Methods and Circuits for Improved Reliability of Power Devices Operating under Repetitive Thermal Stress
First Claim
1. A method comprising:
- sensing when a power switching device is experiencing a high stress condition, wherein the power switching device comprises an input port, an output port, and power device components coupled between the input port and the output port, and wherein electrical current flows between the input port and the output port when the power switching device experiences the high stress condition; and
activating a first subset of the power device components without activating a second subset of the power device components in response to the power switching device experiencing the high stress condition, wherein the electrical current flows through the first subset of power device components without flowing through the second subset of power device components when the power switching device experiences the high stress condition.
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Abstract
Thermo-migration induced stress in power devices can be mitigated by deactivating a subset of power device components (e.g., transistors, etc.) when the power device experiences a high stress condition. Deactivating the subset of power device components serves to bifurcate the active area of the power switching device into smaller active regions, which advantageously changes the temperature gradients in the active area/regions. In some embodiments, a control circuit dynamically deactivates different subsets of power device components to shift the thermo-migration induced stress points to different portions of the active region over the lifetime of the power switching device.
11 Citations
30 Claims
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1. A method comprising:
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sensing when a power switching device is experiencing a high stress condition, wherein the power switching device comprises an input port, an output port, and power device components coupled between the input port and the output port, and wherein electrical current flows between the input port and the output port when the power switching device experiences the high stress condition; and activating a first subset of the power device components without activating a second subset of the power device components in response to the power switching device experiencing the high stress condition, wherein the electrical current flows through the first subset of power device components without flowing through the second subset of power device components when the power switching device experiences the high stress condition. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method comprising:
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sensing when a power switching device experiences a high stress condition, wherein the power switching device comprises an input port, an output port, and power device components coupled between the input port and the output port, and wherein electrical current flows between the input port and the output port when the power switching device experience the high stress condition; and dynamically deactivating different subsets of the power device components during different periods, wherein at least some of the power device components remain activated during each of the periods, and wherein the electrical current flows through activated power device components without flowing through the subset of power device components that are deactivated during a given period when the power switching device experiences the high stress condition. - View Dependent Claims (8, 9, 10, 11, 12, 13, 14)
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15. A power switching device comprising:
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an input port adapted to be coupled to a load; an output port adapted to be coupled to a sink, wherein electrical current flows between the input port and the output port when the power switching device experiences a high stress condition; and a plurality of power device components coupled between the input port and the output port, wherein a first subset of the power device components are de-activated when the power switching device experiences a high stress condition during a first period, and wherein a second subset of the power device components remain activated when the power switching device experiences the high stress condition during the first period, and wherein the electrical current flows through the second subset of power device components without flowing through the first subset of power device components when the power switching device experiences the high stress condition during the first period. - View Dependent Claims (16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30)
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Specification