METHODS AND DEVICES FOR SECURING AND TRANSPORTING SINGULATED DIE IN HIGH VOLUME MANUFACTURING
First Claim
1. A method of processing a plurality of die, comprising:
- identifying a wafer position for a plurality of die on a wafer;
storing the wafer position for each of the plurality of die in a database;
dicing the wafer into a plurality of singulated die;
positioning each of the singulated die in a die position location on a tray;
storing the die position on the tray for each of the singulated die in the database, wherein the database includes information including the wafer position associated with each die position;
transporting the tray to a processing tool;
removing at least one of the plurality of singulated die from the die position on the tray and processing the singulated die in the processing tool; and
replacing the processed singulated die in the same defined location on the tray that the singulated die was positioned in prior to the processing.
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Accused Products
Abstract
A method includes identifying a wafer position for a plurality of die on a wafer, storing the wafer position for each of the plurality of die in a database, dicing the wafer into a plurality of singulated die, positioning each of the singulated die in a die position location on a tray, and storing the die position on the tray for each of the singulated die in the database. The database includes information including the wafer position associated with each die position. The tray is transported to a processing tool, and at least one of the plurality of singulated die is removed from the die position on the tray and processed in the processing tool. The processed singulated die is replaced in the same defined location on the tray that the singulated die was positioned in prior to the processing. Other embodiments are described and claimed.
9 Citations
22 Claims
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1. A method of processing a plurality of die, comprising:
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identifying a wafer position for a plurality of die on a wafer; storing the wafer position for each of the plurality of die in a database; dicing the wafer into a plurality of singulated die; positioning each of the singulated die in a die position location on a tray; storing the die position on the tray for each of the singulated die in the database, wherein the database includes information including the wafer position associated with each die position; transporting the tray to a processing tool; removing at least one of the plurality of singulated die from the die position on the tray and processing the singulated die in the processing tool; and replacing the processed singulated die in the same defined location on the tray that the singulated die was positioned in prior to the processing. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. An assembly configured to hold a plurality of singulated die, comprising:
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a movable tray configured to support a plurality of singulated die, the tray including a raised step at an outer region thereof; and a lid adapted to cover the singulated die on the tray, wherein an outer edge of the lid engages an inner edge of the step. - View Dependent Claims (12, 13)
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14. A carrier configured to hold a plurality of trays, the trays configured to hold a plurality of singulated die, the carrier comprising:
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a plurality of rails configured to hold the trays thereon; wherein the trays are individually accessible in any order from the carrier; and a protrusion extending upward on an upper surface of the carrier, the protrusion configured to be coupled to an automated carrier handling system. - View Dependent Claims (15, 16, 17)
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18. A tray configured to support a plurality of singulated die thereon, comprising:
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a core layer comprising a polymer; a plurality of electrodes positioned on the core layer; a dielectric layer positioned on the electrodes and extending therebetween, wherein the dielectric layer comprises a polymer; and a surface on which a plurality of singulated die may be positioned; wherein the electrodes are configured so that upon application of a voltage potential to induce an electric charge, adjacent electrodes have an opposite charge. - View Dependent Claims (19, 20, 21, 22)
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Specification