884 using dedicated test connectors, test elements or test circuits on the IC under test G01R31/2855 takes precedence
• CPC Class Codes: G06F 30/20 Design optimisation, verification or simulation optimisation, verification or simulation of circuit designs G06F30/30
• CPC Class Codes: G06F 30/30 Circuit design
• CPC Class Codes: G06F 30/327 Logic synthesis; Behaviour synthesis, e.g. mapping logic, HDL to netlist, high-level language to RTL or netlist
• CPC Class Codes: G06F 30/33 Design verification, e.g. functional simulation or model checking
• CPC Class Codes: G06F 30/3308 using simulation
• CPC Class Codes: G06F 30/36 Circuit design at the analogue level
• CPC Class Codes: G06F 30/367 Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods
• CPC Class Codes: G06F 30/38 Circuit design at the mixed level of analogue and digital signals
• CPC Class Codes: G06F 30/392 Floor-planning or layout, e.g. partitioning or placement
• CPC Class Codes: G06F 30/398 Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM] optical proximity correction [OPC] design processes G03F1/36

Abstract

A method is provided for designing and implementing a circuit comprising an integrated circuit (IC) including a number of analog and digital circuit elements for which operating parameters can be set. In one embodiment the method includes entering in a circuit design tool embodied in a computer readable medium on a server specified requirements for a circuit, the specified requirements including physical properties to be sensed by the circuit. The circuit is automatically modeled by the circuit design tool based on the specified requirements and resources available on the IC, the modeling including translating the specified requirements into parameter settings of the number of the analog and digital circuit elements. The circuit is then built, the building including setting parameters of at least one of the analog and digital circuit elements of the IC using the circuit design tool based on the modeling of the circuit.

Claims

1-20. -20. (canceled)

21. A method comprising:

receiving in a circuit design tool embodied in a computer readable medium on a server specified requirements for a circuit, the specified requirements including physical properties to be sensed by the circuit;

automatically modeling the circuit using the circuit design tool based on the specified requirements and resources available on an integrated circuit (IC) including a number of analog and digital circuit elements for which operating parameters can be set, wherein automatically modeling the circuit includes translating the specified requirements into parameter settings of the number of the analog and digital circuit elements; and

building the circuit, wherein building the circuit includes setting parameters of at least one of the analog and digital circuit elements of the IC using the circuit design tool based on the modeling of the circuit.

22. The method according to claim 21, wherein automatically modeling the circuit comprises selecting one IC from a plurality of parametric ICs based on the specified requirements and resources available on each of the plurality of parametric ICs.

23. The method according to claim 21, wherein automatically modeling the circuit comprises designing a number of sensor sub-circuits to measure the physical properties to be sensed by the circuit, and wherein building the circuit comprises electrically coupling sensors of the number of sensor sub-circuits to the IC.

24. The method of claim 21 wherein resources of the parameterizable IC further include a scheduler, and a number of parametric sensing signal chains each sharing a number of the analog and digital circuit elements, and building the circuit comprises downloading data to operate the scheduler to allocate the analog and digital circuit elements to the parametric sensing signal chains based on the specified requirements.

25. The method of claim 24 wherein resources of the parameterizable IC further comprise an analog-to-digital converter (ADC) that is utilized in a plurality of different parametric sensing signal chains, and wherein building the circuit comprises downloading data to enable the scheduler to operate autonomously to change a time or order in which the ADC is allocated to two of the plurality parametric sensing signal chains based on the specified requirements and a result of a measurement of one of the physical properties sensed by the circuit.

26. The method according to claim 21, wherein receiving the specified requirements for the circuit comprises entering the specified requirements through a client computer coupled to the server through an internet protocol (IP) network.

27. The method according to claim 26, wherein setting parameters of at least one of the analog and digital circuit elements of the IC comprises setting parameters through an IC interface board electrically coupled to the client computer.

28. The method according to claim 26, further comprising a user interacting via the IP network with an analog design expert having access to the specified requirements entered by the user.

