IMPROVING SYMMETRY IN BRAIN SCANS

• US 20160042524A1
• Filed: 03/17/2014
• Published: 02/11/2016
• Est. Priority Date: 03/28/2013
• Status: Active Grant

• Current Assignee: Koninklijke Philips N.V.
• Original Assignee: Koninklijke Philips N.V.
• Inventors: WENZEL, FABIAN, MOORE, ELIZABETH ANNE, STEHLE, THOMAS HEIKO, FRANZ, ASTRID RUTH, MEYER, CARSTEN
• Granted Patent: US 10,438,345 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: A61B 6/501 for diagnosis of the head, e.g. neuroimaging or craniography
• CPC Class Codes: G06T 2207/30016 Brain
• CPC Class Codes: G06T 3/18 Image warping, e.g. rearranging pixels individually
• CPC Class Codes: G06T 7/0012 Biomedical image inspection
• CPC Class Codes: G06T 7/10 Segmentation; Edge detection motion-based segmentation G06T7/215

Abstract

A system and method including adapting a symmetric model representing anatomical structures of the brain, the model corresponding to a brain scan image, transforming first and second points provided on first and second hemispheres of the brain and computing, based on the transformation, a patient-specific symmetric anatomical model of the brain.

Claims

1. A method for reducing anatomical asymmetry in a brain scan image, comprising:

adapting a symmetric model representing anatomical structures of a brain to the brain scan image by transforming first and second points of the symmetric model to corresponding first and second points provided on first and second hemispheres of the brain scan image; and

computing, based on the transformation, a patient-specific symmetric anatomical model of the brain.

2. The method of claim 1, wherein the patient-specific symmetric anatomical model is computed by fitting an optimal plane to the symmetric model, the plane being positioned and oriented to minimize the sum of a squared distance between the corresponding first and second points.

3. The method of claim 2, wherein the plane is offset from a plane housing a longitudinal fissure of the brain.

4. The method of claim 2, further comprising the step of deriving a thin-plate spline deformation field to determine a two-dimensional displacement of x and y coordinates of the brain scan image as a function of the deviations of third and fourth points of the patient-specific symmetric anatomical model relative to the first and second points.

5. The method of claim 1, further comprising the step of computing corresponding locations in the brain scan image using a transformation field.

6. The method of claim 1, wherein the model is one of two-dimensional, three-dimensioned and four-dimensional.

7. The method of claim 4, further comprising the step of generating a symmetric brain image based on a position of the third and fourth points relative to the first and second points, respectively.

8. The method of claim 1, wherein the patient-specific symmetric anatomical model is computed via parametrization by linking the first point with the corresponding second point and transforming the first point to the second hemisphere by computing the local parametrization of the first point in the second hemisphere of the patient-specific symmetric anatomical model.

9. A method, comprising:

adapting a symmetric three-dimensional model representing anatomical structures of the brain, the model corresponding to a two-dimensional brain scan image;

transforming the symmetric model such that corresponding locations in first and second hemispheres thereof are symmetrical about a mid-plane; and

computing corresponding first and second locations in first and second hemispheres of the brain using a transformation field.

10. The method of claim 9, further comprising the step of generating a symmetric two-dimensional brain image based the computed first and second locations.

11. The method of claim 9, further comprising the step of deriving a thin-plate spline deformation field to determine a two-dimensional displacement of x and y coordinates of the brain scan image as a function of the deviations of a first pair of vertices from the transformed model relative to a corresponding second pair of vertices from the adapted model.

12. A system for reducing anatomical asymmetry in a two-dimensional brain scan image, comprising:

a processor adapting a symmetric model representing anatomical structures of the brain, the model corresponding to the two-dimensional brain scan image by transforming the symmetric model such that corresponding locations in first and second hemispheres thereof are symmetrical about a mid-plane and computing, based on the transformation, a patient-specific symmetric anatomical model of the brain.

13. The system of claim 12, wherein the processor generates an adjusted brain scan image based on the transformation field, the adjusted brain scan image being symmetric about a mid-plane.

14. The system of claim 12, wherein the adapted model is a symmetric three-dimensional model.

15. The system of claim 12, wherein the processor further fits an optimal plane to the adapted model, the plane being positioned and oriented to minimize the sum of a squared distance between corresponding first and second locations located in first and second hemispheres of the brain.

16. The system of claim 12, wherein the processor computes a patient-specific symmetric anatomical model of the brain, the patient-specific anatomical model having third and fourth locations symmetrically disposed about the plane.

17. The system of claim 16, wherein the first, second, third and fourth locations are vertices.

18. The system of claim 15, wherein the plane is positioned and oriented to minimize the sum of a squared distance between the first and second locations.

19. The system of claim 15, wherein the plane is offset from a plane housing the longitudinal fissure of the brain.

20. The system of claim 15, wherein the processor derives a thin-plate spline deformation field to determine a displacement of coordinates of the brain scan image as a function of the deviations of third and fourth locations relative to the first and second locations.