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SYSTEM AND METHODS FOR ADDRESSING DATA QUALITY ISSUES IN INDUSTRIAL DATA

  • US 20160178414A1
  • Filed: 12/17/2014
  • Published: 06/23/2016
  • Est. Priority Date: 12/17/2014
  • Status: Abandoned Application
First Claim
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1. A device comprising at least one hardware implemented module configured to at least:

  • retrieve time series data measured from at least one sensor;

    retrieve proximity data about the at least one sensor, the proximity data comprising;

    sensor ID metadata for the at least one sensor;

    orsensor environment metadata for the at least one sensor;

    orboth the sensor ID metadata for the at least one sensor and the sensor environment metadata for the at least one sensor;

    detect a first set of defects in the retrieved time series data using constraints based upon at least one of;

    at least one stored model of the at least one sensor, a location for the at least one sensor, or both;

    ora statistical model;

    orother constraints that relate to the time series data or proximity data;

    present, via a user interface (UI), information relating to the first set of defects defects and receive, via the UI, feedback about the first set of defects;

    clean the time series data based on the feedback;

    capture information to allow reversal of changes in whole or in part made to the time series data based on the feedback.

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