SENSING STRUCTURE

• US 20160018348A1
• Filed: 07/17/2015
• Published: 01/21/2016
• Est. Priority Date: 07/17/2014
• Status: Active Grant

• Current Assignee: Industrial Technology Research Institute
• Original Assignee: Industrial Technology Research Institute
• Inventors: Yau, Bao-Shun, Chung, Sheng-Feng, Lu, Su-Tsai, Shih, Cheng-Yi, Tseng, Kuo-Hua, Hsieh, Yu-Ling, Chang, Shu-Yi, Lin, Heng-Tien
• Granted Patent: US 9,811,222 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G06F 2203/04112 Electrode mesh in capacitive digitiser: electrode for touch sensing is formed of a mesh of very fine, normally metallic, interconnected lines that are almost invisible to see. This provides a quite large but transparent electrode surface, without need for ITO or similar transparent conductive material
• CPC Class Codes: G06F 2203/04113 Peripheral electrode pattern in resistive digitisers, i.e. electrodes at the periphery of the resistive sheet are shaped in patterns enhancing linearity of induced field
• CPC Class Codes: G06F 3/0443 using a single layer of sensing electrodes
• CPC Class Codes: G06F 3/0446 using a grid-like structure of electrodes in at least two directions, e.g. using row and column electrodes

Abstract

Disclosed is a sensing structure including a sensing unit, a periphery circuit, and a connecting circuit. The connecting circuit connecting the sensing unit and the periphery circuit includes a connecting pattern. In an embodiment, the connecting pattern has at least two line widths. The line width of a part of the connecting pattern connecting the periphery circuit is greater than the line width of a part of the connecting pattern connecting the sensing unit. In an embodiment, the connecting pattern includes a mesh pattern having at least two mesh densities. The mesh density of a part of the mesh pattern connecting the periphery circuit is greater than the mesh density of a part of the mesh pattern connecting the sensing unit. In an embodiment, the connecting circuit includes lines between and connecting a single sensing series of the sensing unit and a periphery wire of the periphery circuit.

Claims

1. A sensing structure, comprising:

a sensing unit;

a periphery circuit; and

a connecting circuit, comprising a connecting pattern and configured to connect the sensing unit and the periphery circuit, wherein the connecting pattern has at least two line widths, and the line width of a part of the connecting pattern that connects the periphery circuit is greater than the line width of a part of the connecting pattern that connects the sensing unit.

2. The sensing structure as claimed in claim 1, wherein the sensing unit comprises a sensing series, the sensing series extends in a direction and comprises a plurality of mesh electrodes, and a minimum line width of the connecting pattern is greater than or equal to a line width of each of the mesh electrodes.

3. The sensing structure as claimed in claim 2, wherein the sensing unit further comprises a plurality of dummy electrodes, and the dummy electrodes are configured between the mesh electrodes and disposed in an electrically floating state.

4. The sensing structure as claimed in claim 3, wherein each of the dummy electrodes has a mesh structure.

5. The sensing structure as claimed in claim 1, wherein the sensing unit, the connecting circuit, and the periphery circuit are integrally formed.

6. The sensing structure as claimed in claim 1, wherein the periphery circuit comprises a periphery wire, and a maximum line width of the connecting pattern is smaller than or equal to a line width of the periphery wire.

7. The sensing structure as claimed in claim 1, wherein the connecting pattern comprises a mesh pattern.

8. The sensing structure as claimed in claim 1, wherein the connecting pattern comprises a first conductive line, the first conductive line connects the sensing unit and the periphery circuit, and line widths of the first conductive line gradually increases from the sensing unit toward the periphery circuit, and a minimum line width of the first conductive line is greater than or equal to a line width of the sensing unit and a maximum line width of the first conductive line is smaller than or equal to a line width of the periphery circuit.

9. The sensing structure as claimed in claim 1, wherein the connecting circuit further comprises at least one second conductive line at a terminal part of the sensing unit, and the at least one second conductive line connects the sensing unit and the periphery circuit.

10. The sensing structure as claimed in claim 9, wherein the at least one second conductive line overlaps the terminal part of the sensing unit, and a line width of the at least one second conductive line is greater than or equal to a line width of the sensing unit.

11. The sensing structure as claimed in claim 1, wherein the line widths of the connecting pattern gradually increase from the sensing unit toward the periphery circuit.

12. The sensing structure as claimed in claim 1, wherein in a cross-section of the connecting pattern, a position where a top and a side connect has a lead angle, and an included angle between the side and a bottom is an acute angle.

