APPARATUS AND METHOD FOR MONITORING A PACKAGE DURING TRANSIT

• US 20160055453A1
• Filed: 08/19/2015
• Published: 02/25/2016
• Est. Priority Date: 08/19/2014
• Status: Active Grant

• Current Assignee: RR Donnelley & Sons Company
• Original Assignee: RR Donnelley & Sons Company
• Inventors: Cyman, Theodore F. Jr., Murzynowski, Alan R., Kanfoush, Daniel E., Warmus, James L., Palmer, Eric V.
• Granted Patent: US 9,514,432 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G06K 19/0716 at least one of the integrated circuit chips comprising a sensor or an interface to a sensor
• CPC Class Codes: G06K 7/10297 arrangements for handling protocols designed for non-contact record carriers such as RFIDs NFCs, e.g. ISO/IEC 14443 and 18092 cryptographic protocols H04L9/00; network security protocols H04L63/00; real-time communication protocols in data switching networks H04L65/00; network protocols for data switching network services H04L67/00
• CPC Class Codes: G06Q 10/08 Logistics, e.g. warehousing, loading or distribution; Inventory or stock management
• CPC Class Codes: G06Q 10/0833 Tracking

Abstract

According to one aspect, a monitoring device for detecting when an object may be subjected to a condition includes a processor, a sensor, and a configuration circuit. The sensor is adapted to detect if the object is subjected to at least a first magnitude of the particular condition. The configuration circuit may be used to specify a second magnitude of the particular condition, wherein the second magnitude is greater than the first magnitude. The processor remains in an inactive state if the object is subjected to a magnitude of the particular condition less than the second magnitude, and the sensor generates a signal in response to detection of object being subjected to at least the second magnitude of the particular condition. In response to the signal, the processor enters an active state to develop an indication of at least the second magnitude of the particular condition.

Claims

1. A monitoring device for detecting that an object has been subjected to a particular condition, comprising:

a carrier disposed on the object;

a processor disposed on the carrier;

a sensor disposed on the carrier, wherein the sensor is adapted to detect when the object is subjected to at least a first magnitude of the particular condition;

a configuration circuit for specifying a configuration parameter, wherein the configuration parameter include a second magnitude of the particular condition, wherein the second magnitude is greater than the first magnitude; and

wherein the processor remains in an inactive state if the object is subjected to a magnitude of the particular condition less than the second magnitude, the sensor generates a signal in response to detection of the object being subjected to a third magnitude of the particular condition, and in response to the signal the processor enters an active state to develop an indication of third magnitude of the particular condition, wherein the third magnitude is greater than or equal to the second magnitude.

2. The monitoring device of claim 1, wherein the processor returns to the inactive state after the indication has been developed, and the processor remains in the inactive state until the sensor detects that the object is subjected to a fourth magnitude of the particular condition, wherein the fourth magnitude is greater the third magnitude.

3. The monitoring device of claim 1, further comprising a further sensor configured to sense a further condition to which the object may be subjected, and the processor periodically polls the further sensor to determine if the object has been subjected to the further condition.

4. The monitoring device of claim 1, wherein the carrier comprises a first surface and a second surface opposite the first surface, the processor and the sensor are disposed on the first surface, and the second surface is affixed to the object.

5. The monitoring device of claim 4, further comprising conductive traces coupled to the processor and the sensor, wherein the conductive traces are printed on the first surface using one or more of inkjet printing, screen printing, lithographic printing, intaglio printing, gravure printing and flexographic printing.

6. The monitoring device of claim 1, wherein the configuration circuit includes an RFID transceiver, and the configuration parameter is transmitted to the RFID transceiver.

7. The monitoring device of claim 1, wherein the configuration circuit includes two conductive traces associated with the configuration parameter, wherein coupling the two conductive traces specifies the second magnitude.

8. The monitoring device of claim 7, wherein the monitoring device includes a further carrier, wherein the two conductive traces are disposed between the carrier and the further carrier, the further carrier includes an aperture through which the two conductive traces may be coupled.

9. The monitoring device of claim 8, wherein the further carrier includes a further aperture and two further conductive traces that may be coupled through the further aperture, wherein coupling the two further conductive traces specifies a further configuration parameter.

10. The monitoring device of claim 1, wherein the configuration circuit includes two conductive traces that may be decoupled, and decoupling the two conductive traces specifies the second magnitude.

11. The monitoring device of claim 10, wherein the monitoring device includes a further carrier having a removable tab, wherein removing the removable tab decouples the two conductive traces.

12. The monitoring device of claim 11, wherein the further carrier includes a further removable tab, wherein removing the further removable tab specifies a further configuration parameter.

13. The monitoring device of claim 11, wherein the removable tab includes a surface having a conductive portion and the conductive portion couples the two conductive traces.

14. The monitoring device of claim 10, wherein removing the removable tab generates a reset signal to the processor.

15. The monitoring device of claim 1, wherein the processor configures the sensors in accordance with the configuration parameter.

16. The monitoring device of claim 1, further including a reset signal generator to generate a reset signal that actuates the monitoring device.

17. The monitoring device of claim 16, wherein the reset signal generator includes two conductive traces that may be coupled, and wherein the reset signal is generated when the two conductive traces are coupled.

18. The monitoring device of claim 16, wherein the reset signal generator includes two conductive traces that may be decoupled, wherein the reset signal is generated when the two conductive traces are decoupled.

19. The monitoring device of claim 1, wherein the carrier includes a switch, a memory, and one or more removable tabs, wherein actuation of the switch causes the processor to record the tabs that have been removed.

20. The monitoring device of claim 19, wherein in response to actuation of the switch, the processor records in the memory a plurality of configuration parameters associated determined by the removed tabs.

21. The monitoring device of claim 19, wherein none of the removable tabs have been removed and, in response to actuation of the switch, the processor records in the memory predefined configuration parameters.

22. A method of detecting that an object has been subjected to a particular condition, comprising:

detecting when the object is subjected to at least a first magnitude of the particular condition;

specifying a configuration parameter, wherein the configuration parameter includes a second magnitude of the particular condition, wherein the second magnitude is greater than the first magnitude;

generating a signal in response to detection of the object being subjected to a third magnitude of the particular object;

operating a processor in an inactive state if the object is subjected to a magnitude of the particular condition less than the second magnitude; and

operating the processor in an active state to develop an indication of the third magnitude of the particular condition, wherein the third magnitude is greater than or equal to the second magnitude.

23. The method of claim 22, comprising the further step of operating the processor in inactive state after the indication has been developed until the object is subjected to a fourth magnitude of the particular condition, wherein the fourth magnitude is greater the third magnitude.

24. The method of claim 22, wherein the specifying the configuration parameter includes the step of transmitting the configuration parameter to an RFID transceiver.

25. The method of claim 22, wherein specifying the configuration comprises the step of coupling two conductive traces of an electronic circuit.

26. The method of claim 25, wherein the step of coupling the two conductive traces includes the step of accessing the two coupling traces through an aperture in a carrier.

27. The method of claim 22, wherein the specifying the configuration parameter includes the step of decoupling two conductive traces of an electronic circuit.

28. The method of claim 27, wherein decoupling the two conductive traces includes the step removing a removable tab from a carrier, wherein removing the removable tab is sufficient to decouples the two conductive traces.