Semiconductor Devices Including Channel Regions with Varying Widths
First Claim
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1. A semiconductor device comprising:
- a semiconductor substrate having an upper surface;
a fin-type structure on the semiconductor substrate, the fin-type structure having a top surface opposite the substrate and two opposing side surfaces; and
a gate on a portion of the top surface and portions of the two side surfaces of the fin-type structure;
wherein the gate has a first width at a first level from the upper surface of the substrate and a second width at a second level from the upper surface of the substrate,wherein the second level is lower than the first level,wherein the first width is greater than the second width, andwherein a width of the gate is reduced from the first width to the second width between the first level and the second level.
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Abstract
A semiconductor device includes a semiconductor substrate, a fin-type structure on the semiconductor substrate, and a gate on a portion of a top surface and portions of two side surfaces of the fin-type structure. The gate has a first width at a first level from the top surface of the substrate and a second width at a second level from the top surface of the substrate that is lower than the first level. The first width is greater than the second width, and a width of the gate is reduced from the first width to the second width between the first level and the second level.
37 Citations
20 Claims
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1. A semiconductor device comprising:
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a semiconductor substrate having an upper surface; a fin-type structure on the semiconductor substrate, the fin-type structure having a top surface opposite the substrate and two opposing side surfaces; and a gate on a portion of the top surface and portions of the two side surfaces of the fin-type structure; wherein the gate has a first width at a first level from the upper surface of the substrate and a second width at a second level from the upper surface of the substrate, wherein the second level is lower than the first level, wherein the first width is greater than the second width, and wherein a width of the gate is reduced from the first width to the second width between the first level and the second level. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A semiconductor device comprising:
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a semiconductor substrate; a fin-type structure on the semiconductor substrate; an insulating layer formed on the semiconductor substrate to have a top surface that is at lower level than a top surface of the fin-type structure; and a gate on a portion of a top surface of the fin-type structure and portions of side surfaces of the fin-type structure, wherein a width of the gate is reduced from a first width at an upper portion of the fin-type structure to a second width at a lower portion of the fin-type structure. - View Dependent Claims (15)
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16. A semiconductor device, comprising:
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a semiconductor substrate having an upper surface; a fin on the semiconductor substrate, the fin having an upper portion distal from the substrate and a lower portion proximate the substrate, and including a source region and a drain region in opposite ends of the fin and a channel region between the source region and the drain region; a gate on the channel region and extending down a side of the fin from a top of the fin towards a bottom of the fin between the source region and the drain region; a source contact on an upper surface of the fin in the source region; and a drain contact on an upper surface of the fin in the drain region, wherein the gate has a first width at the upper portion of the fin and a second width at the lower portion of the fin, the first width being greater than the second width. - View Dependent Claims (17, 18, 19, 20)
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Specification