13. The sensing structure as claimed in claim 1, wherein the line width and a line thickness of the connecting pattern are positively correlated.

14. The sensing structure as claimed in claim 1, wherein a mean surface roughness of the sensing unit, the connecting pattern, or the periphery circuit is in a range from 10% to 50%.

15. A sensing structure, comprising:

a sensing unit;

a periphery circuit; and

a connecting circuit, comprising a connecting pattern and configured to connect the sensing unit and the periphery circuit, wherein the connecting pattern comprises a mesh pattern, the mesh pattern has at least two mesh densities, and the mesh density of a part of the mesh pattern that connects the periphery circuit is greater than the mesh density of a part of the mesh pattern that connects the sensing unit.

16. The sensing structure as claimed in claim 15, wherein the sensing unit comprises a sensing series, the sensing series extends in a direction and comprises a plurality of mesh electrodes, and a mesh density of each of the mesh electrodes is lower than or equal to a minimum mesh density of the mesh pattern.

17. The sensing structure as claimed in claim 16, wherein the sensing unit further comprises a plurality of dummy electrodes, and the dummy electrodes are configured between the mesh electrodes and disposed in an electrically floating state.

18. The sensing structure as claimed in claim 17, wherein each of the dummy electrodes has a mesh structure.

19. The sensing structure as claimed in claim 15, wherein a line width of the mesh pattern is uniform, or line widths of the mesh pattern gradually increase from the sensing unit toward the periphery circuit.

20. The sensing structure as claimed in claim 15, wherein the sensing unit, the connecting circuit, and the periphery circuit are integrally formed.

21. The sensing structure as claimed in claim 15, wherein the connecting circuit further comprises at least one first conductive line disposed between the mesh pattern and the periphery circuit, the at least one first conductive line connects the mesh pattern and the periphery circuit, and line widths of the at least one first conductive line gradually increase from the mesh pattern toward the periphery circuit, and a maximum line width of the at least one first conductive line is smaller than or equal to a line width of the periphery circuit.

22. The sensing structure as claimed in claim 15, wherein the connecting circuit further comprises at least one second conductive line at a terminal part of the sensing unit, and the at least one second conductive line connects the sensing unit and the periphery circuit.

23. The sensing structure as claimed in claim 22, wherein the at least one second conductive line overlaps the terminal part of the sensing unit.

24. The sensing structure as claimed in claim 15, wherein the mesh densities of the mesh pattern gradually increase from the sensing unit toward the periphery circuit.

25. The sensing structure as claimed in claim 15, wherein in a cross-section of the mesh pattern, a position where a top and a side connect has a lead angle, and an included angle between the side and a bottom is an acute angle.

26. The sensing structure as claimed in claim 15, wherein a line width and a line thickness of the mesh pattern are positively correlated.

27. The sensing structure as claimed in claim 15, wherein a mean surface roughness of the sensing unit, the connecting pattern, or the periphery circuit is in a range from 10% to 50%.

28. A sensing structure, comprising:

a sensing unit, comprising a single sensing series;

a periphery circuit, comprising a periphery wire; and

a connecting circuit, comprising a plurality of first conductive lines, wherein the first conductive lines are disposed between the single sensing series and the periphery wire and connect the single sensing series and the periphery wire.

29. The sensing structure as claimed in claim 28, wherein the single sensing series extends in a direction and comprises a plurality of mesh electrodes.

30. The sensing structure as claimed in claim 29, wherein the sensing unit further comprises a plurality of dummy electrodes, and the dummy electrodes are configured between the mesh electrodes and disposed in an electrically floating state.

31. The sensing structure as claimed in claim 30, wherein each of the dummy electrodes has a mesh structure.

32. The sensing structure as claimed in claim 28, wherein the connecting circuit further comprises at least one second conductive line, the at least one second conductive line is located at a terminal part of the single sensing series, and the at least one second conductive line connects the single sensing series and the first conductive lines.

33. The sensing structure as claimed in claim 32, wherein the at least one second conductive line overlaps the terminal part of the single sensing series.

34. The sensing structure as claimed in claim 28, wherein in a cross-section of the first conductive line, a position where a top and a side connect has a lead angle, and an included angle between the side and a bottom is an acute angle.

35. The sensing structure as claimed in claim 28, wherein a line width and a line thickness of the first conductive line are positively correlated.

36. The sensing structure as claimed in claim 28, wherein a mean surface roughness of the sensing unit, the first conductive line, or the periphery circuit is in a range from 10% to 50%.