IMAGE SENSOR CHIP SIDEWALL INTERCONNECTION
First Claim
Patent Images
1. An image sensor chip comprising:
- a substrate supporting an integrated circuit (IC) configured to sense incident light; and
a sidewall interconnect structure arranged along a sidewall of the substrate and electrically coupled with the IC.
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Accused Products
Abstract
An image sensor chip having a sidewall interconnect structure to bond and/or electrically couple the image sensor chip to a package substrate is provided. The image sensor chip includes a substrate supporting an integrated circuit (IC) configured to sense incident light. The sidewall interconnect structure is arranged along a sidewall of the substrate and electrically coupled with the IC. A method for manufacturing the image sensor chip and an image sensor package including the image sensor chip are also provided.
22 Citations
34 Claims
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1. An image sensor chip comprising:
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a substrate supporting an integrated circuit (IC) configured to sense incident light; and a sidewall interconnect structure arranged along a sidewall of the substrate and electrically coupled with the IC. - View Dependent Claims (2, 3, 7, 8, 21, 22, 23, 24, 25)
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4-6. -6. (canceled)
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9-19. -19. (canceled)
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20. An image sensor package comprising:
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a package substrate having a package bond pad; an image sensor chip arranged over the package substrate, the image sensor chip including an integrated circuit (IC) electrically coupled with a sidewall interconnect structure arranged along a sidewall of the image sensor chip; and an electrical coupling structure arranged over the package bond pad along the sidewall of the image sensor chip and configured to electrically couple the IC to the package bond pad through the sidewall interconnect structure. - View Dependent Claims (26, 27, 28, 29, 30, 31, 32, 33)
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34. An image sensor chip, comprising:
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a back-end-of-line (BEOL) metallization stack arranged over a first substrate, wherein an image sensor bond pad is arranged within an interlayer dielectric (ILD) layer of the BEOL metallization stack; a second substrate arranged over the BEOL metallization stack; a device layer arranged over the BEOL metallization stack, between the second substrate and the BEOL metallization stack, wherein the device layer comprises a pixel sensor region configured to sense incident radiation; an opening extending through the first substrate, into the ILD layer, to expose the image sensor bond pad, wherein the opening is adjacent to a sidewall of the first substrate; and a conductive layer lining the opening and the sidewall, wherein the conductive layer contacts the image sensor bond pad, and wherein the conductive layer extends continuously from the opening to the sidewall.
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Specification