METHOD AND APPARATUS FOR TESTING A TRANSFORMER

• US 20160025797A1
• Filed: 02/04/2014
• Published: 01/28/2016
• Est. Priority Date: 04/05/2013
• Status: Active Grant

• Current Assignee: OMICRON electronics GmbH
• Original Assignee: OMICRON electronics GmbH
• Inventors: Krger, Michael, Atlas, Dmitry, Predl, Florian, Jger, Markus, Freiburg, Michael
• Granted Patent: US 9,817,053 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01R 31/62 Testing of transformers

Abstract

For testing a transformer (20) the transformer (20) is emulated by an equivalent circuit (30) and an accuracy of the transformer (20) relative to the equivalent circuit (30) is determined by evaluating a test response of the transformer (20) and is then automatically converted to an operating condition-related accuracy of the transformer (20).

Claims

1. Method for testing a transformer, comprising the steps

a) emulating the transformer by means of an equivalent circuit,

b) applying a test signal to the transformer,

c) detecting a test response of the transformer in dependence on the test signal,

d) automatically determining an equivalent-circuit-related accuracy of the transformer on the basis of the test response, and

e) automatically determining an operating-condition-related accuracy of the transformer from the equivalent-circuit-related accuracy.

2. Method according to claim 1, in steps c) and d), components of the equivalent circuit are determined automatically in dependence on the test response of the transformer in order to determine the equivalent-circuit-related accuracy of the transformer on the basis of the equivalent circuit thus provided with specific values for the components.

3. Method according to claim 1, wherein in step d), an equivalent-circuit-related voltage deviation and/or an equivalent-circuit-related phase displacement of the transformer are determined for different burdens, operating voltages and/or operating frequencies of the transformer, and are converted in step e) into a corresponding voltage deviation or a corresponding phase displacement for corresponding operating conditions of the transformer.

4. Method according to claim 1, wherein in step e), the equivalent-circuit-related accuracy of the transformer is converted into the operating-condition-related accuracy of the transformer using a simulation model of the transformer, wherein the simulation model takes into consideration frequency-dependent and flux-dependent iron losses of the transformer.

5. Method according to claim 1, wherein for determining the equivalent-circuit-related accuracy of the transformer, a test signal with a voltage of not more than 10 V and/or a frequency of not more than 10 Hz is applied.

6. Method according to claim 1, wherein for determining the equivalent-circuit-related accuracy of the transformer, a test signal with a voltage less than the nominal voltage of the transformer and a frequency less than the nominal frequency of the transformer is applied.

7. Method according to claim 1, wherein in steps b) to d), a primary winding resistance and a secondary winding resistance of the equivalent circuit are determined by means of a resistance measurement on the transformer.

8. Method according to claim 7, wherein a resistance measurement is carried out at each secondary winding of the transformer in order to determine the corresponding secondary winding resistance for each secondary winding, wherein a transformed primary winding resistance of the equivalent circuit is determined automatically from the determined secondary winding resistances and from measured stray losses of the transformer.

9. Method according to claim 1, wherein in steps b) to d), stray losses of the transformer are determined automatically by a short-circuit impedance measurement.

10. Method according to claim 9, wherein for determining the stray losses of the transformer, the primary side is short circuited and a test signal is applied to each secondary winding of the transformer in succession.

11. Method according to claim 1, wherein in steps b) to d), leakage inductances of the equivalent circuit of the transformer are determined automatically by short-circuit impedance measurements on the primary side and on the secondary side.

12. Method according to claim 1, wherein in steps b) to d), a measurement of the magnetisation behaviour of the transformer is carried out by applying test signals with different voltages and frequencies.

13. Method according to claim 1, wherein in steps b) to d), the transformation ratio of the transformer is determined.

14. Method according to claim 13, wherein for determining the transformation ratio, a test signal with a voltage in the range of from 3% to 80% of the nominal voltage of the transformer is applied to the transformer on the primary side.

15. Method according to claim 13, wherein a measurement of a total transformation ratio of the transformer, a measurement of a transformation ratio of an inductive voltage transformer of the transformer and a measurement of a transformation ratio of a capacitive voltage divider of the transformer are carried out.

16. Method according to claim 1, wherein when determining the accuracy of the transformer, a winding adjustment carried out during the manufacture of the transformer is automatically taken into consideration.

17. Method according to claim 16, wherein the winding adjustment is taken into consideration when determining the transformation ratio of the transformer in steps b) to d).

18. Method according to claim 1, wherein the test response is detected using a four-wire measuring method.

19. Method according to claim 1, wherein the method is carried out for a transformer in the form of an inductive voltage transformer or for a transformer in the form of a capacitive voltage transformer.

20. Method according to claim 1, wherein the method is carried out by means of a portable test device at the installation site of the transformer.

21. Device for testing a transformer, comprising

a test signal source for generating a test signal which is to be applied to the transformer,

a test response detecting device for detecting a test response of the transformer in dependence on the test signal, and

an evaluation device which is so configured that it emulates the transformer by an equivalent circuit and, on the basis of the test response, automatically determines an equivalent-circuit-related accuracy of the transformer and converts that accuracy into an operating-condition-related accuracy of the transformer.

22. Device according to claim 21, wherein the device is in the form of a portable test device for carrying out an in situ test of the transformer.

23. Device according to claim 21, wherein the device is configured for testing a transformer in the form of a voltage transformer.

24. (canceled)