Magnetic Field Sensor with Shared Path Amplifier and Analog-To-Digital-Converter

• US 20160139199A1
• Filed: 11/14/2014
• Published: 05/19/2016
• Est. Priority Date: 11/14/2014
• Status: Active Grant

• Current Assignee: Allegro Microsystems Incorporated (Sanken Electric Company Limited)
• Original Assignee: Allegro Microsystems Incorporated (Sanken Electric Company Limited)
• Inventors: Petrie, Craig S., Cadugan, Bryan
• Granted Patent: US 9,804,222 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01D 5/145 influenced by the relative movement between the Hall device and magnetic fields see G01R33/06
• CPC Class Codes: G01D 5/2448 Correction of gain, threshold, offset or phase control
• CPC Class Codes: G01D 5/2449 using hard-stored calibration data
• CPC Class Codes: G01R 31/2884 using dedicated test connectors, test elements or test circuits on the IC under test G01R31/2855 takes precedence
• CPC Class Codes: G01R 33/0035 Calibration of single magnetic sensors, e.g. integrated calibration
• CPC Class Codes: G01R 33/07 Hall effect devices
• CPC Class Codes: G01R 33/09 Magnetoresistive devices

Abstract

Methods and apparatus for processing a signal comprise at least one circuit configured to generate a measured signal during a measured time period and a reference signal during a reference time period. Also included is at least one dual- or multi-path analog-to-digital converter comprising at least a first processing circuit configured to process the measured signal, at least a second processing circuit configured to process the reference signal, and a third processing circuit configured to process both the measured signal and the reference signal.

Claims

1. A magnetic field sensor comprising:

at least one magnetic field sensing element configured to generate a measured magnetic field signal responsive to an external magnetic field and to generate a reference magnetic field signal responsive to a reference magnetic field; and

a signal path comprising an amplifier and an analog-to-digital converter for processing the measured magnetic field signal to generate a sensor output signal indicative of the external magnetic field during a measured time period and for processing the reference magnetic field signal to generate a diagnostic signal indicative of whether a fault is present during a non-overlapping reference time period.

2. The magnetic field sensor of claim 1 further comprising a reference coil proximate to the at least one magnetic field sensing element, wherein the reference coil is configured to carry a reference current to generate the reference magnetic field.

3. The magnetic field sensor of claim 1 wherein the at least one magnetic field sensing element is configurable to generate the measured magnetic field signal during the measured time period and to generate the reference magnetic field signal during the non-overlapping reference time period.

4. The magnetic field sensor of claim 1 further comprising an analog-to-digital converter responsive to the measured magnetic field signal to generate a digital measured magnetic field signal and responsive to the reference magnetic field signal to generate a digital reference magnetic field signal.

5. The magnetic field sensor of claim 4 wherein the analog-to-digital converter comprises at least one integrator circuit having a first capacitor configured to process the measured magnetic field signal and a second capacitor configured to process the reference magnetic field signal.

6. The magnetic field sensor of claim 5 further comprising a controller configured to switch the first capacitor with the second capacitor to enable the first capacitor to process the reference magnetic field signal.

7. The magnetic field signal of claim 1 further comprising an output signal generator responsive to the measured magnetic field signal and to the diagnostic signal to generate the sensor output signal.

8. The magnetic field signal of claim 1 further comprising a diagnostic trim circuit configured to adjust a gain of the reference magnetic field, an offset of the reference magnetic field signal, or both.

9. The magnetic field sensor of claim 1 wherein the at least one magnetic field sensing element is selected from a Hall effect element, a magnetoresistance element, or both.

10. The magnetic field sensor of claim 1 further comprising a built-in self-test circuit configured to detect an error in the magnetic field sensor.

11. A magnetic field sensor comprising:

at least one magnetic field sensing element configured to generate a measured magnetic field signal responsive to an external magnetic field and to generate a reference magnetic field signal responsive to a reference magnetic field;

a signal path comprising a shared portion for processing the measured magnetic field signal to generate a sensor output signal indicative of the external magnetic field during an measured time period and for processing the reference magnetic field signal to generate a diagnostic signal indicative of whether a fault is present during a non-overlapping reference time period and a dedicated portion for processing the measured magnetic field signal during the measured time period; and

a controller configured to enable the dedicated signal path portion to process the reference magnetic field signal.

12. The magnetic field sensor of claim 11 further comprising an analog-to-digital converter comprising at least one integrator and wherein the dedicated signal path portion comprises a capacitor of the at least one integrator.

13. The magnetic field sensor of claim 11 wherein the controller is configured to enable the dedicated signal path portion to process the reference magnetic field during a diagnostic mode of operation.

14. The magnetic field sensor of claim 11 further comprising a built-in self-test circuit configured to detect an error in the magnetic field sensor.

15. A magnetic field sensor comprising:

at least one magnetic field sensing element configured to generate a measured magnetic field signal responsive to an external magnetic field and to generate a reference magnetic field signal responsive to a reference magnetic field;

a signal path for processing the measured magnetic field signal to generate a sensor output signal indicative of the external magnetic field during an measured time period and for processing the reference magnetic field signal to generate a diagnostic signal indicative of whether a fault is present during a non-overlapping reference time period; and

a diagnostic trim circuit configured to adjust a gain of the reference magnetic field signal, an offset of the reference magnetic field signal, or both.

16. The magnetic field sensor of claim 15 wherein the diagnostic trim circuit is configured to adjust at least one of the gain and the offset of the reference magnetic field signal based on a sensed temperature.

17. The magnetic field sensor of claim 15 further comprising an analog-to-digital converter responsive to the measured magnetic field signal to generate a digital measured magnetic field signal and responsive to the reference magnetic field signal to generate a digital reference magnetic field signal and wherein the diagnostic trim circuit is configured to adjust at least one of the gain and the offset of the digital reference magnetic field signal.

18. The magnetic field sensor of claim 15 further comprising a built-in self-test circuit configured to detect an error in the magnetic field sensor.

19. The magnetic field sensor of claim 15 wherein the at least one magnetic field sensing element is selected from a Hall effect element, a magnetoresistance element, or both.