SYSTEM AND METHOD USING OAM SPECTROSCOPY LEVERAGING FRACTIONAL ORBITAL ANGULAR MOMENTUM AS SIGNATURE TO DETECT MATERIALS
First Claim
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1. An apparatus that detects a material within a sample, comprising:
- signal generation circuitry that generates a first signal having at least one orbital angular momentum applied thereto and applies the first signal to the sample;
a detector for receiving the first signal after the first signal passes through the sample and detecting the material responsive to a detection of a predetermined profile of orbital angular momentum states within the first signal received from the sample.
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Abstract
An apparatus that detects a material within a sample includes signal generation circuitry that generates a first signal having at least one orbital angular momentum applied thereto and applies the first signal to the sample. A detector receives the first signal after the first signal passes through the sample and detects the material responsive to a detection of a predetermined profile of orbital angular momentum states within the first signal received from the sample.
30 Citations
30 Claims
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1. An apparatus that detects a material within a sample, comprising:
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signal generation circuitry that generates a first signal having at least one orbital angular momentum applied thereto and applies the first signal to the sample; a detector for receiving the first signal after the first signal passes through the sample and detecting the material responsive to a detection of a predetermined profile of orbital angular momentum states within the first signal received from the sample. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A method for determining a material within a sample, comprising:
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generating a first signal having at least one orbital angular momentum applied thereto; applying the first signal to the sample; receiving the first signal after the first signal passes through the sample; detecting a predetermined profile of orbital angular momentum states within the received first signal; and determining the material within the sample based on the detected predetermined profile of orbital angular momentum states within the first signal received from the sample. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 25, 26, 27, 28)
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24. An apparatus that detects a material within a sample, comprising:
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signal generation circuitry that generates a first signal having at least one orbital angular momentum applied thereto and applies the first signal to the sample; an orbital angular momentum detector that receives the first signal after the first signal passes through the sample and detects a profile of fractional orbital angular momentum states of the orbital angular momentum within the first signal from the sample; and a processor that determines the material within the sample responsive to the detected profile of fractional orbital angular momentum states of the orbital angular momentum. - View Dependent Claims (29, 30)
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Specification