METHOD AND APPARATUS FOR HIGH EFFICIENCY POST CMP CLEAN USING ENGINEERED VISCOUS FLUID
First Claim
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1. A method for cleaning a substrate, comprising:
- exposing the substrate to a viscoelastic fluid to remove small particles from the substrate, wherein the viscoelastic fluid comprising;
a viscosity adjustor; and
an aqueous base.
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Abstract
Embodiments of the present apparatus and methods for post CMP clean. More particularly, embodiments provide apparatus and methods for removing nano sized particles. One embodiment provides a method for cleaning a substrate. The method includes exposing the substrate to a viscoelastic fluid to remove small particles from the substrate. The viscoelastic fluid comprising a viscosity adjustor and an aqueous base.
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20 Claims
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1. A method for cleaning a substrate, comprising:
exposing the substrate to a viscoelastic fluid to remove small particles from the substrate, wherein the viscoelastic fluid comprising; a viscosity adjustor; and an aqueous base. - View Dependent Claims (2, 3, 4, 5)
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6. A method for post CMP cleaning, comprising:
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exposing the substrate to a viscoelastic fluid to remove small particles from the substrate, wherein the viscoelastic fluid comprising; a viscosity adjustor; and an aqueous base; and cleaning the substrate using at least one of a brush box, a rinsing station, a spray jet unit, a megasonic cleaner, or combinations thereof. - View Dependent Claims (7, 8, 9)
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10. A viscoelastic fluid for cleaning a substrate, comprising:
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an aqueous base; and a viscosity adjustor for increasing a viscosity of the viscoelastic fluid. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification