PHYSICAL QUANTITY SENSOR, PRESSURE SENSOR, ALTIMETER, ELECTRONIC DEVICE, AND MOVING OBJECT

• US 20160033347A1
• Filed: 07/28/2015
• Published: 02/04/2016
• Est. Priority Date: 07/29/2014
• Status: Abandoned Application

• Current Assignee: Seiko Epson Corporation (Seiko Group)
• Original Assignee: Seiko Epson Corporation (Seiko Group)
• Inventors: HAYASHI, Kazuya
• Application Number:
  US14/810,768
• Publication Number:
  US 20160033347A1
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01L 9/0042 Constructional details associated with semiconductive diaphragm sensors, e.g. etching, or constructional details of non-semiconductive diaphragms details about the integration or bonding of piezoresistor in or on the diaphragm G01L9/0052 and G01L9/0057 respectively
• CPC Class Codes: G01L 9/0054 integral with a semiconducting diaphragm

Abstract

A physical quantity sensor includes a substrate that includes a recessed portion which is open on one face of the substrate, a diaphragm portion that includes a bottom portion of the recessed portion and is flexibly deformed by receiving pressure, a piezoresistive element that is arranged in the diaphragm portion, and a stepped portion that is arranged along the periphery of the diaphragm portion on the other face of the substrate and protrudes from the diaphragm portion in the thickness direction of the diaphragm portion by a height which is smaller than the depth of the recessed portion.

Claims

1. A physical quantity sensor comprising:

a substrate that includes a recess on a first side of the substrate;

a diaphragm that forms a bottom of the recess and is flexibly deformed by variations in atmospheric pressure;

a sensor operatively associated with the diaphragm; and

a step along a periphery of the diaphragm in plan view on a second side of the substrate,

the step protruding relative to the diaphragm by an amount that is less than a depth of the recess.

2. The physical quantity sensor according to claim 1,

wherein a surface of the diaphragm on the first side of the substrate is a pressure receiving face.

3. The physical quantity sensor according to claim 1,

wherein the sensor is offset toward the second side of the substrate relative to the diaphragm.

4. The physical quantity sensor according to claim 3,

wherein the sensor is positioned laterally closer to the step than to a center of the diaphragm.

5. The physical quantity sensor according to claim 1,

wherein the step is a separate layer from the substrate.

6. The physical quantity sensor according to claim 1,

wherein the separate layer includes polycrystalline silicon.

7. The physical quantity sensor according to claim 5, further comprising:

a pressure reference chamber on the second side of the substrate.

8. The physical quantity sensor according to claim 7,

wherein a side wall of the pressure reference chamber is immediately adjacent the separate layer.

9. The physical quantity sensor according to claim 1,

wherein the amount the step protrudes relative to the diaphragm is 0.1 μ

m to 380 μ

m, inclusive.

10. The physical quantity sensor according to claim 1,

wherein the diaphragm has an overall thickness of 1 μ

m to 8 μ

m, inclusive.

11. The physical quantity sensor according to claim 1,

wherein the step is −

5 μ

m to 15 μ

m, inclusive, from a peripheral edge of the diaphragm toward an interior of the diaphragm.

12. The physical quantity sensor according to claim 1,

wherein the diaphragm has an overall width of 50 μ

m to 300 μ

m, inclusive.

13. A pressure sensor comprising:

a body; and

the physical quantity sensor according to claim 1 connected to the body.

14. An altimeter comprising:

a body; and

the physical quantity sensor according to claim 1 connected to the body.

15. An electronic device comprising:

a body; and

the physical quantity sensor according to claim 1 connected to the body.

16. A moving object comprising:

a body; and

the physical quantity sensor according to claim 1 connected to the body.

17. A physical quantity sensor comprising:

a substrate having first and second sides;

an open recess in the first side of the substrate;

a pressure reference chamber on the second side of the substrate;

a diaphragm having a first surface forming a bottom of the open recess and a second surface forming a ceiling of the pressure reference chamber, the diaphragm being configured to flexibly deform by variations in atmospheric pressure;

a sensor embedded in the diaphragm; and

a step along a periphery of the diaphragm, the step interconnecting the second surface of the diaphragm and a side wall of the pressure reference chamber, the step being exposed to an interior of the pressure reference chamber,

wherein the step protrudes relative to the diaphragm by an amount that is less than a depth of the open recess.

18. The physical quantity sensor according to claim 17,

wherein the sensor is positioned so as to be vertically offset toward the second side of the substrate.

19. The physical quantity sensor according to claim 18,

wherein the sensor is positioned so as to be laterally offset toward the step relative to a center of the diaphragm.

20. The physical quantity sensor according to claim 17,

wherein the step is a separate layer from the substrate.