MATRIX DEVICE, MEASUREMENT METHOD OF CHARACTERISTICS THEREOF, AND DRIVING METHOD THEREOF

• US 20160071446A1
• Filed: 09/03/2015
• Published: 03/10/2016
• Est. Priority Date: 09/05/2014
• Status: Active Grant

• Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
• Original Assignee: Semiconductor Energy Laboratory Co., Ltd.
• Inventors: MIYAKE, Hiroyuki
• Granted Patent: US 10,043,427 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01R 19/0092 measuring current only all subgroups of G01R19/00 take precedence
• CPC Class Codes: G01R 19/10 Measuring sum, difference or ratio
• CPC Class Codes: G09G 2300/0417 Special arrangements specific to the use of low carrier mobility technology
• CPC Class Codes: G09G 2300/0842 forming a memory circuit, e.g. a dynamic memory with one capacitor
• CPC Class Codes: G09G 2320/045 Compensation of drifts in the characteristics of light emitting or modulating elements
• CPC Class Codes: G09G 2330/12 Test circuits or failure detection circuits included in a display system, as permanent part thereof
• CPC Class Codes: G09G 3/006 Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309
• CPC Class Codes: G09G 3/3233 with pixel circuitry controlling the current through the light-emitting element

Abstract

To provide a measurement method of characteristics of an electrical element which causes variation in the luminance of pixels. In a device which includes components (pixels) arranged in a matrix and a wiring and where each component is can supply current to the wiring through an electrical element included in each component, the directions of current in N components capable of supplying current to the wiring are individually set and the current flowing through the wiring is measured N times. Here, the directions of the current flowing through the electrical elements can be changed. In the respective N measurements, combinations of the directions of current in the N components differ from one another. The amount of current flowing through each electrical element is calculated based on current obtained by the N measurements and the combinations of the directions of the current in the N measurements.

Claims

1. A measurement method comprising the steps of:

in a device which includes components arranged in a matrix with N rows (N is an integer greater than or equal to

     2) and a wiring, where each component can supply a current to the wiring through a corresponding one of electrical elements included in the components, and where the directions of the current can be changed,

individually setting the directions of the currents in N components capable of supplying current to the wiring and measuring the current flowing through the wiring N times, and

obtaining the amount of current supplied to the wiring by each of the components by calculating the amount of current flowing through electrical elements based on current I [1] to current I [N] obtained by the N measurements and combinations of the directions of current of the components in the N measurements,

wherein combinations of the directions of the current in the N components differ from one another in the respective N measurements, and

wherein the amount of current flowing through each of the electrical elements is calculated using polynomials of the current I [1] to the current I [N].

3. The measurement method according to claim 1,

wherein the device is a display device or a photodetector device.

5. The measurement method according to claim 1,

wherein one of the components comprises:

a transistor and a capacitor,

wherein one of a source and a drain of the transistor is connected to a first node through a first switch and to the wiring through a second switch,

wherein the other one of the source and the drain of the transistor is connected to a second node through a third switch, and to the wiring through a fourth switch, and

wherein a gate of the transistor is connected to one of the source and the drain via the capacitor.

7. The measurement method according to claim 5,

wherein the first switch and the fourth switch are operated in conjunction, and

wherein the second switch and the third switch are operated in conjunction.

9. A driving method of a matrix device wherein input data or output data is corrected based on a current value of a component which is measured by the measurement method according to claim 1.

2. A measurement method comprising the steps of:

in a device which includes components arranged in a matrix with N rows and M columns (N and M are each an integer greater than or equal to

     2) and M wirings, where each component can supply current to a corresponding one of the wirings through a corresponding one of electrical elements included in the components, and where the directions of the currents can be changed, measuring the current flowing through the wirings,

wherein the direction of the current in the component in a k-th row and an m-th column (k is an integer greater than or equal to 1 and less than or equal to N and m is an integer greater than or equal to 1 and less than or equal to M) in an n-th time (n is an integer greater than or equal to 1 and less than or equal to N) measurement is set to α

[k]_n (α

[k]_n is 1 or −

1, where one of the direction in which current flows from the component to a corresponding one of the wirings and the direction in which current flows from the corresponding one of the wirings to the component is defined as 1, and the other is defined as −

1), and

wherein a value of current which can be supplied to the wiring by the component in the k-th row and the m-th column is determined based on an N×

M matrix value at the k-th row and the m-th column of the N×

M matrix which is obtained by a product of an inverse matrix of a square matrix A with N rows (note that in the square matrix A with N rows, the direction of the current in the component in an n-th row and a k-th column is α

[k]_n) and an N×

M matrix I in which the current in the component in an n-th row and an m-th column (m is an integer greater than or equal to 1 and less than or equal to M) is I[n, m] when current flowing through the wiring in the m-th column which is obtained by measurement is I[n, m].

4. The measurement method according to claim 2,

wherein the device is a display device or a photodetector device.

6. The measurement method according to claim 2,

wherein one of the components comprises:

a transistor and a capacitor,

wherein one of a source and a drain of the transistor is connected to a first node through a first switch and to a corresponding one of the wirings through a second switch,

wherein the other one of the source and the drain of the transistor is connected to a second node through a third switch, and to the corresponding one of the wirings through a fourth switch, and

wherein a gate of the transistor is connected to one of the source and the drain via the capacitor.

8. The measurement method according to claim 6,

wherein the first switch and the fourth switch are operated in conjunction, and

wherein the second switch and the third switch are operated in conjunction.

10. A driving method of a matrix device wherein input data or output data is corrected based on a current value of a component which is measured by the measurement method according to claim 2.

11. The measurement method according to claim 2,

wherein elements in the inverse matrix of the square matrix A with N rows are not zero.

12. The measurement method according to claim 2,

wherein the elements in the inverse matrix of the square matrix A with N rows have a same amplitude.

13. The measurement method according to claim 12,

wherein N is a multiple of 4 and the sum of elements in an arbitrary row of the square matrix A with N rows is 2 or −

2.

14. The measurement method according to claim 2,

wherein the square matrix A with N rows is a Hadamard matrix.

15. The measurement method according to claim 2,

wherein the square matrix A with N rows is a circulant matrix.

16. A matrix device comprising:

a potential supply circuit;

a first node and a second node;

a first wiring; and

a plurality of pixels arranged in a matrix, each pixel comprising;

a first transistor; and

a capacitor,

wherein one of a source and a drain of the first transistor is electrically connected to a first node through a first switch and to a wiring through a second switch,

wherein the other one of the source and the drain of the first transistor is electrically connected to a second node through a third switch, and to the wiring through a fourth switch,

wherein a gate of the first transistor is electrically connected to the potential supply circuit, and

wherein the gate of the transistor is electrically connected to one of the source and the drain via the capacitor.

17. The matrix device according to claim 16,

wherein the first switch and the fourth switch are a first switch transistor and a fourth switch transistor, respectively,

wherein a gate electrode of the first switch transistor and a gate electrode of the fourth switch transistor are wired to be at a same potential.

18. The matrix device according to claim 16,

wherein the second switch and the third switch are a second switch transistor and a third switch transistor, respectively,

wherein a gate electrode of the second switch transistor and a gate electrode of the third switch transistor are wired to be at a same potential.

19. The matrix device according to claim 16,

further comprising a data line;

and

a second transistor,

wherein the gate of the first transistor is electrically connected to the data line via the second transistor, and

wherein the wiring is electrically connected to the data line.