ELECTRONIC DEVICE

• US 20160077144A1
• Filed: 03/10/2015
• Published: 03/17/2016
• Est. Priority Date: 09/12/2014
• Status: Abandoned Application

• Current Assignee: Kabushiki Kaisha Toshiba (Toshiba Corporation)
• Original Assignee: Kabushiki Kaisha Toshiba (Toshiba Corporation)
• Inventors: Kurui, Yoshihiko, Ikehashi, Tamio
• Application Number:
  US14/643,904
• Publication Number:
  US 20160077144A1
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01R 31/64 Testing of capacitors
• CPC Class Codes: H01G 5/16 using variation of distance between electrodes
• CPC Class Codes: H03M 1/38 sequentially only, e.g. successive approximation type converting more than one bit per step H03M1/14

Abstract

According to one embodiment, an electronic device includes a variable capacitor includes first and second electrodes, and indicating a first state in which a distance between the first and second electrodes is a first distance and a second state in which the distance between the first and second electrodes is a second distance shorter than the first distance, in accordance with a voltage applied between the first and second electrodes, a voltage applying circuit applying a voltage between the first and second electrodes, and a voltage detecting circuit detecting a first voltage based on an interelectrode voltage between the first and second electrodes. The variable capacitor, the voltage applying circuit and the voltage detecting circuit are provided in a same chip.

Claims

1. An electronic device comprising:

a variable capacitor comprising first and second electrodes, and indicating a first state in which a distance between the first and second electrodes is a first distance and a second state in which the distance between the first and second electrodes is a second distance shorter than the first distance, in accordance with a voltage applied between the first and second electrodes;

a voltage applying circuit applying a voltage between the first and second electrodes; and

a voltage detecting circuit detecting a first voltage based on an interelectrode voltage applied between the first and second electrodes, the first voltage being used to evaluate performance of the variable capacitor,

wherein the variable capacitor, the voltage applying circuit and the voltage detecting circuit are provided in a same chip.

2. The device of claim 1, wherein

a digital voltage based on the interelectrode voltage is output from the voltage detecting circuit.

3. The device of claim 2, wherein

the voltage detecting circuit comprises an AD converter for generating the digital voltage.

4. The device of claim 3, wherein

the AD converter is a successive approximation type AD converter.

5. The device of claim 1, wherein

the voltage detecting circuit comprises:

a comparator comparing the first voltage with a reference voltage;

a reference voltage generating circuit generating the reference voltage; and

a reference voltage setting circuit setting the reference voltage based on an output of the comparator.

6. The device of claim 1, wherein

the interelectrode voltage drops when the variable capacitor shifts from the first state to the second state.

7. The device of claim 1, wherein

the voltage applying circuit comprises a boost circuit boosting an input voltage.

8. The device of claim 7, wherein

a period for boosting the input voltage by the boost circuit is variable.

9. The device of claim 7, wherein

the variable capacitor shifts from the first state to the second state by applying the input voltage boosted by the boost circuit, between the first and second electrodes, for a period equal to or longer than a threshold period.

10. The device of claim 9, wherein

the voltage detecting circuit detects the first voltage to obtain the threshold period.

11. The device of claim 10, wherein

the threshold period is obtained by increasing a period for boosting the input voltage by the boost circuit step by step.

12. The device of claim 7, wherein

the input voltage of the boost circuit is variable.

13. The device of claim 7, wherein

the variable capacitor shifts from the first state to the second state when the voltage applied between the first and second electrodes becomes equal to or higher than a first threshold voltage by boosting the input voltage by the boost circuit.

14. The device of claim 13, wherein

the voltage detecting circuit detects the first voltage to obtain the first threshold voltage.

15. The device of claim 14, wherein

the first threshold voltage is obtained by increasing the voltage applied between the first and second electrodes step by step.

16. The device of claim 7, further comprising

a constant voltage supply circuit provided in the chip and supplying a constant voltage to the boost circuit.

17. The device of claim 16, wherein

the constant voltage supply circuit comprises a charge pump circuit.

18. The device of claim 1, further comprising

a discharging circuit provided in the chip and discharging charge stored in the variable capacitor.

19. The device of claim 18, wherein

the variable capacitor shifts from the second state to the first state when the voltage applied between the first and second electrodes becomes equal to or lower than a second threshold voltage by discharging the charge stored in the variable capacitor by the discharging circuit.

20. The device of claim 19, wherein

the voltage detecting circuit detects the first voltage to obtain the second threshold voltage.