MATRIX DEVICE, MEASUREMENT METHOD OF CHARACTERISTICS THEREOF, AND DRIVING METHOD THEREOF

• US 20160071447A1
• Filed: 09/03/2015
• Published: 03/10/2016
• Est. Priority Date: 09/05/2014
• Status: Active Grant

• Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
• Original Assignee: Semiconductor Energy Laboratory Co., Ltd.
• Inventors: TAKEMURA, Yasuhiko, MIYAKE, Hiroyuki
• Granted Patent: US 9,797,931 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01R 19/0092 measuring current only all subgroups of G01R19/00 take precedence
• CPC Class Codes: G01R 19/10 Measuring sum, difference or ratio
• CPC Class Codes: G01R 19/2506 Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values G01R19/003 takes precedence; Details concerning sampling, digitizing or waveform capturing displaying waveforms G01R13/00; analog sampling G01R19/0053
• CPC Class Codes: G09G 2300/0426 Layout of electrodes and connections
• CPC Class Codes: G09G 2300/0814 used for selection purposes, e.g. logical AND for partial update
• CPC Class Codes: G09G 2300/0819 used for counteracting undesired variations, e.g. feedback or autozeroing
• CPC Class Codes: G09G 2300/0842 forming a memory circuit, e.g. a dynamic memory with one capacitor
• CPC Class Codes: G09G 2320/045 Compensation of drifts in the characteristics of light emitting or modulating elements
• CPC Class Codes: G09G 2330/12 Test circuits or failure detection circuits included in a display system, as permanent part thereof
• CPC Class Codes: G09G 2360/14 Detecting light within display terminals, e.g. using a single or a plurality of photosensors
• CPC Class Codes: G09G 2360/142 the light being detected by light detection means within each pixel
• CPC Class Codes: G09G 3/2092 Details of a display terminals using a flat panel, the details relating to the control arrangement of the display terminal and to the interfaces thereto suitable for both CRT and flat panel G09G5/003; specific for a CRT G09G1/165

Abstract

To provide a measurement method of characteristics of an electrical element which causes variation in the luminance of pixels. In a device which includes components (pixels) arranged in a matrix and a wiring and where each component is capable of supplying current to the wiring through an electrical element included in each component, supply and non-supply of current of N components are individually set and current flowing through the wiring is measured N times. In the respective N measurements, combinations of the supply and non-supply of current in N components capable of supplying current to the wiring differ from one another. The amount of current flowing through each electrical element is obtained based on current obtained by the N measurements and the combinations of supply and non-supply of current in the N measurements.

Claims

1. A measurement method comprising the steps of:

in a device including components arranged in a matrix with N rows (N is an integer greater than or equal to

     2) and a wiring and where each component is capable of supplying current to the wiring through a corresponding one of electrical elements included in the components,

individually setting supply and non-supply of currents by N components each capable of supplying current to the wiring,

measuring current flowing through the wiring N times, and

obtaining the amount of current supplied to the wiring by the components by calculating the amount of current flowing through the electrical elements based on current I[1] to current I[N] obtained by the N measurements and combinations of supply and non-supply of currents by each of the components in the N measurements,

wherein combinations of supply and non-supply of current in the N components differ from one another in the respective N measurements, and

wherein the amount of current flowing through the electrical elements is calculated using polynomials of the current I[1] to the current I[N].

3. A matrix device set such that the measurement method according to claim 1 is capable of being performed.

5. The matrix device according to claim 3,

wherein the matrix device is a display device or a photodetector device.

7. A driving method of a matrix device wherein input data or output data is corrected based on a current value of a component which is measured by the measurement method according to claim 1.

2. A measurement method comprising the steps of:

in measuring currents flowing through wirings in a device which includes components arranged in a matrix with N rows and M columns (N and M are each an integer greater than or equal to

     2) and M wirings, one for each column, and where each component is capable of supplying current to a corresponding one of the wirings using a corresponding one of electrical elements included in the components,

setting supply and non-supply of current in the component in a kth row and an mth column (k is an integer greater than or equal to 1 and less than or equal to N and m is an integer greater than or equal to 1 and less than or equal to M) in an nth (n is an integer greater than or equal to 1 and less than or equal to N) measurement to α

[k]_n (α

[k]_n is 1 or 0, where α

[k]_n is 1 in a case where current flows from the component to the wiring or in a case where current flows from the wiring to the component, and where α

[k]_n is 0 in a case where current is not supplied),

identifying current flowing through a wiring corresponding to an mth column obtained by measurement as I[n,m], and

determining a value of a current that the component in the kth row and the mth column is capable of supplying to the corresponding wiring based on an element in the kth row and the mth column in an N×

M matrix obtained by a product of an inverse matrix of a square matrix A with N rows (in the square matrix A with N rows, an element in an nth row and a kth column is α

[k]_n) and an N×

M matrix I in which an element in an nth row and an mth column is I[n,m].

4. A matrix device set such that the measurement method according to claim 2 is capable of being performed.

6. The matrix device according to claim 4,

wherein the matrix device is a display device or a photodetector device.

8. A driving method of a matrix device wherein input data or output data is corrected based on a current value of a component which is measured by the measurement method according to claim 2.

9. The measurement method according to claim 2,

wherein elements of the inverse matrix of the square matrix A with N rows are not zero.

10. The measurement method according to claim 2,

wherein amplitudes of elements of the inverse matrix of the square matrix A with N rows are the same.

11. The measurement method according to claim 10,

wherein N is an odd number and the sum of elements in an arbitrary row in the square matrix A with N rows is 2.

12. The measurement method according to claim 2,

wherein the square matrix A with N rows is a circulant matrix.