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PLASMA APPARATUS AND METHOD OF OPERATING THE SAME

  • US 20160056017A1
  • Filed: 07/15/2015
  • Published: 02/25/2016
  • Est. Priority Date: 08/19/2014
  • Status: Active Grant
First Claim
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1. A plasma apparatus comprising:

  • a process chamber having an inner, enclosed space;

    a chuck disposed in the process chamber and having a top surface configured to load a substrate;

    a gas supply unit supplying a process gas into the process chamber;

    a plasma generating unit configured to generate plasma over the chuck;

    a direct current (DC) power generator configured to apply a DC pulse signal to the chuck; and

    a sensor configured to monitor a state of the plasma and provide a sensing signal to the DC power generator,wherein the DC pulse signal comprises a series of periods, wherein each period of the DC pulse signal comprises;

    a negative pulse duration during which a negative pulse is applied;

    a positive pulse duration during which a positive pulse is applied; and

    a pulse-off duration during which the negative pulse and the positive pulse are turned-off, andwherein the DC power generator is configured to change at least one of a magnitude of the positive pulse and a length of the positive pulse duration of an n+1th period of the DC pulse signal, where “

    n”

    denotes a natural number, upon detecting a signal disturbance of the sensing signal in an nth period of the DC pulse signal.

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