PLASMA APPARATUS AND METHOD OF OPERATING THE SAME
First Claim
1. A plasma apparatus comprising:
- a process chamber having an inner, enclosed space;
a chuck disposed in the process chamber and having a top surface configured to load a substrate;
a gas supply unit supplying a process gas into the process chamber;
a plasma generating unit configured to generate plasma over the chuck;
a direct current (DC) power generator configured to apply a DC pulse signal to the chuck; and
a sensor configured to monitor a state of the plasma and provide a sensing signal to the DC power generator,wherein the DC pulse signal comprises a series of periods, wherein each period of the DC pulse signal comprises;
a negative pulse duration during which a negative pulse is applied;
a positive pulse duration during which a positive pulse is applied; and
a pulse-off duration during which the negative pulse and the positive pulse are turned-off, andwherein the DC power generator is configured to change at least one of a magnitude of the positive pulse and a length of the positive pulse duration of an n+1th period of the DC pulse signal, where “
n”
denotes a natural number, upon detecting a signal disturbance of the sensing signal in an nth period of the DC pulse signal.
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Accused Products
Abstract
A plasma apparatus includes a chuck disposed in a process chamber, a gas supply unit supplying a process gas into the process chamber, a plasma generating unit configured to generate plasma over the chuck, a direct current (DC) power generator applying a DC pulse signal to the chuck, and a sensor monitoring a state of the plasma and providing a sensing signal to the DC power generator. Each period of the DC pulse signal includes a negative pulse duration, a positive pulse duration, and a pulse-off duration. If a signal disturbance of the sensing signal occurs in an nth period of the DC pulse signal, the DC power generator changes a magnitude of a positive pulse and/or a length of the positive pulse duration of an n+1th period of the DC pulse signal, where “n” denotes a natural number.
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Citations
32 Claims
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1. A plasma apparatus comprising:
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a process chamber having an inner, enclosed space; a chuck disposed in the process chamber and having a top surface configured to load a substrate; a gas supply unit supplying a process gas into the process chamber; a plasma generating unit configured to generate plasma over the chuck; a direct current (DC) power generator configured to apply a DC pulse signal to the chuck; and a sensor configured to monitor a state of the plasma and provide a sensing signal to the DC power generator, wherein the DC pulse signal comprises a series of periods, wherein each period of the DC pulse signal comprises;
a negative pulse duration during which a negative pulse is applied;
a positive pulse duration during which a positive pulse is applied; and
a pulse-off duration during which the negative pulse and the positive pulse are turned-off, andwherein the DC power generator is configured to change at least one of a magnitude of the positive pulse and a length of the positive pulse duration of an n+1th period of the DC pulse signal, where “
n”
denotes a natural number, upon detecting a signal disturbance of the sensing signal in an nth period of the DC pulse signal. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. A method of operating a plasma apparatus, the method comprising:
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loading a substrate on a chuck disposed in a process chamber; supplying a process gas into the process chamber; generating plasma over the chuck; applying a direct current (DC) pulse signal to the chuck by a DC power generator, each period of the DC pulse signal comprising;
a negative pulse duration during which a negative voltage pulse is applied;
a positive pulse duration during which a positive voltage pulse is applied; and
a pulse-off duration during which a third voltage with a magnitude that is not greater than either magnitude of the negative voltage pules and the positive voltage pulse is applied to the chuck;monitoring a state of the plasma by a sensor; providing a sensing signal to the DC power generator by the sensor; and changing at least one of a magnitude of the positive voltage pulse and a length of the positive pulse duration of an n+1th period of the DC pulse signal by the DC power generator if a signal disturbance of the sensing signal occurs in an nth period of the DC pulse signal, where “
n”
denotes a natural number. - View Dependent Claims (23, 24, 25, 26, 27, 28)
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29. A method of operating a plasma apparatus, the method comprising:
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loading a substrate on a chuck within a vacuum chamber; generating a radio frequency (RF) plasma power; transmitting the RF plasma power to the vacuum chamber through a matching unit and an antenna electrode; supplying gas into the vacuum chamber; periodically applying a voltage signal to the chuck by a first power generator, each period of the voltage signal comprising;
a negative voltage duration during which a varying negative voltage is applied;
a positive voltage duration during which a positive voltage is applied; and
an interrupted duration during which a ground voltage is applied;monitoring a state of the plasma by a sensor; providing a sensing signal to the power generator by the sensor; and changing both a magnitude of the positive voltage pulse and a length of the positive pulse duration by the power generator of a second period after a disturbance of the sensing signal is detected, wherein the disturbance comprises a pulse of the sensing signal during either the negative voltage duration or positive voltage duration of the first period of the voltage signal. - View Dependent Claims (30, 31, 32)
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Specification