APPARATUSES, SYSTEMS, AND METHODS FOR INSPECTING A COMPONENT
First Claim
1. An apparatus for inspecting a component, comprising:
- a first feature inspector comprising at least one wave transducer configured to inspect a first feature of the component, the first feature inspector further comprising at least one displacement sensor configured to detect a displacement of the at least one wave transducer of the first feature inspector relative to the first feature of the component; and
a second feature inspector comprising at least one wave transducer configured to inspect a second feature of the component, the second feature inspector further comprising at least one displacement sensor configured to detect a displacement of the at least one wave transducer of the second feature inspector relative to the second feature of the component.
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Accused Products
Abstract
Described herein is an apparatus for inspecting a component includes a first feature inspector with at least one wave transducer configured to inspect a first feature of the component. The first feature inspector further includes at least one displacement sensor configured to detect a displacement of the at least one wave transducer of the first feature inspector relative to the first feature of the component. The apparatus further includes a second feature inspector with at least one wave transducer configured to inspect a second feature of the component. The second feature inspector further includes at least one displacement sensor configured to detect a displacement of the at least one wave transducer of the second feature inspector relative to the second feature of the component.
11 Citations
21 Claims
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1. An apparatus for inspecting a component, comprising:
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a first feature inspector comprising at least one wave transducer configured to inspect a first feature of the component, the first feature inspector further comprising at least one displacement sensor configured to detect a displacement of the at least one wave transducer of the first feature inspector relative to the first feature of the component; and a second feature inspector comprising at least one wave transducer configured to inspect a second feature of the component, the second feature inspector further comprising at least one displacement sensor configured to detect a displacement of the at least one wave transducer of the second feature inspector relative to the second feature of the component. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A system for inspecting a component, comprising:
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a probe comprising (i) a first feature inspector comprising at least one wave transducer configured to inspect a first feature of the component, the first feature inspector further comprising at least one displacement sensor configured to detect a displacement of the at least one wave transducer of the first feature inspector relative to the first feature of the component; and
(ii) a second feature inspector comprising at least one wave transducer configured to inspect a second feature of the component, the second feature inspector further comprising at least one displacement sensor configured to detect a displacement of the at least one wave transducer of the second feature inspector relative to the second feature of the component;an actuator coupled to the probe, the actuator being actuatable to adjust at least one of a linear or angular position of the probe; and a controller operably coupled to the probe and actuator, the controller being configured to control actuation of the actuator based on at least one of the displacement of the at least one wave transducer of the first feature inspector relative to the first feature of the component or the displacement of the at least one wave transducer of the second feature inspector relative to the second feature of the component. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17)
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18. A method for inspecting a component, comprising:
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initiating inspection of a 3-dimensional structure of the component using at least one wave transducer; detecting displacement of the at least one wave transducer relative to the 3-dimensional structure; and adjusting a position of the at least one wave transducer based on detected displacement of the at least one wave transducer relative to the 3-dimensional structure. - View Dependent Claims (19, 20, 21)
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Specification