DEVICE FOR CORRECTING LIGHT ABSORPTION SPECTRUM, METHOD OF MANUFACTURING THE DEVICE, AND METHOD OF CORRECTING LIGHT ABSORPTION SPECTRUM

• US 20160089088A1
• Filed: 08/05/2015
• Published: 03/31/2016
• Est. Priority Date: 09/29/2014
• Status: Active Grant

• Current Assignee: Samsung Electronics Co. Ltd.
• Original Assignee: Samsung Electronics Co. Ltd.
• Inventors: KIM, Sangkyu, LEE, Joonhyung, CHO, Seongho
• Granted Patent: US 10,362,996 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: A61B 2562/12 Manufacturing methods specially adapted for producing sensors for in-vivo measurements
• CPC Class Codes: A61B 5/0075 by spectroscopy, i.e. measuring spectra, e.g. Raman spectroscopy, infrared absorption spectroscopy A61B5/0071 takes precedence
• CPC Class Codes: A61B 5/6843 Monitoring or controlling sensor contact pressure
• CPC Class Codes: A61B 5/7246 using correlation, e.g. template matching or determination of similarity
• CPC Class Codes: A61B 5/7278 Artificial waveform generation or derivation, e.g. synthesising signals from measured signals A61B5/327 takes precedence
• CPC Class Codes: G01N 21/35 using infrared light G01N21/39 takes precedence
• CPC Class Codes: G01N 21/552 Attenuated total reflection
• CPC Class Codes: G01N 2201/1218 for pressure variations

Abstract

Provided are light absorption spectrum correction devices, methods of manufacturing the light absorption spectrum correction devices, and methods of correcting a light absorption spectrum. The light absorption spectrum correction device includes: a light source configured to emit light; an attenuated total reflectance (ATR) crystal layer configured to contact a subject and provide an optical passage along which the light emitted from the light source travels to the subject; a pressure sensor configured to detect a contact pressure applied to the ATR crystal layer by the subject; a spectrum detector and analyzer configured to detect light emitted from the ATR crystal layer, form a light absorption spectrum based on the detected light, and determine an intensity of the light emitted from the ATR crystal layer; and a spectrum correction device configured to correct the light absorption spectrum based on the contact pressure.

Claims

1. A light absorption spectrum correction device comprising:

a light source configured to emit light;

an attenuated total reflectance (ATR) crystal layer configured to contact a subject and provide an optical passage along which the light emitted by the light source travels to the subject;

a pressure sensor configured to detect a contact pressure applied to the ATR crystal layer by the subject;

a spectrum detector and analyzer configured to detect light emitted from the ATR crystal layer, form a light absorption spectrum based on the detected light, and determine an intensity of the light emitted from the ATR crystal layer; and

a spectrum correction device configured to correct the light absorption spectrum based on the contact pressure.

2. The light absorption spectrum correction device of claim 1, wherein the spectrum detector and analyzer is further configured to form the light absorption spectrum based on an intensity and a wavelength of the detected light.

3. The light absorption spectrum correction device of claim 1, wherein the spectrum correction device is connected to the pressure sensor and the spectrum detector and analyzer.

4. The light absorption spectrum correction device of claim 1, wherein the light source, the pressure sensor, and the spectrum detector and analyzer are provided on a same substrate.

5. The light absorption spectrum correction device of claim 1, wherein the pressure sensor is provided on a substrate, and the light source and the spectrum detector and analyzer are provided above the substrate.

6. The light absorption spectrum correction device of claim 1, wherein the ATR crystal layer is disposed on the pressure sensor and in contact with the pressure sensor.

7. The light absorption spectrum correction device of claim 1, further comprising a material layer disposed between the ATR crystal layer and the pressure sensor, wherein a refractive index of the material layer is less than a refractive index of the ATR crystal layer.

8. The light absorption spectrum correction device of claim 4, wherein the spectrum correction device is only connected to the substrate.

9. The light absorption spectrum correction device of claim 1, wherein the spectrum correction device comprises a database of contact pressure-light intensities.

10. A method of manufacturing a light absorption spectrum correction device, the method comprising:

forming an attenuated total reflectance (ATR) measuring apparatus by disposing a pressure sensor, a light source, an ATR crystal layer, a spectrum detector and analyzer on a substrate; and

connecting a spectrum correction device to the ATR measuring apparatus.

11. The method of claim 10, wherein the pressure sensor, the light source, and the spectrum detector and analyzer are formed on a same plane.

12. The method of claim 10, wherein a plane on which the light source and the spectrum detector and analyzer are formed is different from a plane on which the pressure sensor is formed.

13. The method of claim 10, further comprising forming a material layer between the pressure sensor and the ATR crystal layer, wherein a refractive index of the material layer is less than a refractive index of the ATR crystal layer.

14. The method of claim 11, wherein the spectrum correction device is connected to the substrate only.

15. The method of claim 12, wherein the spectrum correction device is connected to the substrate and the spectrum detector and analyzer.

16. A method of correcting a light absorption spectrum in a light absorption spectrum correction device, the method comprising:

measuring a contact pressure applied onto the device by a subject;

measuring a light absorption spectrum with respect to the subject; and

correcting the light absorption spectrum based on the measured contact pressure and the light absorption spectrum.

17. The method of claim 16, wherein the measuring of the light absorption spectrum comprises:

recognizing that an attenuated total reflectance (ATR) crystal layer is in contact with the subject;

radiating light onto the subject through the ATR crystal layer; and

detecting light emitted from the ATR crystal layer.

18. The method of claim 16, wherein the correcting of the light absorption spectrum comprises:

obtaining base data from the measured contact pressure and the light absorption spectrum;

comparing the base data with a reference region of a graph that indicates a contact pressure-light intensity with respect to the subject;

correcting the base data to be within the reference region in response to the base data being outside the reference region; and

correcting the light absorption spectrum according to the corrected base data.