29. A method comprising:

receiving in a circuit design tool embodied in a computer readable medium on a server specified requirements for a circuit through a client computer coupled to the server, the specified requirements including physical properties to be measured by the circuit;

automatically modeling the circuit using the circuit design tool based on the specified requirements of the circuit and resources available on an integrated circuit (IC);

simulating operation of the modeled circuit using simulated inputs; and

building the circuit based on the modeled circuit and including the IC,

wherein resources available on the IC include analog and digital circuit elements for which operating parameters can be set, and wherein building the circuit comprises coupling the parameterizable IC to the circuit design tool and setting parameters of at least one of the analog and digital circuit elements.

30. The method of claim 29 wherein resources of the parameterizable IC further include a scheduler, and a number of parametric sensing signal chains each sharing a number of the analog and digital circuit elements, and building the circuit comprises downloading data to operate the scheduler to allocate the analog and digital circuit elements to the parametric sensing signal chains based on the specified requirements.

31. The method of claim 30 wherein resources of the parameterizable IC further comprise an analog-to-digital converter (ADC) that is utilized in a plurality of different parametric sensing signal chains, and wherein building the circuit comprises downloading data to enable the scheduler to operate autonomously to change a time or order in which the ADC is allocated to two of the plurality parametric sensing signal chains based on the specified requirements and a result of a measurement of a physical property.

32. The method of claim 29 further comprising calibrating the circuit by entering measurement data to the circuit design tool through the client computer.

33. A method comprising:

executing a circuit design tool embodied in a computer readable medium on a server;

receiving in the circuit design tool through a client computer coupled to the server specified requirements for a circuit from a user, the specified requirements including at least a first measurement type to be made of a physical property by the circuit;

displaying to the user one or more external sensors for sensing the physical property and receiving from the user a selected sensor;

automatically modeling the circuit using the circuit design tool, the circuit including the selected sensor and an integrated circuit (IC) including a number of analog and digital circuit elements for which operating parameters can be set by the circuit design tool;

simulating operation of the circuit as modeled using the circuit design tool to determine whether the circuit as modeled satisfies the specified requirements;

coupling the IC to the client computer, and downloading parametric data to set operating parameters of the analog and digital circuit elements; and

testing the circuit using simulated sensor signals provided by the circuit design tool through the client computer to determine whether the circuit satisfies the specified requirements.

34. The method of claim 33 wherein the parameterizable IC further includes a scheduler, and a number of parametric sensing signal chains each sharing a number of the analog and digital circuit elements, and wherein downloading parametric data includes downloading data to operate the scheduler to allocate the analog and digital circuit elements to the parametric sensing signal chains based on the specified requirements.

35. The method of claim 34 wherein operating the scheduler comprises operating the scheduler autonomously to change a time or order for which the analog and digital circuit elements are allocated to each of the parametric sensing signal chains based on a result of a measurement of the physical property.

36. The method of claim 34 wherein the IC further comprises a memory to store alternate parameter settings, and wherein downloading parametric data comprises storing in the memory alternate operating parameters of at least one of the analog and digital circuit elements.

37. The method of claim 36 further comprising changing operating parameters of at least one of the analog and digital circuit elements to the alternate parameter settings based on a result of a measurement of the physical property.

38. The method of claim 34 wherein the IC further comprises an analog-to-digital converter (ADC) that is utilized in a plurality of different parametric sensing signal chains, and wherein the scheduler operates autonomously to change a time or order in which the ADC is allocated to two of the plurality parametric sensing signal chains based on the specified requirements and a result of a measurement of the physical property.

39. The method of claim 33 wherein the IC further comprises an input pin coupled to at least one of the parametric sensing signal chains, and further comprising implementing the circuit by coupling the selected sensor to the input pin.

40. The method of claim 39 further comprising calibrating the implemented circuit, wherein calibrating comprises performing measurements of the circuit, followed by entering measurement data to the circuit design tool through the client computer.